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analysis(se) - List of Manufacturers, Suppliers, Companies and Products

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
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analysis Product List

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Japan MarTech Nagoya Lab's analytical equipment

Japan MarTech Nagoya Lab's analytical equipment

We are introducing the machines used in our contract analysis service for materials and structures!

We would like to introduce the analytical equipment held by the Nagoya Lab of Japan MarTech. We offer services in material analysis and structural analysis, supported by 4 FIBs and 4 TEMs. We conduct contract analysis services using equipment such as FIB-G4, FIB-NOVA, TEM-Talos, and Glovebox. Please feel free to contact us for more details. 【Equipment Available】 ■FIB-G4×2 (1 unit with EDX) ■FIB-G5×1 (added and operational since March 2022) ■FIB-NOVA×1 (with Cryo Stage) ■TEM-Talos×2 (with EDX) (1 unit added and operational since April 2022) ■TEM-Titan×1 (with EDX and EELS) ■TEM-NEOARM×1 (with Cs-STEM, EELS, and EDX) ■Glovebox×1 (designed for non-atmospheric exposure) *For more details, please refer to the PDF document or feel free to contact us.

  • Other Analysis

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[Analysis Case] Evaluation of Resistance Values and Li Distribution in Secondary Battery Cathodes

[Analysis Case] Evaluation of Resistance Values and Li Distribution in Secondary Battery Cathodes

Distribution of resistance values in the electrode cross-section, visualization of conduction paths, and comparison with ion distribution.

The charge and discharge characteristics of lithium-ion secondary batteries are influenced by electronic conductivity. I will introduce a case where the decreased conductivity of active materials, due to degradation or blockage of conduction paths, was visualized as a resistance value distribution using SSRM. By comparing the results obtained from SSRM with the elemental distribution of Li and other elements measured by TOF-SIMS, it is possible to confirm the correlation between resistance values and elemental distribution. Additionally, it is feasible to classify conductive additives and binders based on resistance values, perform statistical processing, and quantify the mixing degree for each material.

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  • Contract Analysis
  • Contract measurement

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Resin, plastic materials, polymer structure analysis, additive analysis.

Resin, plastic materials, polymer structure analysis, additive analysis.

We propose optimal analysis designs utilizing high-precision analytical techniques and extensive experience!

We would like to introduce our services related to "Polymer Structure Analysis and Additive Analysis." We conduct composition and structure analysis using techniques such as infrared spectroscopy (IR) and NMR, as well as additive analysis utilizing various chromatography methods. Please feel free to contact us when you need our services. 【Service Details】 ■ Evaluation of the polydispersity (molecular weight distribution and composition distribution) of polymers using SEC (GPC) with multiple detectors (RI, UV, PDA, etc.) ■ Composition and structure analysis using infrared spectroscopy (IR) and NMR ■ Component analysis using separation and purification techniques for polymer materials (gel fraction, etc.) ■ Additive analysis utilizing various chromatography methods *For more details, please refer to the related links or feel free to contact us.

  • Structural Analysis

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Cross-sectional processing using the ion polish method.

Cross-sectional processing using the ion polish method.

A method for removing the surface of a sample by utilizing the sputtering phenomenon, where sample atoms are ejected from the sample surface.

The IP method utilizes the sputtering phenomenon, where sample atoms are ejected from the sample surface when an ion beam with aligned energy and direction is irradiated onto the sample. It is also referred to as the CP method (Cross-section Polish). The ion species used is typically a noble gas (Ar in MST) that does not pose concerns for chemical reactions with the sample. In the AES analysis of the processed surface, the components of the shielding plate (Ni, P) were below the detection limit. ■Features - Wide-area cross-section processing is possible (approximately 500μm to 1mm) - No impact from mechanical polishing damage - Minimal surface contamination - Non-exposure to the atmosphere, cooling processing is possible

  • Contract Analysis
  • Contract measurement

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Cross-sectional observation of automotive bumper paint film.

Cross-sectional observation of automotive bumper paint film.

It is possible to confirm the cross-sectional structure and elemental distribution without damaging fine structures such as grain separation!

We would like to introduce our "Cross-sectional Observation of Automotive Bumper Coating Films." The coating film of automotive bumpers has a multi-layer structure using several types of paint. In general mechanical polishing for cross-sectional observation, issues such as the detachment of added fine particles occur, making it difficult to confirm the correct structure. By using the ion milling method (Ar+ ion beam) for processing, we can observe the cross-sectional structure and elemental distribution without damaging the fine structures such as detachment. 【Features】 ■ SEM observation allows for clear confirmation of the multi-layer structure of the coating film and the added fine particles. ■ By combining elemental analysis, we can clearly confirm the distribution of each added particle. *For more details, please download the PDF or feel free to contact us.

  • Contract Analysis

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Observation of CMOS image sensor cross-section by mechanical polishing.

Observation of CMOS image sensor cross-section by mechanical polishing.

Due to the advantages and disadvantages, it is necessary to choose according to the sample form, observation range, purpose, etc.!

At our company, we created a cross-section of the CMOS image sensor component associated with VR goggles manufactured by Company A through mechanical polishing while keeping the component in its original state, and we conducted structural observations of the CMOS sensor component. During the observation of the sensor component structure and sensor surface, we removed the glass filter and observed the surface of the CMOS sensor, where it was noted that the arrangement of the color filters was in a configuration known as a Bayer filter. In addition to mechanical polishing, methods for creating cross-sections include processing with ion beams such as FIB and CP, as well as microtome methods. Consultations are free, so please feel free to contact us if you are unsure about the method for creating cross-sections. [Overview] ■ Observation of sensor component structure and sensor surface ■ Cross-section creation by mechanical polishing ■ SEM observation of the sensor chip surface layer *For more details, please download the PDF or feel free to contact us.

  • Other analysis and evaluation services

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Strengthening the purchase of plastic pallets.

Strengthening the purchase of plastic pallets.

Plastic pallets that are damaged and unusable, with some dirt and sticker residue, are currently being purchased with a focus on collection.

Our company is actively engaged in the "material recycling" business, where we purchase resin emitted by our customers and turn it into new recycled materials. Through our unique know-how and systems, as well as our nationwide network and sales routes, we achieve reliable and stable collection and acquisition. We have earned high credibility and trust from our customers.

  • plastic

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K-kit: A Tool for Observing Liquid Samples under an Electron Microscope

K-kit: A Tool for Observing Liquid Samples under an Electron Microscope

You can evaluate the properties of nanomaterials, strong aggregates, and weak aggregates (NOAAs) in liquids!

The "K-kit" is a single-use, sealable carrier equipped with microchannels inside. It is designed to facilitate the observation of liquid samples in TEM and SEM, allowing for the characterization of nanomaterials, strong aggregates, and weak aggregates (NOAAs) in liquid. It is suitable for the analysis of nanoparticles and their aggregates and clusters across various industries, including electronics, cosmetics, food, and biomedical. 【Features】 ■ High versatility ■ Reliability of materials and structure ■ High-quality TEM images ■ Sample preparation methods: wet method and dry method *For more details, please refer to the PDF document or feel free to contact us.

  • Other Analysis

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Application of EBSD analysis to non-ferrous metal materials (with measurement examples)

Application of EBSD analysis to non-ferrous metal materials (with measurement examples)

Optimizing the pretreatment method using our unique technology! Enables observation and analysis of heterogeneous multilayers.

Our company has extensive experience and knowledge in EBSD analysis for steel and magnetic materials. EBSD analysis of non-ferrous metals presents different challenges compared to steel and magnetic materials, but by utilizing our unique technology and optimizing the pretreatment methods, we are able to conduct EBSD analysis on various metals. We are capable of observing and analyzing heterogeneous multilayers (especially heterogeneous boundary layers), as well as single materials. 【Main Information Obtained from EBSD Analysis】 ■ Crystal orientation (IPF map, pole figure, Schmid Factor map) ■ Crystal phase (Phase map) ■ Strain (KAM map, GROD map, GAM map, GOS map) ■ Grain size *For more details, please refer to the related links or feel free to contact us.

  • Contract Analysis
  • Contract measurement

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[Contract Analysis] Amino Acid Composition Analysis and Chiral (DL) Analysis

[Contract Analysis] Amino Acid Composition Analysis and Chiral (DL) Analysis

It is possible to quantify the absolute amount of amino acids contained.

The Enantiomer Labeling Method (ELAB) allows for the quantification of the absolute amounts of contained amino acids. The analysis is conducted twice, with the second analysis performed alongside standard amino acids. The provided data represents the DL analysis values after hydrolysis. However, the values also include a small amount of racemization that occurs during hydrolysis. The Enantiomer Labeling Method (ELAB) is a method that can accurately quantify amino acids such as Ser, Thr, Trp, and Tyr in peptides and proteins. The notes in the price list indicate the ideal conditions for obtaining more accurate values.

  • Other contract services
  • Ingredient analysis

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Differential Scanning Calorimeter (DSC) [Setaram Instrumentation]

Differential Scanning Calorimeter (DSC) [Setaram Instrumentation]

High-sensitivity measurement of thermal energy and weight changes is possible with a unique 3D sensor.

The CALVET PRO, a DSC designed with SETARAM's unique 3D sensor, achieves the operability of a general-purpose DSC and high-sensitivity measurements with a large sample container. By simply exchanging the sample container, it allows for high-pressure DSC measurements up to 50 MPa (600°C), and by adding a suspended balance (optional), it enables simultaneous high-sensitivity measurements of heat flow and weight changes as a TG/DSC. Additionally, the CALVET PRO DSC can be equipped with an optional robotic sample exchange mechanism (48 samples), enabling unmanned operation.

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  • Analytical Equipment and Devices
  • Other physicochemical equipment

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Analysis and Evaluation Service "Automotive Interior Material Evaluation"

Analysis and Evaluation Service "Automotive Interior Material Evaluation"

To transportation-related companies! We will conduct testing and evaluation of automotive interior materials.

At Lake West Test Lab LLC, we conduct testing and evaluation of automotive interior materials for various domestic automobile manufacturers. In order to carry out these tests, we kindly ask manufacturers to provide their unique testing standards and methods. We also conduct various tests on interior fabric products, not limited to automotive interior materials. 【Types of Tests】 - Glass Haze Test, Fogging Test - Various Weather Resistance and Light Resistance Tests - Combustibility Test For more details, please contact us or download the catalog.

  • Contract Inspection
  • Public Testing/Laboratory

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[Business Introduction] Sales of power semiconductors manufactured by Dynex in the UK.

[Business Introduction] Sales of power semiconductors manufactured by Dynex in the UK.

Introducing Dynex Semiconductor Ltd, a power semiconductor manufacturer from the UK.

We are engaged in the sale of power semiconductors manufactured by Dynex in the UK. Dynex is a power semiconductor manufacturer headquartered in Lincoln, UK. They provide a complete production process from chip manufacturing to assembly and testing. They handle bipolar products such as diodes, FRDs, thyristors, and GTOs, as well as IGBTs and power semiconductor stacks. 【Main Products】 ■ IGBT Modules ■ FRD Modules ■ General Rectifier Flat Thyristors ■ GTO Thyristors (Flat) ■ Symmetrical Bypass Thyristors (Flat) For bipolar products like thyristors, diodes, and GTOs, they offer a product lineup that covers high power up to 11,000A in current and 8,500V in voltage. IGBT and FRD modules are produced in-house from silicon wafers to packaging, with a lineup of high-voltage classes up to 6,500V. *For more details, please feel free to contact us.

  • Other semiconductors
  • diode

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[Case Study] Quantification of Surface Morphology of ZnO Thin Film with Double Texture

[Case Study] Quantification of Surface Morphology of ZnO Thin Film with Double Texture

The introduction of the shape analysis system "ShapeAnalyzer" automates shape analysis that was previously done by hand! It contributes to cost reduction, time savings, and increased efficiency.

The photograph shows a cluster of small pyramid shapes forming a large dumpling-like shape (double texture). The standard version of ShapeAnalyzer analyzes the internal small pyramid shapes, so we have customized it to achieve automatic quantification of the outer large dumpling shape. (Image provided by Tokyo Institute of Technology, Konagai-Miyajima Laboratory & Yamada Laboratory) 【Shape Analysis System ShapeAnalyzer】 Analyzes specific shapes from images such as scanning electron microscope (SEM) images and displays histograms and statistical values. 1. Drag the image into the software, and 2. click a key on the keyboard. In just two steps, a tedious task that researchers used to take hours to complete can be done in just a few seconds. The analysis can be performed almost automatically, eliminating individual variability in analysis. *For more details, please contact us.

  • others

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