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Surface Analysis Equipment Product List and Ranking from 14 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

Surface Analysis Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. パスカル Osaka//Industrial Machinery
  3. セイコーフューチャークリエーション Chiba//Testing, Analysis and Measurement
  4. 4 東邦化研 Saitama//Electronic Components and Semiconductors
  5. 5 シエンタ オミクロン Tokyo//Testing, Analysis and Measurement
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Surface Analysis Equipment Product ranking

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. [Analysis Case] Evaluation of Oxidation State of Cu Surface by XPS 一般財団法人材料科学技術振興財団　MST
  2. [Analysis Case] Quantification of Hydroxyl Groups by Chemical Modification XPS 一般財団法人材料科学技術振興財団　MST
  3. [Analysis Case] Surface Contamination Assessment of Si Wafers Stored Using TOF-SIMS 一般財団法人材料科学技術振興財団　MST
  4. 4 Time-of-Flight Atomic Scattering Surface Analysis Device "TOFLAS-3000" パスカル
  5. 4 [Analysis Case] Evaluation of Nickel Plating Peel-off Surface by TOF-SIMS 一般財団法人材料科学技術振興財団　MST

Surface Analysis Equipment Product List

16～30 item / All 48 items

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[Analysis Case] Depth Direction Analysis of XPS on the Micron (μm) Order

[Analysis Case] Depth Direction Analysis of XPS on the Micron (μm) Order

Depth direction analysis will be conducted to a depth of several micrometers.

XPS is a surface-sensitive technique widely used for evaluating sample surfaces, but when combined with ion etching, it allows for depth analysis. In addition to the compositional distribution in the depth direction, XPS also enables the assessment of bonding states, making it suitable for investigating the causes of discoloration on the surfaces of device components. This document presents a case study evaluated by XPS regarding the discoloration of the blades of a turbo molecular pump.

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The Kumamoto Sales Office opened on April 15, 2022 (Friday) MST!

The Kumamoto Sales Office opened on April 15, 2022 (Friday) MST!

We will base our operations at the Kumamoto Sales Office and aim to further improve our services for customers in the Kyushu region.

The first Kumamoto sales office in the Kyushu region has opened. Based in the Kumamoto sales office, we aim to further enhance our services for customers in the Kyushu area. Meetings can be held by visiting your company, and consultations on analysis can also be conducted at the sales office. We will achieve satisfactory quality and delivery times through close collaboration with our Tokyo headquarters (laboratory). Please look forward to it. Opening date: April 15, 2022 (Friday) Address: 161-1 Muro, Otsu Town, Kikuchi District, Kumamoto Prefecture, Station M 102 *Please send samples to the headquarters located in Setagaya, Tokyo. Headquarters address: 1-18-6 Kitami, Setagaya, Tokyo Phone number: 090-7017-3882 (Contact: Takeda)

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[Analysis Case] Evaluation of Oxidation State of Cu Surface by XPS

[Analysis Case] Evaluation of Oxidation State of Cu Surface by XPS

Separation of components in the Cu spectrum, quantification, and calculation of film thickness.

From the analysis of the Cu2p3/2 spectrum and Cu Auger spectrum, it is possible to evaluate the bonding state, quantitative assessment, and film thickness of the Cu surface. Major application examples include the evaluation of CMP processing and cleaning of Cu wiring, as well as the investigation of rust and discoloration of Cu electrodes. We will summarize the surface states of Cu treated with various processes and the thickness of the oxide film. (Measurements can be conducted immediately after treatment in a clean room environment.)

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[Analysis Case] Evaluation of Discoloration Causes in Ceramics

[Analysis Case] Evaluation of Discoloration Causes in Ceramics

TOF-SIMS enables imaging of the discoloration causes of inorganic materials.

Ceramics are inorganic compound materials widely used in everyday goods and electronic components. For evaluating the discoloration of ceramics caused by impurities and adherents, TOF-SIMS analysis, which allows for imaging analysis of trace components regardless of organic or inorganic substances at the focus area, is effective. This document presents a case study where the discoloration of aluminum oxide ceramics was analyzed using TOF-SIMS, demonstrating the cause of discoloration through ion images and line profiles. Measurement method: TOF-SIMS Product field: Manufacturing equipment and components Analysis purpose: Composition distribution evaluation For more details, please download the document or contact us.

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[Analysis Case] Evaluation of the Distribution of Cleaning Components on Ceramic Surfaces

[Analysis Case] Evaluation of the Distribution of Cleaning Components on Ceramic Surfaces

It is possible to visualize the distribution of cleaning components and evaluate the distribution in the depth direction.

Ceramics are inorganic compound materials widely used in everyday items and electronic components. Their surface condition significantly affects the properties and performance of materials such as everyday items and electronic components. Therefore, it is important to properly evaluate the surface condition when assessing the functionality of ceramics. This document introduces a case study evaluating the cleaning components that contribute to the wettability of ceramic surfaces made of zirconium oxide, using TOF-SIMS to assess surface distribution and depth distribution. Measurement method: TOF-SIMS Product field: Manufacturing equipment and components Analysis purpose: Qualitative and distribution evaluation For more details, please download the document or contact us.

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[Analysis Case] Composition Analysis of the Surface Film on the Positive Electrode of Secondary Batteries

[Analysis Case] Composition Analysis of the Surface Film on the Positive Electrode of Secondary Batteries

Evaluation of the distribution of organic components and active substances on the surface, qualitative analysis.

The segregation of components and the formation of films on the surface of the positive electrode of lithium-ion secondary batteries are factors that influence the electric capacity. We will introduce a case study on Li(NiCoMn)O2 (NCM), which is used as a positive electrode, where micro-region mapping was conducted using AES, and qualitative analysis of organic components (binder) and active material surface films was performed using XPS and TOF-SIMS. These methods allow for analysis with a series of treatments conducted under an Ar atmosphere, which helps to suppress the alteration of the sample.

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[Analysis Case] Wide-area Quantitative Mapping using XPS

[Analysis Case] Wide-area Quantitative Mapping using XPS

It is possible to evaluate the composition distribution in an area of up to 70×70mm.

This is an example of wide-area quantitative mapping using XPS. We evaluated organic residue on silicon wafers using the following procedure. To graph the amount (atomic concentration) rather than peak intensity, it is less affected by sample roughness and allows for data acquisition over a wide area. It is suitable for investigating organic and inorganic contamination, discoloration, surface treatments, etc., as it enables an overview assessment of the compositional distribution on the sample surface.

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Data DL available: Case studies on surface analysis 2 (XPS/AES/AFM)

Data DL available: Case studies on surface analysis 2 (XPS/AES/AFM)

We have carefully selected case studies using XPS, AES, and AFM for discoloration investigation and surface modification evaluation. Please take a look and download the materials.

In this case study collection, we will introduce examples related to "surface analysis." We feature numerous characteristics and analysis cases, including "investigation of discoloration on material surfaces using XPS," "evaluation of surface modification of PET using XPS," "analysis of hydrophobic films using XPS," and "evaluation of heating effects on plated parts." Additionally, we present analysis results, discoloration investigations, surface modification evaluations, and analyses of hydrophobic films. We encourage you to read through it. [Contents] ■ Investigation of discoloration on material surfaces using XPS ■ Evaluation of surface modification of PET using XPS ■ Analysis of hydrophobic films using XPS ■ Evaluation of heating effects on plated parts (AFM, AES) *For more details, please refer to the PDF document or feel free to contact us.

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  • Other metal materials
  • Other polymer materials

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Sienta Omicron Surface Analysis Device ESCA

Sienta Omicron Surface Analysis Device ESCA

X-ray photoelectron spectroscopy device

We have prepared an X-ray photoelectron spectroscopy device. For more details, please contact us or refer to the catalog.

  • Spectroscopic Analysis Equipment

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Book Surface and Depth Analysis Methods [New Edition]

Book Surface and Depth Analysis Methods [New Edition]

A clear explanation of surface analysis for developers and manufacturers who are not specialists in analysis!

○Publication Date: December 10, 2007 ○Format: B5 size, paperback, 618 pages ○Price: 33,000 yen (excluding tax) → STbook member price: 31,350 yen (excluding tax) First Edition: December 2007 This book is a revised edition of "Surface and Depth Analysis Methods," published in December 2007 (ISBN 978-4-903413-30-3), with updated binding and pricing. The content is the same as the 2007 publication, so please be careful not to make a mistake when purchasing. ○Authors: Hiroyoshi Soejima, Shimadzu Scientific Research Institute, Inc. / Takeshi Teratani, Sumika Chemical Analysis Service, Ltd. / Junichiro Murayama, Sumitomo Metal Technology, Ltd. / Shinji Nagamachi, Ion Engineering Research Institute, Inc. / Keizo Ishii, Tohoku University / Kazutoshi Kakita, Nippon Steel Technoresearch, Inc. / Makoto Nishino, Shimadzu Corporation / Makishi Ishikawa, Cameca Instruments, Inc. / Takahiro Hoshi, ULVAC, Inc. / Satoshi Kawata, SII Nanotechnology, Inc. / Satoshi Yoshimi, Shimadzu Comprehensive Analysis Testing Center / and 45 others.

  • Company：S&T出版
  • Price：10,000 yen-100,000 yen
  • Technical and Reference Books

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Technical Information Magazine 201902-02 Development of Atmospheric Pressure RBS Analysis

Technical Information Magazine 201902-02 Development of Atmospheric Pressure RBS Analysis

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** In many cases, the analysis targets in surface analysis are limited to those that can be maintained in a vacuum. On the other hand, by applying the potential of high-speed ions, it is possible to bring the analysis probe out to atmospheric pressure. At TRC, we examined Rutherford backscattering spectroscopy (RBS) at atmospheric pressure and succeeded in its realization. This paper reports on depth analysis of solid/liquid interfaces using atmospheric pressure RBS, evaluation of depth distribution of quantum dots in HeLa cells, and depth analysis of hydrogen in wet samples using atmospheric pressure RBS/HFS (hydrogen forward scattering analysis). **Table of Contents** 1. Introduction 2. Solid/Liquid Interface Analysis 3. Application to Biological Samples 4. Development of Measurement System at TRC: Atmospheric Pressure RBS/HFS Analysis 5. Conclusion

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Bright Signs Corporation Automatic Surface Analysis Device 5001 Handheld

Bright Signs Corporation Automatic Surface Analysis Device 5001 Handheld

High-speed, easy, accurate, non-destructive surface contact angle analysis device. It measures surface energy (wetting properties) as a substitute for the dyne value.

The Surface Analyst 5001 from BrightSign USA is a handheld complete surface analysis device that allows manufacturers to quantify the quality of material surfaces for adhesion, coating, sealing, painting, printing, or cleaning applications by analyzing water contact angles. It is a standalone model (non-network specification) and is used for on-site handheld measurements. It can be used on a variety of materials, including webs (paper, film, carbon fiber composites) and 3D component materials (such as iron, aluminum, non-ferrous metals, and plastics).

  • Analytical Equipment and Devices
  • Other measurement, recording and measuring instruments

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Time-of-Flight Atomic Scattering Surface Analysis Device "TOFLAS-3000"

Time-of-Flight Atomic Scattering Surface Analysis Device "TOFLAS-3000"

Crystal orientation and polarity are clear in 15 minutes! Stable surface analysis is possible without the influence of charging!

The "TOFLAS-3000" is an atomic scattering surface analysis device that can simultaneously perform crystal structure and elemental analysis of solid surfaces such as metals, semiconductors, and insulators. This device has developed the coaxial direct collision ion scattering spectroscopy (CAICISS) method and uses an atom beam of electrically neutral He (Ne, Ar) as a probing tool, allowing for stable surface analysis without the influence of charging, even on insulators. In crystal surface structure analysis, a unique pattern specific to the crystal surface can be obtained by conducting a full-angle scan of the incident angle, making it visually easy to determine the surface structure. 【Features】 ■ Visualization of crystal orientation, symmetry, and the front and back of polar crystals * Easy distinction of the front and back of crystals with wurtzite structures (such as GaN and AlN) ■ Simple elemental analysis and crystal structure analysis for each layer near the surface * Analysis of ultra-thin films is also possible ■ When synchronized with pole figure simulation, it can be operated as if "seen in person" ■ No issues with orientation determination of insulating samples or organic molecular films ■ High-sensitivity evaluation of impurities through simultaneous measurement with SIMS (complementary to TOF spectra) * For more details, please refer to the PDF document or feel free to contact us. * We also accept analysis requests.

  • Analytical Equipment and Devices
  • Semiconductor inspection/test equipment

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Surface analysis device "Ultra High Vacuum Surface Structure Analysis Device"

Surface analysis device "Ultra High Vacuum Surface Structure Analysis Device"

A surface structure analysis device equipped with an EB evaporator suitable for the fabrication of metal thin films!

The "Ultra High Vacuum Surface Structure Analysis Device" is a surface analysis instrument capable of performing LEED diffraction patterns, Auger analysis, and temperature-programmed desorption analysis for semiconductors and model catalysts. The analyzer is equipped with a LEED/AES mass spectrometer and features an EB evaporator suitable for metal thin film fabrication. Please feel free to contact us if you have any inquiries. 【Specifications】 ■ Surface analysis system: LEED/AES ■ Evaporation source: Ultra high vacuum evaporator "AEV series" ■ Gas source: Hydrogen cracking gun "AEV series" ■ Sample heating: Direct electric heating type (TC contact type sample holder) ■ Sample manipulator: 5-axis operation with X, Y, Z, θ, and in-plane rotation axis, etc. *For more details, please contact us.

  • Analytical Equipment and Devices

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Surface analysis of discolored and altered materials using XPS (ESCA).

Surface analysis of discolored and altered materials using XPS (ESCA).

Measures and avoidance of issues are possible! We will introduce examples verified through elemental and bonding state analysis.

Materials often undergo changes and discoloration depending on the usage environment. These changes and discoloration can lead to issues with the product's performance and design, but by understanding and clarifying the changes in molecular structure through chemical analysis, it becomes possible to address or avoid these problems. This document presents case studies that have been compared and verified through elemental and bonding state analysis via surface analysis. [Contents] ■ Analysis Samples ■ Elemental Analysis Results by XPS (ESCA) ■ Bonding State Analysis Results by XPS (ESCA) for Polycarbonate ■ Bonding State Analysis Results by XPS (ESCA) for Polyvinyl Chloride *For more details, please refer to the PDF document or feel free to contact us.

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