Last Updated： Aggregation Period:Oct 22, 2025～Nov 18, 2025
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Oct 22, 2025～Nov 18, 2025
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Oct 22, 2025～Nov 18, 2025
This ranking is based on the number of page views on our site.
16～30 item / All 268 items
The MK series is a compact ESD testing device that supports multi-pin devices.
There are three variations available, allowing for system proposals tailored to user requirements. Each system can conduct ESD testing and latch-up testing (optional) that comply with today's latest standards. It is an ESD testing device that supports up to 256 pins.
Our company conducts environmental testing according to JIS C 60068-2-30 - Temperature and Humidity Cycle Testing, as well as temperature and humidity testing based on customer-specified conditions.
1. Overview of JIS C 60068-2-30 Test: - JIS C 60068-2-30 is a testing method to determine the suitability of test specimens for use, transport, or storage under conditions where condensation occurs on the surface of components, devices, or other products due to repeated temperature changes in a high humidity environment. - For small or low-volume test specimens, this testing procedure may result in less likelihood of condensation on the surface of the test specimen. In such cases, it is advisable to use another testing standard, such as JIS C 60068-2-38. - This test involves conducting one or more temperature and humidity cycles while maintaining a high relative humidity state. ▼ For more details, please download the PDF document (recommended). ▼ Customers in a hurry, please contact us via the 'Contact Us' section below.
Wafer-level and packaged product ESD testing is possible!
The Wafer ESD Tester HED-W5100D is an automatic application/automatic measurement ESD tester that can accommodate wafers up to 300mm. It is equipped with perfect safety features and achieves friendly and user-friendly operability. All test conditions, including the selection of test chips and application positions for the wafer, can be set from the monitor, greatly contributing to improved work efficiency. Additionally, this device can also perform tests on general packaged products. 【Features】 ○ Supports wafers up to 300mm ○ Waveform guarantee with application pins ○ Compatibility with various standard waveforms ○ Image recognition function (optional) For more details, please contact us or download the catalog.
This is a device for measuring the breakdown strength of semiconductor components against electrostatic discharge.
As a sister model to the portable compact ESD tester, we have achieved further improvements in lightweight design, size reduction, and lower cost. Like the conventional compact ESD tester, it maintains basic performance equivalent to general-purpose devices by specializing in 2-pin application (destructive testing through ESD application and leakage measurement). 【Features】 ○ Easy operation with a touch panel ○ Compatible with various standard waveforms ○ Leakage measurement function ○ Function to import measurement data to a PC For more details, please contact us or download the catalog.
First introduction of a large-capacity elevator-type thermal shock device for European automobile manufacturers!
The resistance of the test sample to temperature changes is evaluated by alternately exposing it to high and low temperature environments for short periods. Rapid temperature changes can be repeatedly applied to check for cracks or failures in the test sample. 【Equipment Overview】 ■ Air Chamber Type Thermal Shock Device Automatically switches the airflow into the test area using dampers to continuously apply thermal shock. ■ Humidity Thermal Shock Device A testing device capable of conducting cold and heat cycle tests as well as condensation cycles. ■ Elevating Thermal Shock Device *Newly Introduced The test area has two zones (high temperature and low temperature) that can be moved up and down, allowing for quick attainment of the set temperature and reduction of test time. With internal dimensions of 650x650x650, it has specifications suitable for testing for European automotive manufacturers. ■ Others Also capable of conducting splash water tests.
Testing technologies supporting electrification and connectivity [EMC testing and reliability testing]
■1■ EMC Testing Services for Automotive Components for EV/HV Under Actual Load Conditions 【Standards】CISPR 25:2016 Ed.4 Annex I, ISO 11452-2 Ed.3 Clause 8, GB/T 36262-2018 ● One "EHV Chamber" and one "Reverberation Chamber" at the Aichi Prefecture Miyoshi City Automotive Technology Center ● Two "EHV Chambers" at the Katori City Kashima EMC Testing Laboratory in Chiba Prefecture, in the "Next Generation Mobility Building" ■2■ EMC Testing Services Capable of Supporting Large Equipment Such as Construction Machinery 【Standards】European Standards for Construction Machinery "EN ISO 13766-1, 2:2018" - Mandatory from 2021 ● Anechoic chamber dimensions: Length 18.2m x Width 23.2m x Height 11.0m ● Entrance dimensions: Width 8m x Height 8m ● Load capacity 100t ● Exhaust facilities accommodating large equipment ■3■ Reliability Testing Services Specialized for Automotive Equipment (Environmental Testing, Durability Testing) 【Standards】IEC/ISO International Standards, Environmental Testing Standards of the Japan Automobile Technology Association, Proprietary Standards of Domestic and International Automobile Manufacturers ● Temperature and Humidity ● Cold and Heat Shock ● Splash Water ● Vibration Shock ● Saltwater Corrosion ● Waterproof and Dustproof, etc.
Soft material hardness testing machine
<Examples of Application for Each Measurement Range> - 0-1N, 0-2N Analysis of gel stability of ultra-soft materials such as gelatin and agar. - 0-10N, 0-20N Analysis of hardness increase in gelatin capsules. - 0-50N Analysis of hardness increase in hard gelatin capsules. Additionally, the shape of the measuring probe is available in various forms to match the shape and hardness of the sample.
We provide testing services to evaluate the resistance to ESD (electrostatic discharge), which is important for the reliability of semiconductor products and electronic components that include them.
■ We support products such as IC modules, electronic components, and subsystems with up to 512 pins. ■ We provide testing that complies with major domestic and international standards such as ESDA/JEDEC, JEITA, AEC, and IEC. ■ We propose and conduct tests tailored to our customers' requests and objectives. ■ In the event of any issues with reliability, we assist with failure analysis and problem resolution.
We offer testing services to evaluate the resistance of the Charged Device Model (CDM) to ESD.
■ We will support each standard waveform for JEDEC, JEITA (EIAJ), and AEC through unit replacement. ■ We support both Direct Charge Method (Direct CDM) and Field Induced Method (Field Induced CDM). ■ The contact state confirmation function of the applied pins ensures reliable application. ■ Destruction judgment support is also possible using the diode characteristic judgment method (consultation required).
Supports high temperatures up to 180℃! Effective for testing and evaluating automotive and high-temperature electronic components and other heat-resistant parts.
At AITES Co., Ltd., we conduct "Liquid Tank Thermal Shock Testing." This testing method applies stress due to temperature changes using a liquid medium, and because the temperature changes are more abrupt than those in chamber-type thermal shock tests, it is an effective method for conducting tests in a short period. Our equipment can accommodate a maximum high temperature of up to 180°C, making it suitable for accelerated testing of high-heat-resistant components and materials. 【Features】 ■ Capable of handling maximum temperatures up to 180°C ■ Effective for testing and evaluating high-heat-resistant components ■ More abrupt temperature changes than chamber-type thermal shock tests ■ Effective for conducting tests in a short period *For more details, please refer to the PDF materials or feel free to contact us.
Measuring without variation in all directions, from soft materials to hard materials.
The Echo Chip 3 hardness testing machine is the most precise and functionally rich high-spec model in the Echo Chip series. It can be converted to various hardness scales such as HV, HB, HR, and HS. It can measure everything from soft materials to hard materials without any variation in all directions. 【Features】 ○ Can be converted to any hardness scale (HV, HB, HR, HS) ○ No personal error at all ○ User-defined conversion formulas can be programmed ○ Complies with ASTM and DIN standards For more details, please contact us or download the catalog.
Easy operation with a touchscreen! All-in-one hardness testing solution.
The "equotip550" is an ideal hardness testing machine for on-site testing of heavy large parts or assembled components. By exchanging the impact device, it accommodates a wide range of hardness scales. Furthermore, the compact portable model can be used in various locations, including on-site, in factories, and in laboratories, without restrictions on measurement locations. The use of icons makes touch screen operation even easier, and the user interface features a clear design for smooth operation. 【Features】 ■ High-resolution display ■ Comes with a cover to protect the monitor from scratches and dirt when not in use ■ Testing accuracy of ±0.8μm, with high precision and excellent reproducibility up to ±1.0HRC ■ Capable of incorporating unique conversion curves ■ Usable for thin parts, suitable for pipes and irregular materials For more details, please feel free to contact us.
