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Ellipsometer Product List and Ranking from 4 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Jul 23, 2025～Aug 19, 2025
This ranking is based on the number of page views on our site.

Ellipsometer Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jul 23, 2025～Aug 19, 2025
This ranking is based on the number of page views on our site.

  1. 日本セミラボ Kanagawa//Electronic Components and Semiconductors 新横浜本社
  2. ナノテック Chiba//Manufacturing and processing contract
  3. 西華デジタルイメージ Tokyo//Trading company/Wholesale
  4. アルバック／ULVAC, Inc. Kanagawa//Electronic Components and Semiconductors
  5. 5 null/null
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Ellipsometer Product ranking

Last Updated： Aggregation Period:Jul 23, 2025～Aug 19, 2025
This ranking is based on the number of page views on our site.

  1. Rotational Compensation Type Spectroscopic Ellipsometer 'SE-2000' *Seminar Held 日本セミラボ 新横浜本社
  2. Spectroscopic Ellipsometer GES5E 日本セミラボ 新横浜本社
  3. 【Free Initial Measurement Campaign】Spectroscopic Ellipsometer Auto SE ナノテック
  4. [Technical Information] Measurement Principle of Spectroscopic Ellipsometry - What is Polarization? *Materials Available 日本セミラボ 新横浜本社
  5. 4 Terahertz Spectroscopic Device for Semiconductor Electrical Characteristic Evaluation / Terahertz Ellipsometer 西華デジタルイメージ

Ellipsometer Product List

1～9 item / All 9 items

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High-speed spectroscopic ellipsometer UNECS series

High-speed spectroscopic ellipsometer UNECS series

It is a spectroscopic ellipsometer that measures the film thickness and refractive index of thin films with high speed and high precision. [ULVAC]

The UNECS series is a spectroscopic ellipsometer that measures film thickness and refractive index with high speed and high precision. It employs a unique measurement method that achieves fast measurements and compact design. We offer a wide range of models to suit various applications, including a unique portable type, automatic stage types, and built-in types compatible with vacuum environments. 【Specifications】 ○ High-speed measurement → Achieves high-speed measurements as fast as 20ms by adopting a unique snapshot method. ○ Visible spectroscopy compatible → The wavelength range can be selected from standard type (530nm to 750nm) and visible spectroscopy type (380nm to 760nm). ○ Compact sensor unit → The light receiving and emitting sensors are composed solely of optical elements without rotating mechanisms, making them very lightweight and compact, with no need for regular maintenance. ○ Rich lineup → In addition to the unique portable type, we offer a variety of models to accommodate diverse applications, including manual/automatic stage types, large substrate types, and built-in types compatible with atmospheric/vacuum environments. For more details, please contact us or download the catalog.

  • Other measurement, recording and measuring instruments

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Spectroscopic Ellipsometer GES5E

Spectroscopic Ellipsometer GES5E

Non-destructive measurement of thin film optical properties! Easy and high-precision measurement with spectral ellipsometry.

The Japan Semi-Lab spectroscopic ellipsometer 'GES5E' has achieved non-destructive measurement of thin film optical properties, which was impossible with conventional optical measuring instruments. It calculates the thickness of thin films and multilayer films, as well as the wavelength dispersion of the refractive index (N, K values) of each layer. It is active in various fields, from research and development to inline production quality control. 【Measurable Physical Properties】 ■ Thickness optical refractive index ■ Refractive index gradient and material composition ■ Dopant concentration

  • Optical Measuring Instruments
  • Spectroscopic Analysis Equipment
  • probe

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Roll-to-roll spectral ellipsometer

Roll-to-roll spectral ellipsometer

Roll-to-roll spectral ellipsometer

We have a very strong track record in QC monitoring.

  • Semiconductor inspection/test equipment
  • Distance measuring device
  • Spectroscopic Analysis Equipment

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Rotational Compensation Type Spectroscopic Ellipsometer 'SE-2000' *Seminar Held

Rotational Compensation Type Spectroscopic Ellipsometer 'SE-2000' *Seminar Held

High-precision measurement of the thickness and refractive index of multilayer films without contact. Easy operation of the main unit and analysis tasks. *Demonstration available and technical materials provided.

The "SE-2000" is a rotating compensator type spectroscopic ellipsometer that can measure the film thickness and refractive index of thin films with high precision in a "non-contact" manner. It is equipped with user-friendly analysis software, making the analysis process easy. It supports measurements across a wide wavelength range from deep ultraviolet to near-infrared. It also accommodates inspections related to material composition ratios, anisotropy, Mueller Matrix, degree of polarization resolution, reflectance/transmittance, dopant concentration, and retardation (R0, Rth), making it versatile for a wide range of applications. 【Features】 ■ High-precision CCD and high-resolution PMT equipped ■ Rich database of optical models ■ Various expansion options available ■ Numerous sales achievements 〈 Seminar Details 〉 ■ Theme: Explanation of the Procedure for Creating Analysis Models for Spectroscopic Ellipsometers - Beginner Level - ■ Dates and Times ・ April 22 (Thursday) 10:00 AM ・ May 13 (Thursday) 4:00 PM ■ Content Using a sample of a general structure, we will explain the procedure for creating analysis models. Explanation of analyses using effective medium approximation models, Cauchy models, and Tauc-Lorentz models. * Please check our company website (link below) for participation details.

  • Optical Measuring Instruments
  • Spectroscopic Analysis Equipment
  • probe

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Spectroscopic ellipsometer in the infrared region

Spectroscopic ellipsometer in the infrared region

Infrared Spectroscopic Ellipsometry

- In FTIR measurements, polarization allows for the acquisition of more information. - Since reference measurements are not necessary, measurements can be conducted quickly.

  • Optical Measuring Instruments
  • Analytical Equipment and Devices
  • Other environmental analysis equipment

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[Technical Information] Measurement Principle of Spectroscopic Ellipsometry - What is Polarization? *Materials Available

[Technical Information] Measurement Principle of Spectroscopic Ellipsometry - What is Polarization? *Materials Available

Polarization, ellipsometer, Brewster angle, etc.! Clearly introduced with diagrams and graphs. Demonstrations available.

This document introduces the measurement principles of a spectroscopic ellipsometer. It covers topics such as "polarization," which refers to light with a regular vibration direction of electric and magnetic fields, the principles of the ellipsometer, and optical interference. The content is presented clearly along with diagrams and graphs, so please take a moment to read it. 【Contents (excerpt)】 ■ What is polarization ■ Changes to the sample surface ■ What is an ellipsometer ■ Principles of the ellipsometer ■ What is the Brewster angle 〈 We will hold a webinar! *Details 〉 ■ Theme: Explanation of the procedure for creating analysis models for spectroscopic ellipsometers – Beginner's edition – ■ Date and Time ・ April 22 (Thursday) 10:00 AM ・ May 13 (Thursday) 4:00 PM ■ Content Using a typical sample structure as an example, we will explain the procedure for creating analysis models. Explanation of analysis using effective medium approximation models, Cauchy models, and Tauc-Lorentz models. ■ Participation Please check our company website (link below) for details. *For more information, please refer to the PDF document or feel free to contact us. *If you would like a demo, please indicate "Demo request" using the contact button below.

  • Analytical Equipment and Devices
  • Spectroscopic Analysis Equipment
  • Coating thickness gauge

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Terahertz Spectroscopic Device for Semiconductor Electrical Characteristic Evaluation / Terahertz Ellipsometer

Terahertz Spectroscopic Device for Semiconductor Electrical Characteristic Evaluation / Terahertz Ellipsometer

It is the only device capable of measuring the frequency dependence of complex permittivity (complex refractive index).

It is possible to measure phase information simultaneously along with electric field strength.

  • Circuit Board Inspection Equipment

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【Free Initial Measurement Campaign】Spectroscopic Ellipsometer Auto SE

【Free Initial Measurement Campaign】Spectroscopic Ellipsometer Auto SE

Thickness and optical constant measurement by Auto SE is free for the first 3 samples!!

■□■□■□■□■□■□■□■□■□■□■□■□■□■□■ Exclusive offer for customers who apply in November!! We will conduct free measurements of spectral ellipsometry (film thickness and optical constant measurement) for up to 3 samples on the first occasion using Auto SE. ■□■□■□■□■□■□■□■□■□■□■□■□■□■□■ Using a newly developed optical model, we will evaluate the quality of DLC films non-destructively and non-contactly. We can perform instant non-destructive measurements from hydrogen-containing DLC films created by various manufacturing methods to hydrogen-free DLC, calculating film thickness and optical constants (refractive index and extinction coefficient). With simple operations, we can measure samples ranging from single-layer films to multilayer films with film thicknesses from 1 nm to 15 μm. Surface analysis using an XYZ electric stage and measurements of micro areas below 100 μm are possible. The imaging system allows for precise confirmation of the sample surface condition and the exact position of the measurement spot. [For more details, please download the catalog or feel free to contact us]

  • Coating thickness gauge
  • Other inspection equipment and devices

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