アークステーション Company Overview

Our company is an engineering-focused organization that engages in the sales of inspection and analysis equipment for the semiconductor front-end process (wafer process) and undertakes maintenance and servicing operations.

We handle various inspection and analysis equipment, including new and used devices. (Fully automatic XPS film thickness concentration measurement device, overlay accuracy measurement device, double-sided coordinate measurement device, film thickness measurement device, ellipsometer, optical three-dimensional measurement device, wafer edge inspection device, transparent wafer front and back defect inspection device, appearance inspection device, optical microscope, exposure device)