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analysis(net) - List of Manufacturers, Suppliers, Companies and Products

Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
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analysis Product List

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Secondary battery electrolyte

Secondary battery electrolyte

Secondary battery electrolyte (Korean manufacturer)

I would like to introduce a South Korean secondary battery electrolyte manufacturing company. Company Information and Product Description Company Name: ENCHEM / Headquarters Location: Cheonan / Employees: 830 / Revenue: 510 billion won https://enchem.net Production Facilities: South Korea (Cheonan), China, Poland, United States In-house production of key raw materials (solvents, salts, additives) to establish a stable long-term supply chain High ionic conductivity / High chemical and electrochemical stability / Usable over a wide temperature range / Excellent safety / Price competitiveness

  • power supply

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Nitrosamine analysis service

Nitrosamine analysis service

Can be analyzed with high sensitivity, high precision, and high resolution using LC-HRMS managed in accordance with GMP regulations.

Our company is capable of developing test methods, validation, quantitative testing, or limit testing for nitrosamines analysis using analysis equipment managed in compliance with GMP regulations. Additionally, through our group's overseas laboratories, we can conduct a wide range of screening analyses for various nitrosamines. 【Features】 - High-sensitivity, high-precision, and high-resolution analysis using GMP-compliant LC-HRMS. - A wide range of screening analyses for various nitrosamines available through overseas laboratories. 【Examples of nitrosamines analyzed】 - NDMA: N-Nitrosodimethylamine - NDEA: N-Nitrosodiethylamine - NMBA: N-Nitroso-N-Methyl-4-Aminobutyric Acid - NDBA: N-Nitrosodi-n-butylamine - NEIPA: N-Nitrosoethylisopropylamine - NDIPA: N-Nitrosodiisopropylamine For more detailed information, please refer to the "Related Links."

  • Other analysis and evaluation services

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Kenic system's LCD controller

Kenic system's LCD controller

"Easy and Useful" is our policy.

【Features】 ・Externally, it seems like a dedicated IC. ・therefore, it can quickly support the discontinuance of the LCD or specificaitons change. ・The image frame buffer appears to be SRAM from Host-CPU, therefore software disign is easy. ・「Direct connection to the Host-CPU with 8bit」and there is a complete, one-to-one correlation between the mapping coordinates of the pixels and addresses as seen from the Customer’s CPU. ・Power supply is a 3.3V single power supply.

  • controller

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[Analysis Case] Evaluation of the Diffusion Layer of SiCMOSFET Using SCM and SMM

[Analysis Case] Evaluation of the Diffusion Layer of SiCMOSFET Using SCM and SMM

You can evaluate the p/n polarity and carrier concentration distribution of the SiC device's diffusion layer.

A cross-section of the SiC Planer Power MOSFET was fabricated, and the p/n polarity distribution of the diffusion layer was evaluated using SCM (Scanning Capacitance Microscopy), while the carrier concentration distribution was qualitatively assessed using SMM (Scanning Microwave Microscopy). From both sets of data, it was found that a p-type Body layer is formed in a two-layer structure around the n+ type Source layer, and that a Channel Epitaxial layer exists directly beneath the gate. At the edge of the Channel Epitaxial layer, a partial decrease in concentration was observed in the Source layer.

  • Contract Analysis

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Cutting-edge thermal analysis services [Strongly supporting research and development!]

Cutting-edge thermal analysis services [Strongly supporting research and development!]

We strongly support research and development with cutting-edge thermal analysis services! We are a world-class manufacturer of thermal analysis and thermal property equipment!

As the development of new substances and materials becomes more diverse and advanced, there is a challenge that traditional analysis methods alone cannot overcome the current situation. This is where "thermal analysis" brings new insights. NETZSCH, as a world-class manufacturer of thermal analysis and thermal property equipment, strongly supports your research and development by providing cutting-edge solutions. 【What can be understood with thermal analysis equipment】 ■ Melting glass transition ■ Thermal conductivity ■ Expansion rate ■ Elastic modulus ■ Thermal decomposition gas analysis *For details, please request materials or view the PDF data from the download.

  • Analytical Equipment and Devices
  • Thermo-fluid analysis

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Differential Scanning Calorimeter 'Setline DSC/DSC+'

Differential Scanning Calorimeter 'Setline DSC/DSC+'

Various measurements can be efficiently conducted! Easily and affordably replaceable sensors.

The "Setline DSC/DSC+" is a differential scanning calorimeter manufactured by Setaram Instrumentation. It employs a simple structured plate-type DSC sensor. Due to its rod-type sensor structure, which can be replaced by the user, it significantly reduces repair time and costs in case of sensor failure. 【Features】 ■ Utilizes a simple structured plate-type DSC sensor ■ Significantly reduces repair time and costs in case of sensor failure ■ Rapid heating and cooling rates ■ Efficiently conducts various measurements *For more details, please refer to the PDF document or feel free to contact us.

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  • Other measurement, recording and measuring instruments

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Input compensation type double furnace DSC 8000

Input compensation type double furnace DSC 8000

Achieve excellent program temperature tracking! Wavelet Analysis further reduces noise.

The "Input Compensation Type Double Furnace DSC 8000" is a differential scanning calorimeter that achieves excellent program temperature tracking with a low-mass furnace. It features a built-in mass flow controller, allowing for automatic switching between two gas lines. With a stable baseline provided by SmartScan, Wavelet Analysis further reduces noise. 【Features】 ■ Low-mass furnace achieves excellent program temperature tracking ■ Stable baseline with SmartScan ■ Wavelet Analysis further reduces noise ■ Automatic switching between two gas lines (built-in mass flow controller) ■ Auto sampler with automatic diagnostic function (optional) *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • others

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Ion contamination analysis device

Ion contamination analysis device

The degree of contamination caused by ionic impurities in the air that occurs on electronic components is evaluated by measuring the amount of ions in the cleaning solution.

- The compounds in the solution are diverse, so we assume the ion species to be NaCl according to the standards and convert it to NaCl / cm². - The contamination level can be measured using the static method. - The measurement accuracy of the device is high, capable of measuring down to 0.0001 µS/cm level. - Simultaneously cleaning the parts and recycling the cleaning solution with an ion resin filter minimizes environmental pollution. - It complies with the following international standards: - Mil-P-28809 and Mil-STD-2000A (USA) - Defense Standard 10/03 (UK) - IPC-TR-583 - We offer three different cleaning tank capacities: 0.4L, 8L, and 40L. - It has a highly durable and easy-to-maintain structure.

  • Other measurement, recording and measuring instruments

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Technical Information Magazine 201903-01 Cutting-edge SIMS Analysis Equipment

Technical Information Magazine 201903-01 Cutting-edge SIMS Analysis Equipment

The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control.

**Abstract** The state-of-the-art secondary ion mass spectrometry (SIMS) device, NanoSIMS 50L, enables imaging measurements with spatial resolution approximately two orders of magnitude higher than conventional SIMS, thanks to its ion beam with a probe diameter of about 50 nm and a highly efficient mass analysis system. This paper introduces the features of the NanoSIMS 50L device and analysis examples. **Table of Contents** 1. Introduction 2. Overview of the Analytical Device 3. Analysis Example of Hair Cross-Section 4. Analysis Example of SiC Semiconductor Devices 5. Conclusion

  • Contract Analysis
  • Contract measurement
  • Technical and Reference Books

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