We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for X-ray analysis equipment.
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X-ray analysis equipment Product List and Ranking from 24 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

X-ray analysis equipment Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. アワーズテック Osaka//Testing, Analysis and Measurement
  2. null/null
  3. 一般財団法人材料科学技術振興財団　MST Tokyo//Testing, Analysis and Measurement
  4. 4 オガワ精機 Tokyo//Trading company/Wholesale
  5. 5 スペクトリス株式会社 マルバーン・パナリティカル事業部 Hyogo//Testing, Analysis and Measurement
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X-ray analysis equipment Product ranking

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. ARL X900 Wavelength Dispersive X-ray Fluorescence (XRF) Analyzer サーモフィッシャーサイエンティフィック株式会社／Thermo Fisher Scientific K.K.
  2. Fluorescent X-ray measurement device 'X-RAY XDLM 237'
  3. Portable Total Reflection Fluorescence X-ray Analysis Device "OURSTEX200TX" アワーズテック
  4. Bruker Handheld X-ray Fluorescence Analyzer TITAN Series ジャパンマシナリー
  5. X-ray analysis device (for meat) "Meat Master II/Flex"

X-ray analysis equipment Product List

16～30 item / All 99 items

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Example of concrete salt damage investigation and analysis

Example of concrete salt damage investigation and analysis

I will introduce an example of concrete salt damage investigation and analysis.

In recent years, the deterioration of concrete structures due to salt damage caused by airborne salt and the application of anti-freezing agents has become a significant social issue. With the fluorescent X-ray analysis device "OURSTEX101FA" from Awaz Tech, it has become possible to easily and quickly measure the amount of chlorides in concrete on-site for the first time. For more details, please contact us or refer to the catalog.

  • X-ray fluorescence analyzer
  • X-ray inspection equipment
  • Analytical Equipment and Devices

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Analysis of soil, gravel, and crushed stone

Analysis of soil, gravel, and crushed stone

This introduces examples of analysis for soil, gravel, and crushed stone.

The most important aspect of environmental issues is the recycling of waste to reclaim resources, but it is necessary to scientifically analyze the presence of harmful substances at the entry point and assess safety. The fluorescent X-ray analysis device "OURSTEX160" allows for easy on-site analysis of soil, gravel, and crushed stone in quarries and similar locations. For more details, please contact us or refer to the catalog.

  • X-ray fluorescence analyzer
  • Environmental Test Equipment
  • Analytical Equipment and Devices

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Comprehensive catalog of the "OURSTEX" series of X-ray fluorescence analysis devices.

Comprehensive catalog of the "OURSTEX" series of X-ray fluorescence analysis devices.

A wide range of compact, lightweight, and high-performance non-destructive analysis devices are featured! They are ideal for soil contamination surveys, inline analysis, and concrete salt damage investigations.

This is a comprehensive catalog of the fluorescent X-ray analysis device series "OURSTEX," which provides rapid, non-destructive elemental analysis on-site. It is currently used in various fields such as soil analysis, RoHS analysis, and product quality control. Our company is dedicated to creating compact, lightweight, and high-performance devices utilizing X-ray elemental technology. We collaborate with our customers to create products tailored to their needs. [Contents] ■ OURSTEX 100FA … Ideal for portable, on-site analysis ■ OURSTEX 101FA … Ideal for investigating salt damage in concrete ■ OURSTEX 170 … A compact and lightweight analysis device *For more details, please download the PDF or contact us.

  • X-ray fluorescence analyzer

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Energy Dispersive Fluorescence X-ray Analyzer "OURSTEX180"

Energy Dispersive Fluorescence X-ray Analyzer "OURSTEX180"

Gathering our proprietary elemental technologies! Capable of a wide range of high-sensitivity measurements from light elements to medium and heavy elements!

The "OURSTEX180" is an energy-dispersive X-ray fluorescence analyzer equipped with a monochromator dedicated to L lines. It enables a wide range of high-sensitivity measurements, from light elements to medium and heavy element analysis. It is suitable for analyzing S and Cl in oil, light element analysis in cement and incineration ash, trace light element analysis on films, and film thickness analysis. 【Features】 ■ Compact and highly portable ■ Equipped with a double-curved monochromator dedicated to L lines ■ Improved detection sensitivity for light elements through Pd-Lα monochromatic excitation ■ Equipped with a high-performance SDD detector and high counting rate compatible DSP ■ Analysis of medium and heavy elements is also possible with filter functionality *For more details, please refer to the PDF document or feel free to contact us.

  • X-ray fluorescence analyzer
  • Analytical Equipment and Devices
  • others

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Handheld X-ray Fluorescence Analyzer "VoXER"

Handheld X-ray Fluorescence Analyzer "VoXER"

Domestic handheld fluorescent X-ray device! It determines alloys based on the results of component analysis.

"VoXER" is a handheld fluorescent X-ray device suitable for distinguishing between different types of metals. It can analyze without being limited to specific target objects. The X-ray source generates X-rays through friction rather than the conventional X-ray tube method. This product is produced in Japan and has a well-established maintenance system. It can be used with confidence even by those who have trouble with maintenance for overseas products. Please feel free to contact us when you need assistance. 【Features】 ■ Ideal for distinguishing between different types of metals ■ Battery-operated for easy analysis anywhere ■ Generates X-rays through wear instead of conventional X-ray tubes ■ Equipped with an SDD detector *For more details, please refer to the PDF document or feel free to contact us.

  • X-ray fluorescence analyzer

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Portable X-ray Fluorescence Analyzer 'OURSTEX 170IIS'

Portable X-ray Fluorescence Analyzer 'OURSTEX 170IIS'

Equipping window materials with graphene! Improved analysis sensitivity in the light element region compared to conventional Be.

The "OURSTEX 170IIS" is a portable fluorescent X-ray analysis device that serves as the successor model to the "OURSTEX 170" product line. It inherits the portability and sample chamber size from the "170 model," while adopting a new detector system that improves the detection sensitivity for light elements. As a high-precision, easy-to-operate, and compact fluorescent X-ray analysis device, the "170IIS" is designed to better meet the elemental analysis needs in the field. 【Features】 ■ Compact and portable device size ■ Operates on AC100V only, with energy-saving design ■ Eliminates excessive features to achieve a low price ■ Equipped with a new detector system ■ Utilizes a graphene window SDD detector *For more details, please download the PDF or feel free to contact us.

  • X-ray fluorescence analyzer

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Detection of trace elements by EPMA.

Detection of trace elements by EPMA.

Detection sensitivity is excellent! It is particularly superior in quantitative analysis of trace components and map analysis.

EPMA analysis has good energy resolution and detection sensitivity, making it particularly excellent for quantitative analysis of trace components and map analysis. In a case where a defect occurred in the Au-1st bonding within the package, EDX analysis and EPMA analysis were conducted to identify and confirm the distribution of the corrosive substances. Since EPMA has superior resolution, detection limits, and P/B (peak-to-background) ratios compared to EDX, the distribution of trace Cl could be clearly understood. 【Equipment Specifications】 ■ Manufactured by JEOL Ltd. Jeol-8200 ■ Analysis method: Wavelength dispersive X-ray analysis (WDX) ■ Analyzable elements: B to U ■ Energy resolution: 20 eV (EDX is approximately 130 eV) ■ Detection limit: 0.01% and above ■ Maximum sample dimensions: 100×100 mm *For more details, please refer to the PDF document or feel free to contact us.

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  • Analysis Services
  • Contract Analysis

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[Analysis Case] Evaluation of Gold Thin Film Adhesion on Wafer by XRF

[Analysis Case] Evaluation of Gold Thin Film Adhesion on Wafer by XRF

Comparison of the amount of thin film components adhered between samples.

In fluorescent X-ray analysis (XRF), a simple evaluation of elemental distribution is possible. In this case study, we used a deposition device to create films of arbitrary amounts of Au on 4-inch Si wafers A and B as samples, and compared the distribution and total amount of Au. The results of the surface analysis confirmed the distribution state of Au (Figures 1-4). Additionally, by comparing the adhesion amounts based on the Au intensity from the XRF spectra obtained from each pixel, we confirmed that wafer B had more Au than wafer A (Figure 5).

  • Contract Analysis

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[Analysis Case] In-plane film thickness evaluation of Au thin film on wafer using XRF.

[Analysis Case] In-plane film thickness evaluation of Au thin film on wafer using XRF.

Visualization of film thickness distribution through multi-point mapping measurement.

In fluorescent X-ray analysis (XRF), it is possible to easily evaluate element distribution and film thickness. In this case study, we will introduce an example of evaluating the thickness distribution of an Au film on a 4-inch Si wafer through multi-point mapping measurements. By performing multi-point mapping, we can calculate the Au film thickness using the FP (Fundamental Parameter) method from the XRF spectra at each point, allowing for the evaluation of thickness distribution based on the measurement coordinates.

  • Contract Analysis

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Announcement of the Start of Non-Destructive Testing Services from April 2018

Announcement of the Start of Non-Destructive Testing Services from April 2018

We have assembled equipment that is strong in the analysis of organic materials such as resin and carbon composites.

On April 2, 2018, MST will introduce the latest processing and analysis equipment and begin offering non-destructive analysis services. We will provide analysis services across a wide range of fields, including product development and quality control for electronic devices, pharmaceuticals, and food. Non-destructive analysis is a technology that visualizes the internal state of a product without destroying it. Until now, MST has primarily offered contract services based on destructive analysis methods such as electron microscopy and mass spectrometry. However, there has been an increasing customer demand for observing electronic devices without destruction in recent years. Additionally, there has been a growing need in other fields as well, such as confirming the shapes of pharmaceutical and medical device components, observing the distribution of constituent materials within food, and checking for the presence of cavities. With the introduction of the latest processing and analysis equipment, MST is now able to conduct non-destructive analysis. We will provide analysis services on a contract basis.

  • diode
  • Contract measurement
  • Composite Materials

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Observation of structural changes in metallic materials through tensile testing using in situ X-ray CT.

Observation of structural changes in metallic materials through tensile testing using in situ X-ray CT.

Capable of evaluating three-dimensional structural changes according to tensile stress.

In situ X-ray CT measurements allow for internal structure analysis under conditions where a load (tension or compression) is applied to the sample. In this document, in situ X-ray CT measurements were conducted using an aluminum plate as the sample, both in its normal state and in an extended state. We calculated the tensile stress applied to the sample and monitored the internal structural changes under each stress condition. By combining in situ X-ray CT measurements with image analysis technology, it is possible to evaluate under actual usage conditions, which was previously difficult, and assess the impact of stress on the product.

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  • Contract measurement
  • Contract Inspection

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Development in the field of information

Development in the field of information

Development of control and communication for digital products represented by mobile phones, printers, and digital cameras, as well as development of control systems for automobiles and factory automation equipment.

We provide a comprehensive range of services related to IT business, from application development and network and server construction to post-implementation support.

  • Circuit board design and manufacturing

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Fluorescent X-ray Analyzer "X-RAY XAN250/XAN252"

Fluorescent X-ray Analyzer "X-RAY XAN250/XAN252"

Ideal for the analysis of thin films and trace elements! Non-destructive analysis of precious metal composition and plating thickness measurement is possible.

The "FISCHERSCOPE(R) X-RAY XAN(R)250/XAN(R)252" is an energy-dispersive fluorescent X-ray analyzer. It allows for non-destructive composition analysis of precious metals and measurement of plating thickness. It is particularly suitable for the analysis of thin films and trace elements. The XAN250 and XAN252 differ in measurement stage and housing size. The "XAN250" is a fixed stage type, while the "XAN252" is a manual XY stage type with a large safety hood. The main measurement targets include thin film measurements of a few nanometers (related to electronics and semiconductors), analysis of regulated substances (such as Pb in toys), and analyses requiring high precision (jewelry, watches, precious metals), as well as universities and research institutions. 【Features】 - Automatically sets the optimal irradiation area and filter for each measurement specification. - The latest silicon drift detector exhibits high precision and detection capability. - Excellent accuracy and long-term stability, saving time and effort in recalibration. - Fischer's FP method allows for theoretical calculations of film thickness analysis, regardless of solid or liquid. For more details, please contact us or download the catalog.

  • X-ray fluorescence analyzer

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Non-destructive fluorescent X-ray analysis device for 'Material Identification (PMI) Inspection'

Non-destructive fluorescent X-ray analysis device for 'Material Identification (PMI) Inspection'

Attention those troubled by mistakes in selecting welding materials or defects after welding! Free gift: Collection of welding test case studies.

Our company conducts 'PMI inspections' using fluorescent X-ray analysis. You can choose between 'in-house inspections' where you send the inspection materials, or 'on-site inspections' where we dispatch technicians from our company. This method allows for non-destructive checks of welding wires, steel materials, and welding metals, as well as verifying whether the welding materials used were appropriate. It is ideal for preventing contamination, defects, and corrosion in various industries such as metal processing, machinery manufacturing, and piping. ★ We are currently offering a 'Welding Test Case Collection' featuring a wealth of investigation examples! 【Applicable Targets】 ■ Steel materials such as carbon steel, low alloy steel, and stainless steel ■ Ni-based alloys such as Inconel, Hastelloy, and Incoloy ■ Cu alloys such as pure copper, brass, bronze, nickel silver, and Monel ■ Other materials such as Ti alloys and Co-based alloys *For more details, please refer to the catalog. Feel free to contact us with any inquiries.

  • Other inspection equipment and devices
  • X-ray fluorescence analyzer
  • Contract Inspection

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Fluorescent X-ray analysis device 'DPO-2000' [Rental]

Fluorescent X-ray analysis device 'DPO-2000' [Rental]

Capable of detecting time and sensitivity! A handheld fluorescent X-ray analyzer with excellent elemental count.

The fluorescent X-ray analysis device "DELTA Professional DPO-2000" is an excellent handheld fluorescent X-ray analyzer with a superior number of elements that can be detected in response to detection time and sensitivity. It is equipped with X-act Count technology. Its robust design allows for excellent durability, making it suitable for various environments. 【Features】 ■ X-ray tube: 4W, maximum tube current: 200μA, optimized beam settings ■ Achieves excellent detection sensitivity and high measurement throughput ■ Large-diameter SDD suitable for high-sensitivity analysis of various elements ■ Built-in automatic pressure (altitude) compensation function effective for high-sensitivity analysis of light elements ■ Reduces inspection time with fast startup and high count rate measurements * For more details, please refer to the PDF document or feel free to contact us.

  • Rental/lease
  • Analytical Equipment and Devices

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