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Surface Analysis Equipment Product List and Ranking from 13 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

Surface Analysis Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. ザ・ブルーボアハウス Tokyo//Industrial Electrical Equipment
  3. シエンタ オミクロン Tokyo//Testing, Analysis and Measurement
  4. 4 東邦化研 Saitama//Electronic Components and Semiconductors
  5. 5 北野精機 Tokyo//Manufacturing and processing contract
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Surface Analysis Equipment Product ranking

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. Bright Signs Corporation Automatic Surface Analysis Device 5001 Handheld ザ・ブルーボアハウス
  2. Sienta Omicron Surface Analysis Device ESCA シエンタ オミクロン
  3. [Analysis Case] Evaluation of Oxidation State of Cu Surface by XPS 一般財団法人材料科学技術振興財団　MST
  4. 4 Accelerating research and development, [new] surface analysis service launched! 一般財団法人材料科学技術振興財団　MST
  5. 5 [Analysis Case] Evaluation of the sp2/(sp2+sp3) Ratio of DLC Films 一般財団法人材料科学技術振興財団　MST

Surface Analysis Equipment Product List

16～30 item / All 47 items

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[Analysis Case] Component Analysis of Organic EL Emission Layer

[Analysis Case] Component Analysis of Organic EL Emission Layer

Possible to dismantle and preprocess while maintaining the atmosphere, up to the introduction of equipment.

It is known that organic EL materials undergo changes when exposed to air. We present results obtained from TOF-SIMS regarding the surface state of luminescent materials left in a nitrogen atmosphere and in the atmosphere. In samples produced in a nitrogen atmosphere, parent ions are primarily detected, but when left in air, fragments with oxygen attached to the parent ions are detected. For materials that are prone to degradation, it is necessary to analyze them without exposing them to the atmosphere.

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[Analysis Case] Depth Direction Analysis of XPS on the Micron (μm) Order

[Analysis Case] Depth Direction Analysis of XPS on the Micron (μm) Order

Depth direction analysis will be conducted to a depth of several micrometers.

XPS is a surface-sensitive technique widely used for evaluating sample surfaces, but when combined with ion etching, it allows for depth analysis. In addition to the compositional distribution in the depth direction, XPS also enables the assessment of bonding states, making it suitable for investigating the causes of discoloration on the surfaces of device components. This document presents a case study evaluated by XPS regarding the discoloration of the blades of a turbo molecular pump.

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  • Contract manufacturing

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Analysis case: Evaluation of the oxide film on the surface of solder balls.

Analysis case: Evaluation of the oxide film on the surface of solder balls.

Evaluation case of spherical shape samples

In AES analysis, the SEM observation function is included, allowing for the measurement of specific areas on the sample surface. Additionally, since measurements can be taken in sub-micrometer micro-regions, it is possible to target specific areas for measurement not only on flat samples like substrates but also on samples with spherical or curved shapes, which are less affected by curvature. Below is an example of evaluating the oxide film thickness on solder ball surfaces with different surface shapes.

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  • Solder

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Technical Data: Evaluation of Element Distribution and Chemical State of SEI Film on Secondary Battery Anode

Technical Data: Evaluation of Element Distribution and Chemical State of SEI Film on Secondary Battery Anode

Composite approach to the cross-sectional structure and surface shape of the negative electrode, as well as elemental mapping images of the active material cross-section!

One of the causes of capacity degradation at the negative electrode of lithium-ion secondary batteries is the formation of a film called SEI (Solid Electrolyte Interphase), which is created by interfacial reactions between the active material and the electrolyte, resulting in various lithium salt compounds complexing on the surface of the active material. To improve battery performance, control over the composition, thickness, and chemical bonding state of the SEI film is required. This document presents examples of evaluations of the SEI film formed on the surface of carbon-based negative electrode active materials for automotive batteries using SEM, TEM, TEM-EELS, TOF-SIMS, and XPS. *For more details, please refer to the PDF document or feel free to contact us.*

  • Secondary Cells/Batteries
  • Contract measurement

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[Analysis Case] Evaluation of Oxidation State of Cu Surface by XPS

[Analysis Case] Evaluation of Oxidation State of Cu Surface by XPS

Separation of components in the Cu spectrum, quantification, and calculation of film thickness.

From the analysis of the Cu2p3/2 spectrum and Cu Auger spectrum, it is possible to evaluate the bonding state, quantitative assessment, and film thickness of the Cu surface. Major application examples include the evaluation of CMP processing and cleaning of Cu wiring, as well as the investigation of rust and discoloration of Cu electrodes. We will summarize the surface states of Cu treated with various processes and the thickness of the oxide film. (Measurements can be conducted immediately after treatment in a clean room environment.)

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[Analysis Case] Evaluation of Discoloration Causes in Ceramics

[Analysis Case] Evaluation of Discoloration Causes in Ceramics

TOF-SIMS enables imaging of the discoloration causes of inorganic materials.

Ceramics are inorganic compound materials widely used in everyday goods and electronic components. For evaluating the discoloration of ceramics caused by impurities and adherents, TOF-SIMS analysis, which allows for imaging analysis of trace components regardless of organic or inorganic substances at the focus area, is effective. This document presents a case study where the discoloration of aluminum oxide ceramics was analyzed using TOF-SIMS, demonstrating the cause of discoloration through ion images and line profiles. Measurement method: TOF-SIMS Product field: Manufacturing equipment and components Analysis purpose: Composition distribution evaluation For more details, please download the document or contact us.

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[Analysis Case] Evaluation of the Distribution of Cleaning Components on Ceramic Surfaces

[Analysis Case] Evaluation of the Distribution of Cleaning Components on Ceramic Surfaces

It is possible to visualize the distribution of cleaning components and evaluate the distribution in the depth direction.

Ceramics are inorganic compound materials widely used in everyday items and electronic components. Their surface condition significantly affects the properties and performance of materials such as everyday items and electronic components. Therefore, it is important to properly evaluate the surface condition when assessing the functionality of ceramics. This document introduces a case study evaluating the cleaning components that contribute to the wettability of ceramic surfaces made of zirconium oxide, using TOF-SIMS to assess surface distribution and depth distribution. Measurement method: TOF-SIMS Product field: Manufacturing equipment and components Analysis purpose: Qualitative and distribution evaluation For more details, please download the document or contact us.

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  • Contract Analysis
  • Contract measurement

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Data DL available: Case studies on surface analysis 2 (XPS/AES/AFM)

Data DL available: Case studies on surface analysis 2 (XPS/AES/AFM)

We have carefully selected case studies using XPS, AES, and AFM for discoloration investigation and surface modification evaluation. Please take a look and download the materials.

In this case study collection, we will introduce examples related to "surface analysis." We feature numerous characteristics and analysis cases, including "investigation of discoloration on material surfaces using XPS," "evaluation of surface modification of PET using XPS," "analysis of hydrophobic films using XPS," and "evaluation of heating effects on plated parts." Additionally, we present analysis results, discoloration investigations, surface modification evaluations, and analyses of hydrophobic films. We encourage you to read through it. [Contents] ■ Investigation of discoloration on material surfaces using XPS ■ Evaluation of surface modification of PET using XPS ■ Analysis of hydrophobic films using XPS ■ Evaluation of heating effects on plated parts (AFM, AES) *For more details, please refer to the PDF document or feel free to contact us.

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  • Other metal materials
  • Other polymer materials

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Sienta Omicron Surface Analysis Device ESCA

Sienta Omicron Surface Analysis Device ESCA

X-ray photoelectron spectroscopy device

We have prepared an X-ray photoelectron spectroscopy device. For more details, please contact us or refer to the catalog.

  • Spectroscopic Analysis Equipment

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Technical Information Magazine 201902-02 Development of Atmospheric Pressure RBS Analysis

Technical Information Magazine 201902-02 Development of Atmospheric Pressure RBS Analysis

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** In many cases, the analysis targets in surface analysis are limited to those that can be maintained in a vacuum. On the other hand, by applying the potential of high-speed ions, it is possible to bring the analysis probe out to atmospheric pressure. At TRC, we examined Rutherford backscattering spectroscopy (RBS) at atmospheric pressure and succeeded in its realization. This paper reports on depth analysis of solid/liquid interfaces using atmospheric pressure RBS, evaluation of depth distribution of quantum dots in HeLa cells, and depth analysis of hydrogen in wet samples using atmospheric pressure RBS/HFS (hydrogen forward scattering analysis). **Table of Contents** 1. Introduction 2. Solid/Liquid Interface Analysis 3. Application to Biological Samples 4. Development of Measurement System at TRC: Atmospheric Pressure RBS/HFS Analysis 5. Conclusion

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  • Technical and Reference Books

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Bright Signs Corporation Automatic Surface Analysis Device 5001 Handheld

Bright Signs Corporation Automatic Surface Analysis Device 5001 Handheld

High-speed, easy, accurate, non-destructive surface contact angle analysis device. It measures surface energy (wetting properties) as a substitute for the dyne value.

The Surface Analyst 5001 from BrightSign USA is a handheld complete surface analysis device that allows manufacturers to quantify the quality of material surfaces for adhesion, coating, sealing, painting, printing, or cleaning applications by analyzing water contact angles. It is a standalone model (non-network specification) and is used for on-site handheld measurements. It can be used on a variety of materials, including webs (paper, film, carbon fiber composites) and 3D component materials (such as iron, aluminum, non-ferrous metals, and plastics).

  • Analytical Equipment and Devices
  • Other measurement, recording and measuring instruments

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Time-of-Flight Atomic Scattering Surface Analysis Device "TOFLAS-3000"

Time-of-Flight Atomic Scattering Surface Analysis Device "TOFLAS-3000"

Crystal orientation and polarity are clear in 15 minutes! Stable surface analysis is possible without the influence of charging!

The "TOFLAS-3000" is an atomic scattering surface analysis device that can simultaneously perform crystal structure and elemental analysis of solid surfaces such as metals, semiconductors, and insulators. This device has developed the coaxial direct collision ion scattering spectroscopy (CAICISS) method and uses an atom beam of electrically neutral He (Ne, Ar) as a probing tool, allowing for stable surface analysis without the influence of charging, even on insulators. In crystal surface structure analysis, a unique pattern specific to the crystal surface can be obtained by conducting a full-angle scan of the incident angle, making it visually easy to determine the surface structure. 【Features】 ■ Visualization of crystal orientation, symmetry, and the front and back of polar crystals * Easy distinction of the front and back of crystals with wurtzite structures (such as GaN and AlN) ■ Simple elemental analysis and crystal structure analysis for each layer near the surface * Analysis of ultra-thin films is also possible ■ When synchronized with pole figure simulation, it can be operated as if "seen in person" ■ No issues with orientation determination of insulating samples or organic molecular films ■ High-sensitivity evaluation of impurities through simultaneous measurement with SIMS (complementary to TOF spectra) * For more details, please refer to the PDF document or feel free to contact us. * We also accept analysis requests.

  • Analytical Equipment and Devices
  • Semiconductor inspection/test equipment

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Surface analysis device using atoms in the probe (an advanced version of CAICISS)

Surface analysis device using atoms in the probe (an advanced version of CAICISS)

Crystal orientation and pole production are evident in 15 minutes! Stable surface analysis is possible without the influence of charging! Time-of-flight atomic scattering surface analysis device [We accept analysis requests!]

The "TOFLAS-3000" is an atomic scattering surface analysis device that can simultaneously perform crystal structure and elemental analysis of solid surfaces such as metals, semiconductors, and insulators. This device has developed the coaxial direct collision ion scattering spectroscopy (CAICISS) method, using an atomic beam of electrically neutral He (Ne, Ar) as a probing tool, allowing for stable surface analysis without the influence of charging, even on insulators. In crystal surface structure analysis, a unique pattern specific to the crystal surface can be obtained through an omnidirectional scan of the incident angle, making it visually easy to determine the surface structure. 【Features】 - Visualization of crystal orientation, symmetry, and the front and back of polar crystals * Easy distinction of the front and back of crystals with wurtzite structures (such as GaN and AlN) - Simple elemental analysis and crystal structure analysis for each layer near the surface * Analysis of ultra-thin films is also possible - When synchronized with pole figure simulation, it can be operated as if "seen in person" - No issues with orientation determination of insulating samples or organic molecular films - High-sensitivity evaluation of impurities through simultaneous measurement with SIMS (complementary to TOF spectra) * For more details, please refer to the PDF document or feel free to contact us. * We also accept analysis requests.

  • Analytical Equipment and Devices
  • Semiconductor inspection/test equipment

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Surface analysis device "Ultra High Vacuum Surface Structure Analysis Device"

Surface analysis device "Ultra High Vacuum Surface Structure Analysis Device"

A surface structure analysis device equipped with an EB evaporator suitable for the fabrication of metal thin films!

The "Ultra High Vacuum Surface Structure Analysis Device" is a surface analysis instrument capable of performing LEED diffraction patterns, Auger analysis, and temperature-programmed desorption analysis for semiconductors and model catalysts. The analyzer is equipped with a LEED/AES mass spectrometer and features an EB evaporator suitable for metal thin film fabrication. Please feel free to contact us if you have any inquiries. 【Specifications】 ■ Surface analysis system: LEED/AES ■ Evaporation source: Ultra high vacuum evaporator "AEV series" ■ Gas source: Hydrogen cracking gun "AEV series" ■ Sample heating: Direct electric heating type (TC contact type sample holder) ■ Sample manipulator: 5-axis operation with X, Y, Z, θ, and in-plane rotation axis, etc. *For more details, please contact us.

  • Analytical Equipment and Devices

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Surface analysis of discolored and altered materials using XPS (ESCA).

Surface analysis of discolored and altered materials using XPS (ESCA).

Measures and avoidance of issues are possible! We will introduce examples verified through elemental and bonding state analysis.

Materials often undergo changes and discoloration depending on the usage environment. These changes and discoloration can lead to issues with the product's performance and design, but by understanding and clarifying the changes in molecular structure through chemical analysis, it becomes possible to address or avoid these problems. This document presents case studies that have been compared and verified through elemental and bonding state analysis via surface analysis. [Contents] ■ Analysis Samples ■ Elemental Analysis Results by XPS (ESCA) ■ Bonding State Analysis Results by XPS (ESCA) for Polycarbonate ■ Bonding State Analysis Results by XPS (ESCA) for Polyvinyl Chloride *For more details, please refer to the PDF document or feel free to contact us.

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