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Structural Analysis Product List and Ranking from 36 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

Structural Analysis Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. アイテス Shiga//Electronic Components and Semiconductors
  3. マーブル　 エンベデッドプロダクト事業本部　プロダクト事業部 Tokyo//IT/Telecommunications
  4. 4 null/null
  5. 5 東レリサーチセンター Tokyo//Service Industry
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Structural Analysis Product ranking

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. Defective analysis of liquid crystal panels アイテス
  2. Affordable and easy-to-use CADTOOL Frame Structure Analysis 12 3D マーブル　 エンベデッドプロダクト事業本部　プロダクト事業部
  3. Technical Calculation Software CADTOOL Frame Structure Analysis 12 2D マーブル　 エンベデッドプロダクト事業本部　プロダクト事業部
  4. For three-dimensional skeletal structure calculations! CADTOOL Frame Structure Analysis 12 3D
  5. 4 IC failure analysis アイテス

Structural Analysis Product List

16～30 item / All 86 items

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[Analysis Case] Structural Analysis of Amorphous SiNx Films Using Molecular Dynamics Calculations

[Analysis Case] Structural Analysis of Amorphous SiNx Films Using Molecular Dynamics Calculations

Microscopic structural analysis of amorphous films is possible through simulation.

Amorphous SiNx (a-SiNx) films exhibit significant changes in physical properties from semiconductors to insulators due to compositional variations such as the N/Si ratio, making them suitable for a wide range of applications, including gate insulating films for transistors. On the other hand, experimental methods capable of atomic-level microscopic structural analysis for materials with non-crystalline amorphous structures are limited. Therefore, creating and analyzing amorphous structures with various compositions and densities through simulation becomes an effective tool. This document presents examples of structural analysis of a-SiNx films using molecular dynamics calculations.

  • Contract Analysis
  • Memory

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[Analysis Case] Three-Dimensional Structure Analysis of Hair

[Analysis Case] Three-Dimensional Structure Analysis of Hair

Quantitative evaluation of hair is possible using X-ray CT and image analysis technology.

Hair that has been damaged by factors such as hair color, ultraviolet rays, and aging undergoes structural changes, and measuring these structural changes is important for the research and development of hair care products. In this case, we observed the structure of hair using X-ray CT. Furthermore, by performing image analysis on the obtained CT cross-sectional images, we created histograms of the void volume in the cortex and the spacing of the cuticles. By combining X-ray CT and image analysis in this way, it is possible to quantitatively evaluate the three-dimensional structure of hair. Measurement methods: X-ray CT, computational science, AI, data analysis Product fields: Biotechnology, pharmaceuticals, cosmetics Analysis objectives: Shape evaluation, structural evaluation For more details, please download the materials or contact us.

  • Contract Analysis
  • Contract measurement

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[Analysis Case] Extraction, Chemical Decomposition, and Structural Analysis of Lignin

[Analysis Case] Extraction, Chemical Decomposition, and Structural Analysis of Lignin

Various analyses targeting the wood biomass component "lignin" are possible.

Lignin is an aromatic polymer component that accounts for about 30% of wood biomass, and attention is being drawn to its potential as an alternative to petrochemical raw materials and its use in engineering plastics. This document presents a comprehensive evaluation of lignin, starting from extraction from wood to chemical structure analysis. Measurement methods: NMR, LC/MS, GC/MS Product fields: Environment, Biotechnology, Polymer Materials Analysis purposes: Composition evaluation, identification, chemical bonding state evaluation, structural evaluation For more details, please download the document or contact us.

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  • Contract Analysis
  • Contract measurement

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Structural analysis using NMR (nuclear magnetic resonance) spectroscopy.

Structural analysis using NMR (nuclear magnetic resonance) spectroscopy.

Measurement of the light solvent as is.

NMR is typically performed using the resonance signals of deuterium (2H or D) nuclei in deuterated solvents for reasons such as ensuring the stability of the magnetic field. However, by using the resonance signals of proton (1H) nuclei, measurements can also be conducted with light solvents (i.e., regular solvents) (No-D measurement method). The effective measurements for the No-D method are as follows: - Measurements to evaluate interactions with light solvents (e.g., degradation studies in light solvents) - Measurements of samples that cannot use deuterated solvents (e.g., samples in the biochemical field such as proteins) - Measurements of samples containing volatile components - Measurements of samples for which no dissolvable deuterated solvents are available.

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  • Contract Analysis
  • Contract measurement

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[Analysis Case] Three-Dimensional Structural Analysis of 3D Printed Objects

[Analysis Case] Three-Dimensional Structural Analysis of 3D Printed Objects

We will utilize the measurement and analysis of the product's three-dimensional structure for quality control!

Our organization offers three-dimensional structural analysis of 3D printed objects. Understanding the differences between the design drawings and the manufactured products is an important process in quality control. By conducting X-ray CT measurements, it becomes possible to compare the three-dimensional structural "discrepancies" between the printed objects and the design drawings, allowing for an evaluation of the quality. In this case study, we are evaluating molded products made from resin-based materials, but similar evaluations can also be conducted for molded products made from metal-based materials that allow X-rays to pass through. [Measurement Method / Processing Method] ■ X-ray CT Method *For more details, please download the PDF or feel free to contact us.

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  • Contract Analysis

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Structural analysis of paint fragments using a micro-infrared spectroscopic imaging system.

Structural analysis of paint fragments using a micro-infrared spectroscopic imaging system.

[Free Gift] Technical Documentation Using a Cutting-Edge Micro Infrared Spectroscopy Imaging System

Automotive paint is composed of multiple layers of paint to enhance weather resistance and aesthetic quality, with the layer structure and types of paint varying by vehicle model. Therefore, the component analysis of each layer that makes up a paint chip provides valuable information for identifying the vehicle model. This document presents case studies on the analysis of automotive paint chips conducted using a state-of-the-art micro-infrared spectroscopic imaging system. [Contents] ■ Introduction ■ Samples and Analysis System ■ Data Analysis ■ Results ■ Conclusion ■ References *For more details, please refer to the PDF document or feel free to contact us.

  • Analytical Equipment and Devices

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Analysis of defective connector terminal contacts with Au plating【STEM/EDS】

Analysis of defective connector terminal contacts with Au plating【STEM/EDS】

It can be confirmed without loss by the "sampling method that protects the surface" of the adhered layer (approximately 20nm) on the surface of the connector terminal plated with STEM.

In STEM (Scanning Transmission Electron Microscopy) and EDS (Energy Dispersive X-ray Spectroscopy), information about the composition of the sample (contrast images reflecting atomic numbers) can be obtained by scanning a finely focused electron beam over the sample. The following features are also available: - Observation of changes in diffraction contrast by varying the angle of incidence of the electron beam - Determination of whether the observation target is crystalline - Acquisition of information about crystal defects (dislocations, twins, etc.) within the crystal In this case, we will introduce "Failure Analysis of Au-Plated Connector Terminal Contacts Using STEM." Please take a moment to read the PDF materials. Additionally, our company conducts various cross-sectional analyses using not only STEM but also TEM and SEM. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request them through the inquiry button, we will send them to you.

  • Plating Equipment
  • Contract Analysis
  • Other metal materials

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Evaluation of semiconductor insulating films using STEM/EDS.

Evaluation of semiconductor insulating films using STEM/EDS.

STEM-EDS observation can confirm the shape and layer structure of the insulating film between semiconductor Poly-Si (polysilicon) and can be applied to investigate the causes of semiconductor defects.

In STEM (Scanning Transmission Electron Microscopy) and EDS (Energy Dispersive X-ray Spectroscopy), information regarding the composition of the sample (contrast images reflecting atomic numbers) can be obtained by scanning a finely focused electron beam over the sample. Additionally, the following features are available: - Observation of changes in diffraction contrast by varying the angle of incidence of the electron beam - Determination of whether the observation target is crystalline - Acquisition of information on crystal defects (dislocations, twins, etc.) within the crystal In this case, we introduce "Evaluation of Semiconductor Insulating Films using STEM-EDS." This case yielded no issues, but abnormal detection is also possible. Please take a moment to read the PDF materials. Furthermore, in addition to this STEM, our company excels in identifying defective areas by performing 3D reconstruction on specific regions of the sample in combination with FIB. We would be happy to provide a demonstration, so please feel free to reach out to us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request them through the inquiry button, we will send them to you.

  • Semiconductor inspection/test equipment
  • Contract Analysis
  • Other semiconductors

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[Price List] Compound Structure Analysis

[Price List] Compound Structure Analysis

Price list for structural analysis using testing methods such as "FT-IR" and "X-ray diffraction"! Listed with and without tax.

Mitsuba Environmental Solutions Co., Ltd. is a specialized company in environmental measurement, research and analysis, and ISO consulting. This document introduces the fees for "compound structure analysis," both excluding and including tax. We have listed the examination items such as "pre-treatment," "standard measurement KBr, measurement, analysis," and "microscopic method measurement, analysis," so please take a moment to read through it. [Listed Items] ■FT-IR ■Gas Chromatography Mass Spectrometry (GC-MS) ■X-ray Diffraction ■Ultraviolet-Visible Spectrophotometry ■Thermal Analysis *For more details, please refer to the PDF document or feel free to contact us.

  • Contract measurement

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[Catalog] Environmental-related Microbial Community Structure Analysis / Microbiome Analysis Kits

[Catalog] Environmental-related Microbial Community Structure Analysis / Microbiome Analysis Kits

Rich lineup of microbiome structure analysis (microbiota analysis) and data analysis!

This catalog introduces the "Environmental Microbial Community Structure Analysis / Microbiome Analysis Kits" provided by Technosulga Lab Co., Ltd., a company specializing in microbial identification testing services. It includes various services such as "DNA extraction" to extract DNA from different types of environmental samples, and "Amplicon Sequencing Analysis (Bacteria and Archaea)" that can accommodate a wide range of samples including culture media from soil and environmental water, as well as fermented foods. [Contents] ■ Introduction and Common Guide ■ Microbial Community Structure Analysis (Microbiome Analysis) ■ Data Analysis ■ Other Microbial Tests and Products *For more details, please download the PDF or contact us.

  • Food Testing/Analysis/Measuring Equipment
  • Contract Analysis
  • Other safety and hygiene products

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Report: Detailed Structural Analysis of Application Processor Logic

Report: Detailed Structural Analysis of Application Processor Logic

This is a detailed structural analysis of the Mediatek MT6592 octa-core (8-core).

This report is a detailed structural analysis of the Mediatek MT6592 octa-core (8-core) application processor. The MT6592 features an ARM Cortex-A7 processor and is marketed as a "true octa-core" SoC, equipped with a 4-core ARM MaliTM GPU, supporting Full HD displays, cameras up to 16 million pixels, multi-mode cellular modems, and dual-band 802.11n Wi-Fi, among other features. The MT6592 is manufactured using TSMC's HPM CMOS process with an 8-layer metal (7 Cu, 1 Al) structure, high-k metal gate (HKMG), and a gate length of 28nm. 【Features】 ○ Crystal orientation of the transistor channel <110> ○ Hafnium oxide (HfO2) material for the gate insulating film ○ Dual work function metal gate ○ nMOS (NiSi) and pMOS (NiSiGe) source/drain regions, and low-k interlayer insulating film For more details, please contact us or download the catalog.

  • Analysis Services

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Business Information: Process Analysis

Business Information: Process Analysis

Research on key innovative process technologies, optimization of manufacturing costs, and improvement of yield!

The process helps determine the cost, quality, and performance of devices, and often compensates for design flaws. TechInsights employs 10 process experts and provides the collective expertise accumulated over more than 140 years in device structure analysis. Devices include but are not limited to CMOS, bipolar, BiCMOS, GaAs, SiGe, copper, low-k dielectrics, SOI, strained silicon, MEMS, and TFT. Using data collected through TechInsights' specialized technology, we provide information on the structure, material composition, critical dimensions, and manufacturing processes of your products or competing products in the form of process analysis reports. 【Example Issues Addressed】 - How to embed memory (flash, DRAM, SRAM, FeRAM) into logic devices - How to mitigate risks when transitioning to more advanced process generations - What transistor performance major competing products have - How RF devices are integrated into CMOS For more details, please contact us or download the catalog.

  • Patents

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Analysis of live microbial community structure *Case study collection available

Analysis of live microbial community structure *Case study collection available

Introducing new amplicon analyses from next-generation sequencing! We present two approaches.

At Fasmac, we offer "Analysis of Live Microbial Community Structure." The "Community Structure Analysis using the Selective Membrane Permeable Dye EMA" utilizes the fact that EMA modifies DNA derived from dead bacteria, rendering the modified DNA unable to be amplified by PCR, allowing for the selective detection of DNA from live bacteria. Additionally, the "Community Structure Analysis using cDNA from Reverse Transcription of RNA" is a method for identifying actively functioning microorganisms by analyzing RNA in environmental samples. 【Features】 <Community Structure Analysis using Selective Membrane Permeable Dye EMA> ■ Utilizes the modification of dead bacterial DNA by EMA, which prevents PCR amplification of the modified DNA ■ Selectively detects DNA from live bacteria <Community Structure Analysis using cDNA from Reverse Transcription of RNA> ■ Analyzes RNA in environmental samples ■ Identifies actively functioning microorganisms *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis

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FEM stress structural analysis

FEM stress structural analysis

We are utilizing cutting-edge systems such as 3D robot simulation and FEM stress structural analysis to improve productivity and quality.

We use HYPER MESH for FEM analysis modeling. A wide range of engineers, from skilled professionals to young talent, provide stable quality and the latest technology. You can rely on us for everything from design to simulation, analysis, and robot teaching.

  • Other industrial robots
  • Assembly Machine
  • simulator

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Technical Information Magazine 201904-02 Cellulose Nanofiber Structural Analysis

Technical Information Magazine 201904-02 Cellulose Nanofiber Structural Analysis

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** In the research and development of CNF, the use of electron microscopy for observation has become a necessary evaluation across almost all material fields and research phases. Particularly for observing CNF dispersed in polymers using TEM, it is essential to employ the technique of "electron staining," which has been crucial for preparing TEM samples of polymer materials. In this presentation, we will introduce examples of morphological observations of composite materials using CNF, as well as observation cases of the CNF itself, structural analysis examples such as crystallinity measured by 13C solid-state NMR, and examples of compositional sugar analysis using acid hydrolysis HPLC-fluorescence detection. **Table of Contents** 1. Introduction 2. Overview of Morphological Observation 3. Observation Cases of CNF and CNF/Polymer 4. Evaluation of CNF Crystallinity 5. Compositional Sugar Analysis of CNF (HPLC-Fluorescence Detection) 6. Conclusion

  • Contract Analysis
  • Contract measurement
  • Technical and Reference Books

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