We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Surface Analysis Equipment.
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Surface Analysis Equipment Product List and Ranking from 13 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

Surface Analysis Equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  2. ザ・ブルーボアハウス Tokyo//Industrial Electrical Equipment
  3. シエンタ オミクロン Tokyo//Testing, Analysis and Measurement
  4. 4 東邦化研 Saitama//Electronic Components and Semiconductors
  5. 5 北野精機 Tokyo//Manufacturing and processing contract
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Surface Analysis Equipment Product ranking

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.

  1. Bright Signs Corporation Automatic Surface Analysis Device 5001 Handheld ザ・ブルーボアハウス
  2. Sienta Omicron Surface Analysis Device ESCA シエンタ オミクロン
  3. [Analysis Case] Evaluation of Oxidation State of Cu Surface by XPS 一般財団法人材料科学技術振興財団　MST
  4. 4 Accelerating research and development, [new] surface analysis service launched! 一般財団法人材料科学技術振興財団　MST
  5. 5 [Analysis Case] Evaluation of the sp2/(sp2+sp3) Ratio of DLC Films 一般財団法人材料科学技術振興財団　MST

Surface Analysis Equipment Product List

46～47 item / All 47 items

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[Analysis Case] Wide-area Quantitative Mapping using XPS

[Analysis Case] Wide-area Quantitative Mapping using XPS

It is possible to evaluate the composition distribution in an area of up to 70×70mm.

This is an example of wide-area quantitative mapping using XPS. We evaluated organic residue on silicon wafers using the following procedure. To graph the amount (atomic concentration) rather than peak intensity, it is less affected by sample roughness and allows for data acquisition over a wide area. It is suitable for investigating organic and inorganic contamination, discoloration, surface treatments, etc., as it enables an overview assessment of the compositional distribution on the sample surface.

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  • Contract Analysis
  • Contract measurement

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Accelerating research and development, [new] surface analysis service launched!

Accelerating research and development, [new] surface analysis service launched!

Not only the surface, but also up to a depth of 30nm - Quantitative evaluation of the chemical state at the surface and inside the material at the same location and non-destructively!

We have launched a new service using XPS/HAXPES starting in June! For increasingly complex materials and fine structure samples, we can evaluate the composition and chemical bonding states from the surface to the interior of the material (up to ~30nm) at the same location and in a non-destructive manner. - Depending on the elements of interest and the analysis area and depth, we can select the appropriate X-ray source (Al Kα/Mg Kα/Ga Kα/Cr Kα) to achieve evaluation under suitable measurement conditions. - Non-exposure measurements to the atmosphere, Ar monomer/GCIB sputter etching, and heating pretreatment can be combined. - It is possible to evaluate the electronic states of semiconductor samples using UPS/LEIPS (ionization potential/electron affinity/band gap).

  • Secondary Cells/Batteries

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