We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Surface Analysis Equipment.
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Surface Analysis Equipment Product List and Ranking from 14 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Jul 22, 2026～Aug 18, 2026
This ranking is based on the number of page views on our site.

Surface Analysis Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jul 22, 2026～Aug 18, 2026
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. ザ・ブルーボアハウス Tokyo//Industrial Electrical Equipment
  3. パスカル Osaka//Industrial Machinery
  4. 4 ケニックス Hyogo//Electronic Components and Semiconductors
  5. 5 東邦化研 Saitama//Electronic Components and Semiconductors
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Surface Analysis Equipment Product ranking

Last Updated： Aggregation Period:Jul 22, 2026～Aug 18, 2026
This ranking is based on the number of page views on our site.

  1. [Analysis Case] Evaluation of Coating Film on Injection Needle Surface 一般財団法人材料科学技術振興財団　MST
  2. [Analysis Case] Evaluation of the Imidization Reaction of Polyimide 一般財団法人材料科学技術振興財団　MST
  3. Bright Signs Corporation Automatic Surface Analysis Device 5001 Handheld ザ・ブルーボアハウス
  4. [Analysis Case] Evaluation of the Depth Direction State of Stainless Steel Passive Film 一般財団法人材料科学技術振興財団　MST
  5. [Analysis Case] Evaluation of SUS Passive Film Depth Direction State and Oxide Film Thickness 一般財団法人材料科学技術振興財団　MST

Surface Analysis Equipment Product List

61～67 item / All 67 items

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[Analysis Case] XPS Analysis of Metal Pipe Inner Wall Using Combined Cutting Processing

[Analysis Case] XPS Analysis of Metal Pipe Inner Wall Using Combined Cutting Processing

We provide one-stop solutions from sample cutting processing to investigating the causes of discoloration and corrosion.

The inner walls of metal pipes, such as SUS, used in various fields can discolor and corrode due to reactions with incoming gases and liquids, leading to a decline in equipment functionality. Understanding the locations prone to discoloration and corrosion, as well as their causes, is an important issue in equipment maintenance. At MST, we provide a comprehensive evaluation from sample cutting to analysis. This document presents a case study of XPS analysis conducted on the inner walls of SUS pipes used in vacuum equipment, highlighting both normal and discolored areas.

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  • Contract Analysis
  • Contract measurement
  • Surface Analysis Equipment

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Accelerating research and development, [new] surface analysis service launched!

Accelerating research and development, [new] surface analysis service launched!

Not only the surface, but also up to a depth of 30nm - Quantitative evaluation of the chemical state at the surface and inside the material at the same location and non-destructively!

We have launched a new service using XPS/HAXPES starting in June! For increasingly complex materials and fine structure samples, we can evaluate the composition and chemical bonding states from the surface to the interior of the material (up to ~30nm) at the same location and in a non-destructive manner. - Depending on the elements of interest and the analysis area and depth, we can select the appropriate X-ray source (Al Kα/Mg Kα/Ga Kα/Cr Kα) to achieve evaluation under suitable measurement conditions. - Non-exposure measurements to the atmosphere, Ar monomer/GCIB sputter etching, and heating pretreatment can be combined. - It is possible to evaluate the electronic states of semiconductor samples using UPS/LEIPS (ionization potential/electron affinity/band gap).

  • Secondary Cells/Batteries
  • Surface Analysis Equipment

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[Analysis Case] Depth Direction State Evaluation of Tin (Sn) Surface

[Analysis Case] Depth Direction State Evaluation of Tin (Sn) Surface

Evaluation of modified layers and altered layers through surface treatment is possible!

TOF-SIMS has good depth resolution and can obtain fragment ions corresponding to bonding states, allowing for the evaluation of layer structures near the surface, within a few nanometers. This document presents a case study analyzing the layer structure of a tin plate surface based on the information obtained from the measurement of standard samples of tin oxide and hydrated tin oxide. By applying this technology, it is possible to evaluate modified layers and altered layers due to surface treatment.

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  • Contract measurement
  • Contract Inspection
  • Surface Analysis Equipment

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Case Study Collection 1 on Surface Analysis (DL Available: XPS/AES/GD-OES)

Case Study Collection 1 on Surface Analysis (DL Available: XPS/AES/GD-OES)

We will introduce examples of surface analysis and measurements using various devices such as XPS, AES, and GD-OES, including measurements of Ni plating thickness, concentration, and surface contamination levels.

In this case study collection, we will introduce examples related to "surface analysis." We cover the objectives, methods, and results of "cleaning evaluation of plating substrates (GD-OES measurement)," as well as the features and analysis cases of "surface contamination analysis using XPS," and the characteristics and analysis cases of "analysis of iron rust (Raman spectroscopy)," among many others. Additionally, we present analysis results, condition analysis, composition measurements, and more. We encourage you to read it. [Contents] ■ Cleaning evaluation of plating substrates (GD-OES measurement) ■ Surface contamination analysis using XPS ■ Condition analysis of copper oxide (XPS/AES analysis) ■ Analysis of iron rust (Raman spectroscopy) ■ Composition investigation of discolored stainless steel *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Contract Analysis
  • Surface treatment contract service
  • Surface Analysis Equipment

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Technical Document "Overview of Surface Analysis"

Technical Document "Overview of Surface Analysis"

Technical documentation explaining representative surface analysis methods such as EPMA and AES.

The technical document "Overview of Surface Analysis" contains information on various "surface analysis methods" that have become increasingly important in recent years for product development and addressing defects, focusing on understanding the structure and composition of surfaces and interfaces. This document provides a concise explanation of the fundamental surface analysis techniques, including representative methods such as EPMA, AES, XPS, SIMS, and TOF-SIMS. [Contents] ■ Types and characteristics of surface analysis - EPMA - AES - XPS, etc. For more details, please refer to the catalog or feel free to contact us.

  • Contract Analysis
  • Contract measurement
  • Contract Inspection
  • Surface Analysis Equipment

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Technical Data - Analysis of LIB - Mn Valence Analysis by ESCA

Technical Data - Analysis of LIB - Mn Valence Analysis by ESCA

We will introduce examples of analyzing the Mn valence using commercially available lithium manganese oxide.

This is a technical document introducing the analysis of Mn valence using -LIB analysis - ESCA. It presents a case study analyzing the Mn valence using commercially available lithium manganese oxide, clearly illustrated with charts and graphs. [Contents] ■ Overview ■ Introduction of analysis case studies *For more details, please refer to the PDF document or feel free to contact us.

  • Contract Analysis
  • Surface Analysis Equipment

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Surface analysis device using atoms in the probe (an advanced version of CAICISS)

Surface analysis device using atoms in the probe (an advanced version of CAICISS)

Crystal orientation and pole production are evident in 15 minutes! Stable surface analysis is possible without the influence of charging! Time-of-flight atomic scattering surface analysis device [We accept analysis requests!]

The "TOFLAS-3000" is an atomic scattering surface analysis device that can simultaneously perform crystal structure and elemental analysis of solid surfaces such as metals, semiconductors, and insulators. This device has developed the coaxial direct collision ion scattering spectroscopy (CAICISS) method, using an atomic beam of electrically neutral He (Ne, Ar) as a probing tool, allowing for stable surface analysis without the influence of charging, even on insulators. In crystal surface structure analysis, a unique pattern specific to the crystal surface can be obtained through an omnidirectional scan of the incident angle, making it visually easy to determine the surface structure. 【Features】 - Visualization of crystal orientation, symmetry, and the front and back of polar crystals * Easy distinction of the front and back of crystals with wurtzite structures (such as GaN and AlN) - Simple elemental analysis and crystal structure analysis for each layer near the surface * Analysis of ultra-thin films is also possible - When synchronized with pole figure simulation, it can be operated as if "seen in person" - No issues with orientation determination of insulating samples or organic molecular films - High-sensitivity evaluation of impurities through simultaneous measurement with SIMS (complementary to TOF spectra) * For more details, please refer to the PDF document or feel free to contact us. * We also accept analysis requests.

  • Analytical Equipment and Devices
  • Semiconductor inspection/test equipment
  • Surface Analysis Equipment

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