analysis(fem) - メーカー・企業と製品の一覧

FE-SEM/EDS-Raman analysis

A new proposal that is the first in the industry! A Raman detector has been added to the FE-SEM!

Traditionally, elemental analysis using an EDS detector during FE-SEM observation was common. Our company has transformed the conventional EDS detector into a windowless EDS, allowing for high-sensitivity analysis from Li to U. Additionally, with the inclusion of a Raman detector, it has become possible to obtain information on different compound forms from organic to inorganic.

企業：アサヒテクノリサーチ
価格：Other

Contract measurement

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[Analysis Case] Composite Evaluation of the Active Layer of SiC Power MOSFETs

Evaluate the shape of the active layer and the dopant.

We will introduce a case study evaluating the distribution of the diffusion layer in commercially available SiC power MOSFET devices. In the SiC MOSFET manufacturing process, the channel is formed through ion implantation, activation heat treatment, and epitaxial layer formation. During the active layer formation process, we understood the device structure through TEM observation and evaluated the diffusion layer distribution of the p-type/n-type cross-section and the epitaxial layer from SCM measurements, as well as the depth concentration distribution of dopant elements (N, Al, P) from SIMS measurements. Measurement methods: SIMS, SCM, TEM Product field: Power devices Analysis purpose: Trace concentration evaluation, shape evaluation, product investigation For more details, please download the materials or contact us.

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis

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[Analysis Case] Evaluation of Contact Electrodes for SiC Power MOSFETs

Identification of the interface between contact electrodes and SiC layer, and evaluation of elemental distribution.

We will introduce an analysis case of commercially available SiC power MOSFET devices. In SiC materials, it is essential to control the materials in a system that includes not only Si but also C, which differs from the conventional manufacturing methods of Si semiconductors. In the process of forming ohmic junctions between the contact electrodes and the SiC layer, we evaluated the elemental distribution and crystal phases, including C, using EDX/EELS analysis with TEM and electron diffraction.

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis

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[SIM] Scanning Ion Microscopy Method

Observation of SIM images is possible with high resolution (accelerating voltage 30kV: 4nm).

- SIM imaging observation is possible with high resolution (accelerating voltage 30kV: 4nm). - Compared to SEM images, SIM images provide information about the extreme surface layer. - Observation of metal crystal grains is possible (e.g., Al, Cu). - The resolution is inferior to SEM images (SIM: 4nm, SEM: 0.5nm). ■Features of MST-owned equipment - Compatible with JEIDA standard wafers with a maximum sample size of 300mm in diameter. - Continuous cross-sectional SIM imaging acquisition is possible in combination with FIB (Focused Ion Beam) processing (Slice & View).

企業：一般財団法人材料科学技術振興財団　MST
価格：Other

Contract Analysis
Contract measurement
Contract Inspection

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Comprehensive characterization for the development and manufacturing of safe and highly effective vaccines.

Efficient evaluation of potency, safety, and stability using light scattering detectors and LC-MS.

To quickly deliver safe and highly effective vaccines to the market, thorough characterization analysis is necessary. By using light scattering detectors, a wealth of information can be obtained regarding the vaccine's size, aggregation, stability, interactions, composition, and conformation. By combining MALS (Multi-Angle Light Scattering) and DLS (Dynamic Light Scattering), information about the conformation (shape and structure) of molecules can be derived from the ratio of Rh (hydrodynamic radius) to Rg (radius of gyration). Furthermore, by combining separation techniques such as SEC (Size Exclusion Chromatography) and FFF (Field Flow Fractionation), high-resolution size and molecular weight distribution measurements can be achieved. In LC-MS, peptide mapping allows for the confirmation of primary sequences and monitoring of post-translational modifications. By clicking [Submit], you are deemed to have agreed that Waters will use and process the information provided on this site in accordance with Waters' Terms of Use and Privacy Notice. Terms of Use and Privacy Notice www.waters.com/legalandprivacy

企業：日本ウォーターズ（米国本社 Waters Corporation）　
価格：Other

Other separation and analysis equipment
High Performance Liquid Chromatograph
Chromatography Consumables

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Kenic system's LCD controller

"Easy and Useful" is our policy.

【Features】・Externally, it seems like a dedicated IC. ・therefore, it can quickly support the discontinuance of the LCD or specificaitons change. ・The image frame buffer appears to be SRAM from Host-CPU, therefore software disign is easy. ・「Direct connection to the Host-CPU with 8bit」and there is a complete, one-to-one correlation between the mapping coordinates of the pixels and addresses as seen from the Customer’s CPU. ・Power supply is a 3.3V single power supply.

企業：ケニックシステム東京オフィス
価格：Less than 10,000 yen

controller

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Analysis Service | JTL

We support consistent evaluation from the identification of analysis areas to sample preparation, observation, and analysis, regardless of organic or inorganic materials.

We provide comprehensive support from advanced sample preparation using precision grinding, ion milling, and FIB, to observation and analysis using SEM and EPMA. Additionally, we can perform non-destructive internal structure observation using SAT and X-ray CT. In chemical analysis, we conduct various analyses of target components using FT-IR, ICP, GC, and HPLC.

企業：JAPAN TESTING LABORATORIES
価格：Other

Public Testing/Laboratory
Contract measurement
Other services

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analysis(fem) - メーカー・企業と製品の一覧

analysisの製品一覧

FE-SEM/EDS-Raman analysis

[Analysis Case] Composite Evaluation of the Active Layer of SiC Power MOSFETs

[Analysis Case] Evaluation of Contact Electrodes for SiC Power MOSFETs

[SIM] Scanning Ion Microscopy Method

Comprehensive characterization for the development and manufacturing of safe and highly effective vaccines.

Kenic system's LCD controller

Analysis Service | JTL

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