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Film Thickness Measuring Instrument Product List and Ranking from 27 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

Film Thickness Measuring Instrument Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. null/null
  2. ケツト科学研究所 Tokyo//Testing, Analysis and Measurement
  3. null/null
  4. 4 日本セミラボ 新横浜本社 Kanagawa//Electronic Components and Semiconductors
  5. 5 null/null
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Film Thickness Measuring Instrument Product ranking

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. Spectral Interference Displacement Type Multilayer Film Thickness Measurement Device SI-T Series
  2. Portable handheld fluorescent X-ray measuring device XAN500!
  3. Fisher Japan Product Catalog
  4. Film Thickness Measurement Device: Carotest (CAT)
  5. 4 Copper plating thickness measurement device "Cabidarm" - Handy type for easy measurement! サーマプレシジョン

Film Thickness Measuring Instrument Product List

31～45 item / All 58 items

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Prevent rice complaints with image analysis! Grain classification device RN-700.

Prevent rice complaints with image analysis! Grain classification device RN-700.

Evaluate the appearance quality factors that cause complaints for brown rice and white rice, such as insect damage, broken grains, and cracked grains. Quantify the proportions for satisfactory transactions.

Insect damage and other defects can make the appearance unappealing, and broken rice can become mushy and have a poor texture, leading to complaints. When visually assessing the quality of appearance, differences can arise depending on the observer and lighting conditions, which can lead to discrepancies during transactions. The RN-700 grain particle analyzer serves as an objective and standardized "ruler" that quantifies grain count and ratios for each item. You can utilize the measurement values as evaluation criteria when buying or selling rice. ◇ Simple operation: just spread it on the tray and insert it ◆ PC software allows you to check image data of each grain (optional) ◇ Widely adopted by rice wholesalers and milling factories nationwide ◆ Specification confirmation from the Ministry of Agriculture, Forestry and Fisheries regarding "inspection standards for agricultural products based on machine assessment" You can verify the accuracy and usability with a demo unit. If you are interested, please contact us.

  • Visual Inspection Equipment

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Small non-contact measuring device "OptoFlash"

Small non-contact measuring device "OptoFlash"

Achieve high-precision non-contact measurement in seconds <Test measurement of workpieces available (please inquire)>

OptoFlash achieves high-precision measurements by acquiring and analyzing optical images. It enables fast and accurate measurements in production environments of small parts where high precision is required, such as in automotive, general manufacturing, aerospace, and medical fields. It is particularly suitable for dimension verification of electric motor shafts, electronic connectors, hydraulic circuit components, screws, and more. <Main Features> 1. Ultra-fast - The 2D optical technology enables a reduction in cycle time. - The cycle time is remarkably fast, executing 100 static measurements in just 2 seconds. 2. High flexibility - Capable of measuring a wide variety of shapes, from bolts to small shafts. - Achieves static and dynamic measurements of outer diameter, length, roundness, cylindricity, coaxiality, taper, grooves, chamfers, R (shape), shaft runout, screw dimensions, etc., in just a few seconds. 3. Ease of use - The measurement screen is user-friendly while equipped with multi-level access features, allowing level settings according to the operator's tasks and permissions. - Open loading without doors enables robot compatibility, allowing for automation without the need for an operator. 4. Durability - The fixed position of the 2D sensor eliminates mechanical stress. Measurement performance remains consistently stable over millions of cycles. - The need for maintenance is also minimized.

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  • OF_Measurement Result.jpg
  • Other measurement, recording and measuring instruments
  • Other inspection equipment and devices
  • Optical Measuring Instruments

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Inline non-contact film thickness measurement device

Inline non-contact film thickness measurement device

It measures the thickness of metal coils, transparent films on metal containers, opaque films, wet films, and dry films non-contactly.

- Inline compatibility (no problem with fluctuations) - Non-contact measurement of paint and coating thickness (measurable film thickness: 0.2 to 250 µm) - Capable of measuring both wet and dry films - Can reduce the cost of paint/coating materials - Improvement of production throughput

  • Coating thickness gauge
  • Weight related measuring instruments

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Film Thickness Measurement Device "LF-1000"

Film Thickness Measurement Device "LF-1000"

Film thickness measurement device capable of measuring film thickness on wafer glass substrates and mirror substrates.

The "LF-1000" is a non-contact automatic film thickness measurement device equipped with a spectrometer and optical interference film thickness analysis software, enabling film thickness measurement by setting various parameters. This analysis software allows for non-contact automatic measurement and mapping of the thickness, refractive index, and absorption coefficient of transparent or translucent thin films by analyzing the interference waveforms from the surface of the thin film and the interface with the substrate. 【Features】 - Capable of measuring film thickness not only on wafers and glass substrates but also on other mirror-like substrates. - Various film thickness measurements can be performed by setting the optical constants of the film. - Excellent for measuring thin film oxide layers, SOI, EG films, color filters, etc. - Comes with an auto stage compatible with standard 3, 4, 5, 6, 8, and 12-inch wafers. - Loader specifications can also be accommodated as an option (consultation available for cassette/FOUP and number of ports). - Capable of measuring film thickness from thin films to thick films depending on the measurement head specifications. - GEM communication is optional. *For more details, please refer to the PDF materials or feel free to contact us.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

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Non-contact CV measurement device Cn0CV

Non-contact CV measurement device Cn0CV

Non-contact heavy metal contamination, CV/IV, membrane evaluation device. The sensitivity of iron concentration measurement achieves E8 by adopting DSPV!

This is a non-contact heavy metal contamination, CV/IV, and film evaluation device with over 400 units in operation worldwide. The sensitivity for iron concentration measurement has achieved E8 by adopting DSPV, contributing to the improved yield of recent CMOS image sensors. It is capable of CV measurement of compound semiconductors and can measure the concentration distribution and profile in the plane non-contactly.

  • Other inspection equipment and devices

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Non-contact mobility measurement device "LEI-1610 Series"

Non-contact mobility measurement device "LEI-1610 Series"

Measurement of various semiconductor carrier transport characteristics is possible! Non-contact mobility measurement using microwave reflection!

For the manufacturing of semiconductor devices, carrier mobility is a very important parameter. The "LEI-1610 Series" is a non-contact mobility measurement device capable of measuring various semiconductor carrier transport characteristics such as mobility, carrier concentration, and sheet resistance. Carrier mobility, sheet resistance, and sheet charge density can be measured non-contact and destructively on Si wafers ranging from 2 inches to a maximum of 8 inches, as well as on compound semiconductor (GaAs, GaN, InP, etc.) epi wafers. 【Features】 ■ Non-contact mobility measurement using microwave reflection ■ Standard measurement device for high-frequency device characteristics ■ High correlation with measurement results from the Hall effect ■ Multi-carrier modeling option *For more details, please refer to the related link page or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Automatic Film Thickness Measurement Device KV-300 / KF-10

Automatic Film Thickness Measurement Device KV-300 / KF-10

High-precision measurement of thick film resist and polyimide up to 500μm thick without contact.

The KV-300/KF-10 automatic resist film thickness measurement device can perform high-precision non-contact measurements of ultra-thick resist films, which have traditionally been difficult to measure with stability. The standard automatic mapping function quickly displays the in-plane film thickness distribution of the substrate using a high-precision automatic stage. The KV-300 features an automatic R-θ stage, allowing it to accommodate 300mm substrates while minimizing its footprint. For more details, please contact us or refer to the catalog.

  • Other process controls
  • Other measurement, recording and measuring instruments

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Non-contact NDVI measurement device 'NDVI-2'

Non-contact NDVI measurement device 'NDVI-2'

We will measure NDVI non-contact!

The "NDVI-2" is a measurement device that can be used as a non-contact, non-destructive plant activity meter or plant wilting meter for temporal measurements. When the trigger for measurement is pulled, a laser is emitted at two points, and the reflectance in the wavelength ranges of 660nm and 840nm within the circle between the two points is measured to obtain the NDVI non-contact. Additionally, the sensor located at the top acts as a standard white reference, allowing for accurate NDVI measurements based on reflectance even when the light source changes. 【Specifications】 ■ Measurement method: Reflectance at 660nm and 840nm ■ Measurement range: Distance [maximum] 183cm [minimum] 28.4cm, Measurement diameter [maximum] 18.8cm [minimum] 1.1cm ■ Measurement unit: Displayed in index from -1 to 1 ■ Memory: 3250 readings (without GPS), 1350 readings (with GPS) ■ Measurement error: ±5% of reading ■ Weight: 0.7kg ■ Power supply: 2 AA alkaline batteries, capable of 3000 measurements *For more details, please download the PDF or contact us.

  • Other measurement, recording and measuring instruments

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Non-contact measuring device

Non-contact measuring device

"Pioneer of carbon jigs" - This is a case study of Akebono Seiki Kogyo's non-contact measuring device.

From the design and manufacturing of three-dimensional labor-saving devices that incorporate semiconductor components into carbon (graphite) jigs from flat tools, we respond to our customers' needs as the "unsung heroes" behind the scenes.

  • Processing Jig
  • Inspection fixture
  • Assembly Jig

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Optical Interference Film Thickness Measurement Device 'Model 3100'

Optical Interference Film Thickness Measurement Device 'Model 3100'

An industry-standard machine boasting a large number of delivery achievements! Equipped with linear array photodetectors.

The "Model3100" is an optical interference film thickness measurement device that employs linear array elements in the light-receiving sensor, enabling high-speed measurements. By standardly equipping spectral analysis software, it allows for simultaneous measurement of multilayer films (typically up to three layers) and the measurement of optical constants (n, k). It enables fine parameter settings suitable for various film characteristics, allowing for more diverse film thickness measurements of various film structures. 【Features】 ■ Capable of measuring up to 70μm equivalent to an oxide film with a high-sensitivity, high-resolution head (optional) ■ A 100x lens (with a micro spot of φ0.75μm) is also available ■ Easy implementation of program settings for special film measurements suitable for the process ■ Supports various applications (magnetic heads, FPD, material research, etc.) and allows for the creation of sample stages tailored to specific uses (optional) *For more details, please refer to the PDF materials or feel free to contact us.

  • Optical Measuring Instruments

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Insulated fastener "termofix 6H-NT Thermofix"

Insulated fastener "termofix 6H-NT Thermofix"

Prevent thermal bridging by installing insulation flush! Insulation fasteners with wood screws.

◆Compatible Base Materials - 3-layer solid wood - MDF plywood - OSB plywood ◆Functions and Usage - Fasteners are installed using a standard Torx T30 bit for flush mounting. - Use the dedicated tool T T S for embedding installation. Screw in the fasteners for precise installation positioning. Insert a separately sold cap into the countersink area to achieve a flush surface with the insulation material. - Rotate the disk of the dedicated tool T T S to achieve a flush surface with the insulation material. Install the fasteners without going too deep.

  • others

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Insulated fastener "termofix B"

Insulated fastener "termofix B"

Construction screw fasteners with self-drilling screws featuring Delta-Seal coating for thin steel plates.

◆Applicable Base Material ・Thin steel plate / trapezoidal metal sheet, maximum thickness 1.5mm ◆Function and Usage ・Installation by fitting to the actual item through insulation material without pre-drilling. ・The appropriate driver bit is European type Phillips #2. ・Quick and easy installation with a cordless electric impact driver. ・Total thickness includes a load-free layer such as an adhesive layer.

  • others

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