We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Film Thickness Measuring Instrument.
ipros is IPROS GMS IPROS One of the largest technical database sites in Japan that collects information on.

Film Thickness Measuring Instrument Product List and Ranking from 27 Manufacturers, Suppliers and Companies

Last Updated: Aggregation Period:Sep 03, 2025~Sep 30, 2025
This ranking is based on the number of page views on our site.

Film Thickness Measuring Instrument Manufacturer, Suppliers and Company Rankings

Last Updated: Aggregation Period:Sep 03, 2025~Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. ケツト科学研究所 Tokyo//Testing, Analysis and Measurement
  2. null/null
  3. null/null
  4. 4 null/null
  5. 5 null/null

Film Thickness Measuring Instrument Product ranking

Last Updated: Aggregation Period:Sep 03, 2025~Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. Spectral Interference Displacement Type Multilayer Film Thickness Measurement Device SI-T Series
  2. Grain count measurement and result analysis at a speed beyond human capability! Grain classifier RN-700. ケツト科学研究所
  3. Prevent rice complaints with image analysis! Grain classification device RN-700. ケツト科学研究所
  4. Film Thickness Measurement Device: Carotest (CAT)
  5. 5 Copper plating thickness measurement device "Cabidarm" - Handy type for easy measurement! サーマプレシジョン

Film Thickness Measuring Instrument Product List

31~45 item / All 58 items

Displayed results

Small non-contact measuring device "OptoFlash"

Achieve high-precision non-contact measurement in seconds <Test measurement of workpieces available (please inquire)>

OptoFlash achieves high-precision measurements by acquiring and analyzing optical images. It enables fast and accurate measurements in production environments of small parts where high precision is required, such as in automotive, general manufacturing, aerospace, and medical fields. It is particularly suitable for dimension verification of electric motor shafts, electronic connectors, hydraulic circuit components, screws, and more. <Main Features> 1. Ultra-fast - The 2D optical technology enables a reduction in cycle time. - The cycle time is remarkably fast, executing 100 static measurements in just 2 seconds. 2. High flexibility - Capable of measuring a wide variety of shapes, from bolts to small shafts. - Achieves static and dynamic measurements of outer diameter, length, roundness, cylindricity, coaxiality, taper, grooves, chamfers, R (shape), shaft runout, screw dimensions, etc., in just a few seconds. 3. Ease of use - The measurement screen is user-friendly while equipped with multi-level access features, allowing level settings according to the operator's tasks and permissions. - Open loading without doors enables robot compatibility, allowing for automation without the need for an operator. 4. Durability - The fixed position of the 2D sensor eliminates mechanical stress. Measurement performance remains consistently stable over millions of cycles. - The need for maintenance is also minimized.

  • OF_XS.jpg
  • OF_Screw.jpg
  • OF_Turbo Charger.jpg
  • OF_Measurement Result.jpg
  • Other measurement, recording and measuring instruments
  • Other inspection equipment and devices
  • Optical Measuring Instruments

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Inline non-contact film thickness measurement device

It measures the thickness of metal coils, transparent films on metal containers, opaque films, wet films, and dry films non-contactly.

- Inline compatibility (no problem with fluctuations) - Non-contact measurement of paint and coating thickness (measurable film thickness: 0.2 to 250 µm) - Capable of measuring both wet and dry films - Can reduce the cost of paint/coating materials - Improvement of production throughput

  • Coating thickness gauge
  • Weight related measuring instruments

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Film Thickness Measurement Device "LF-1000"

Film thickness measurement device capable of measuring film thickness on wafer glass substrates and mirror substrates.

The "LF-1000" is a non-contact automatic film thickness measurement device equipped with a spectrometer and optical interference film thickness analysis software, enabling film thickness measurement by setting various parameters. This analysis software allows for non-contact automatic measurement and mapping of the thickness, refractive index, and absorption coefficient of transparent or translucent thin films by analyzing the interference waveforms from the surface of the thin film and the interface with the substrate. 【Features】 - Capable of measuring film thickness not only on wafers and glass substrates but also on other mirror-like substrates. - Various film thickness measurements can be performed by setting the optical constants of the film. - Excellent for measuring thin film oxide layers, SOI, EG films, color filters, etc. - Comes with an auto stage compatible with standard 3, 4, 5, 6, 8, and 12-inch wafers. - Loader specifications can also be accommodated as an option (consultation available for cassette/FOUP and number of ports). - Capable of measuring film thickness from thin films to thick films depending on the measurement head specifications. - GEM communication is optional. *For more details, please refer to the PDF materials or feel free to contact us.

  • Semiconductor inspection/test equipment
  • Other measurement, recording and measuring instruments

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Non-contact CV measurement device Cn0CV

Non-contact heavy metal contamination, CV/IV, membrane evaluation device. The sensitivity of iron concentration measurement achieves E8 by adopting DSPV!

This is a non-contact heavy metal contamination, CV/IV, and film evaluation device with over 400 units in operation worldwide. The sensitivity for iron concentration measurement has achieved E8 by adopting DSPV, contributing to the improved yield of recent CMOS image sensors. It is capable of CV measurement of compound semiconductors and can measure the concentration distribution and profile in the plane non-contactly.

  • Other inspection equipment and devices

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Non-contact mobility measurement device "LEI-1610 Series"

Measurement of various semiconductor carrier transport characteristics is possible! Non-contact mobility measurement using microwave reflection!

For the manufacturing of semiconductor devices, carrier mobility is a very important parameter. The "LEI-1610 Series" is a non-contact mobility measurement device capable of measuring various semiconductor carrier transport characteristics such as mobility, carrier concentration, and sheet resistance. Carrier mobility, sheet resistance, and sheet charge density can be measured non-contact and destructively on Si wafers ranging from 2 inches to a maximum of 8 inches, as well as on compound semiconductor (GaAs, GaN, InP, etc.) epi wafers. 【Features】 ■ Non-contact mobility measurement using microwave reflection ■ Standard measurement device for high-frequency device characteristics ■ High correlation with measurement results from the Hall effect ■ Multi-carrier modeling option *For more details, please refer to the related link page or feel free to contact us.

  • Other measurement, recording and measuring instruments

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Automatic Film Thickness Measurement Device KV-300 / KF-10

High-precision measurement of thick film resist and polyimide up to 500μm thick without contact.

The KV-300/KF-10 automatic resist film thickness measurement device can perform high-precision non-contact measurements of ultra-thick resist films, which have traditionally been difficult to measure with stability. The standard automatic mapping function quickly displays the in-plane film thickness distribution of the substrate using a high-precision automatic stage. The KV-300 features an automatic R-θ stage, allowing it to accommodate 300mm substrates while minimizing its footprint. For more details, please contact us or refer to the catalog.

  • Other process controls
  • Other measurement, recording and measuring instruments

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Non-contact NDVI measurement device 'NDVI-2'

We will measure NDVI non-contact!

The "NDVI-2" is a measurement device that can be used as a non-contact, non-destructive plant activity meter or plant wilting meter for temporal measurements. When the trigger for measurement is pulled, a laser is emitted at two points, and the reflectance in the wavelength ranges of 660nm and 840nm within the circle between the two points is measured to obtain the NDVI non-contact. Additionally, the sensor located at the top acts as a standard white reference, allowing for accurate NDVI measurements based on reflectance even when the light source changes. 【Specifications】 ■ Measurement method: Reflectance at 660nm and 840nm ■ Measurement range: Distance [maximum] 183cm [minimum] 28.4cm, Measurement diameter [maximum] 18.8cm [minimum] 1.1cm ■ Measurement unit: Displayed in index from -1 to 1 ■ Memory: 3250 readings (without GPS), 1350 readings (with GPS) ■ Measurement error: ±5% of reading ■ Weight: 0.7kg ■ Power supply: 2 AA alkaline batteries, capable of 3000 measurements *For more details, please download the PDF or contact us.

  • Other measurement, recording and measuring instruments

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Non-contact measuring device

"Pioneer of carbon jigs" - This is a case study of Akebono Seiki Kogyo's non-contact measuring device.

From the design and manufacturing of three-dimensional labor-saving devices that incorporate semiconductor components into carbon (graphite) jigs from flat tools, we respond to our customers' needs as the "unsung heroes" behind the scenes.

  • Processing Jig
  • Inspection fixture
  • Assembly Jig

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Optical Interference Film Thickness Measurement Device 'Model 3100'

An industry-standard machine boasting a large number of delivery achievements! Equipped with linear array photodetectors.

The "Model3100" is an optical interference film thickness measurement device that employs linear array elements in the light-receiving sensor, enabling high-speed measurements. By standardly equipping spectral analysis software, it allows for simultaneous measurement of multilayer films (typically up to three layers) and the measurement of optical constants (n, k). It enables fine parameter settings suitable for various film characteristics, allowing for more diverse film thickness measurements of various film structures. 【Features】 ■ Capable of measuring up to 70μm equivalent to an oxide film with a high-sensitivity, high-resolution head (optional) ■ A 100x lens (with a micro spot of φ0.75μm) is also available ■ Easy implementation of program settings for special film measurements suitable for the process ■ Supports various applications (magnetic heads, FPD, material research, etc.) and allows for the creation of sample stages tailored to specific uses (optional) *For more details, please refer to the PDF materials or feel free to contact us.

  • Optical Measuring Instruments

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Design and Manufacturing Services D&MS

Flexibly responding to diverse demands such as high-speed image processing and high quality.

Flexibly respond to diverse demands such as high-speed image processing and high quality in application fields including automotive, medical, military, and ITS (Intelligent Transportation Systems).

  • others

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Terahertz Wave Multi-Layer Film Thickness Measurement Device 【PlastiMeasure】

The thickness of each layer of opaque and translucent multilayer plastic is measured from the reflection delay time of terahertz light.

【Features】 - Measures the thickness of individual layers of single-layer and multi-layer plastic bottles and containers - Capable of measuring up to 10 layers - Detects ultra-thin barrier layers within multi-layer structures and measures their thickness - No cutting required, as in cross-sectional measurements - Achieves unprecedented levels of high precision and reproducibility while saving effort and time

  • Coating thickness gauge

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Terahertz wave multilayer film thickness measurement device (sensor head detachable type)

Separately mounted sensor head, also capable of being integrated into inline measurement devices.

【Features】 - High-precision multilayer film thickness measurement - Detection of voids within the film - High-precision basis weight measurement - Non-destructive measurement - Measurement of opaque and translucent materials - Non-contact & high-speed measurement - Non-ionizing radiation

  • Coating thickness gauge

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Low-cost model specialized for moisture measurement: Near-infrared component meter/moisture meter

Reduce labor hours from batch processing! Real-time monitoring of component value fluctuations is possible. For measuring moisture, protein, and fat content in grains, legumes, processed products, fibers, and non-woven fabrics.

Near-infrared light has almost no heat and does not change the physical properties of the target object, allowing for real-time and continuous monitoring of component value fluctuations by incorporating the equipment into the production line. We offer a lineup including the near-infrared component analyzer "KJT-700," which can be selected from 5 or 7 wavelengths depending on the measurement target, and the near-infrared moisture meter "KB-30," which is specialized for moisture measurement. These instruments can be used for a wide range of applications, including food, pharmaceuticals, paper, ores, and building materials. 【Features】 ■ Non-destructive and non-contact ■ Real-time component analysis ■ Filter spectroscopic method ■ Easy operation *For more details, please refer to the PDF document or feel free to contact us.

  • Other physicochemical equipment
  • Other measurement, recording and measuring instruments

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Grain Grain Determination Machine "RN-700"

The loss of brown rice and white rice is quickly spread out and easily understood.

The "RN-700" is a grain classification machine equipped with a newly developed image recognition engine. It captures images of rice on a tray while changing the light source and processes multiple images taken. It analyzes the quality of each individual grain of rice. Operation is simple; just spread the rice on the tray and set it, and it will automatically output the results. 【Features】 - Captures three images using transmitted light, reflected light, and spot transmitted light - Organic EL display that is clear and easy to see even outdoors - Capable of saving to an SD card and connecting to a PC - Displays the number and ratio of grains by type on the main unit - Measures not only the quality of each grain but also dimensions (length, width, area) *For more details, please refer to the PDF document or feel free to contact us.

  • Food Testing/Analysis/Measuring Equipment
  • Analytical Equipment and Devices

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration

Non-contact XY mapping measurement infrared thickness gauge film thickness measuring instrument

Infrared Non-Contact Thickness Gauge "Easy Operation and Maintenance-Free!"

<X-Y Mapping Measurement Possible> Mapping measurement is possible while moving the work in the XY direction. <Immediate Usability> Automatically creates a calibration curve from the reference piece. Measurement can be started immediately. <Maintenance-Free> There are no short-term replacement parts such as light sources or line sources.

  • Coating thickness gauge

Added to bookmarks

Bookmarks list

Bookmark has been removed

Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.

Free membership registration