We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Film Thickness Measuring Instrument.
ipros is IPROS GMS ・ IPROS One of the largest technical database sites in Japan that collects information on.

Film Thickness Measuring Instrument Product List and Ranking from 10 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.

Film Thickness Measuring Instrument Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.

  1. null/null
  2. null/null
  3. スマートビジョン Tokyo//Trading company/Wholesale 本社
  4. 4 日本セミラボ Kanagawa//Electronic Components and Semiconductors 新横浜本社
  5. 5 null/null
Go to Company Ranking

Film Thickness Measuring Instrument Product ranking

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.

  1. Spectral Interference Displacement Type Multilayer Film Thickness Measurement Device SI-T Series
  2. Epi film thickness measurement device "EIR-2500" 日本セミラボ 新横浜本社
  3. X-ray fluorescence film thickness measurement device XULM
  4. Lumetrics Non-Contact Multilayer Film Thickness Measurement Device 'OPTIGAUGE'
  5. 4 Terahertz Wave Multi-Layer Film Thickness Measurement Device 【PlastiMeasure】 スマートビジョン 本社

Film Thickness Measuring Instrument Product List

16～22 item / All 22 items

Displayed results
Automatic Film Thickness Measurement Device KV-300 / KF-10

Automatic Film Thickness Measurement Device KV-300 / KF-10

High-precision measurement of thick film resist and polyimide up to 500μm thick without contact.

The KV-300/KF-10 automatic resist film thickness measurement device can perform high-precision non-contact measurements of ultra-thick resist films, which have traditionally been difficult to measure with stability. The standard automatic mapping function quickly displays the in-plane film thickness distribution of the substrate using a high-precision automatic stage. The KV-300 features an automatic R-θ stage, allowing it to accommodate 300mm substrates while minimizing its footprint. For more details, please contact us or refer to the catalog.

  • Other process controls
  • Other measurement, recording and measuring instruments

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Optical Interference Film Thickness Measurement Device 'Model 3100'

Optical Interference Film Thickness Measurement Device 'Model 3100'

An industry-standard machine boasting a large number of delivery achievements! Equipped with linear array photodetectors.

The "Model3100" is an optical interference film thickness measurement device that employs linear array elements in the light-receiving sensor, enabling high-speed measurements. By standardly equipping spectral analysis software, it allows for simultaneous measurement of multilayer films (typically up to three layers) and the measurement of optical constants (n, k). It enables fine parameter settings suitable for various film characteristics, allowing for more diverse film thickness measurements of various film structures. 【Features】 ■ Capable of measuring up to 70μm equivalent to an oxide film with a high-sensitivity, high-resolution head (optional) ■ A 100x lens (with a micro spot of φ0.75μm) is also available ■ Easy implementation of program settings for special film measurements suitable for the process ■ Supports various applications (magnetic heads, FPD, material research, etc.) and allows for the creation of sample stages tailored to specific uses (optional) *For more details, please refer to the PDF materials or feel free to contact us.

  • Optical Measuring Instruments

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Terahertz Wave Multi-Layer Film Thickness Measurement Device 【PlastiMeasure】

Terahertz Wave Multi-Layer Film Thickness Measurement Device 【PlastiMeasure】

The thickness of each layer of opaque and translucent multilayer plastic is measured from the reflection delay time of terahertz light.

【Features】 - Measures the thickness of individual layers of single-layer and multi-layer plastic bottles and containers - Capable of measuring up to 10 layers - Detects ultra-thin barrier layers within multi-layer structures and measures their thickness - No cutting required, as in cross-sectional measurements - Achieves unprecedented levels of high precision and reproducibility while saving effort and time

  • Coating thickness gauge

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Terahertz wave multilayer film thickness measurement device (sensor head detachable type)

Terahertz wave multilayer film thickness measurement device (sensor head detachable type)

Separately mounted sensor head, also capable of being integrated into inline measurement devices.

【Features】 - High-precision multilayer film thickness measurement - Detection of voids within the film - High-precision basis weight measurement - Non-destructive measurement - Measurement of opaque and translucent materials - Non-contact & high-speed measurement - Non-ionizing radiation

  • Coating thickness gauge

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration
Non-contact XY mapping measurement infrared thickness gauge film thickness measuring instrument

Non-contact XY mapping measurement infrared thickness gauge film thickness measuring instrument

Infrared Non-Contact Thickness Gauge "Easy Operation and Maintenance-Free!"

<X-Y Mapping Measurement Possible> Mapping measurement is possible while moving the work in the XY direction. <Immediate Usability> Automatically creates a calibration curve from the reference piece. Measurement can be started immediately. <Maintenance-Free> There are no short-term replacement parts such as light sources or line sources.

  • Coating thickness gauge

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Search Keywords Related to Film Thickness Measuring Instrument

COPYRIGHT © 2001-2025 IPROS CORPORATION ALL RIGHTS RESERVED.