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Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
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analysis Product List

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[Analysis Case] Evaluation of Cleansing Oil's Cleaning Effectiveness

[Analysis Case] Evaluation of Cleansing Oil's Cleaning Effectiveness

Measurement examples of cleaning residues using TOF-SIMS.

The way makeup is removed varies depending on the type of cleansing oil, even with the same washing method. To investigate the cleansing effect, we evaluated the remaining components after washing lipstick with oil using TOF-SIMS. This report introduces a case where the differences in cleansing effects due to the type of cleansing oil were assessed by conducting relative comparisons of the components of the lipstick (such as pigments and oils) between samples.

  • Contract Analysis

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[Analysis Case] Evaluation of Composition Distribution of Capsule-type Drugs

[Analysis Case] Evaluation of Composition Distribution of Capsule-type Drugs

Imaging evaluation is possible from the overall view to local distribution.

TOF-SIMS allows mass imaging analysis of samples ranging from micrometers to centimeters in size. We conducted mass imaging analysis using TOF-SIMS on the cross-section of a capsule-type drug. We performed cross-section processing and present imaging examples focusing on the entire drug (approximately 7mm x 20mm) and a single granule inside it (approximately 500μm in diameter).

  • Contract Analysis

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[Analysis Case] Evaluation of Surface Deterioration of Polycarbonate

[Analysis Case] Evaluation of Surface Deterioration of Polycarbonate

Structural analysis of resin surface degradation using TOF-SIMS.

Polycarbonate (PC) is a type of thermoplastic that has excellent transparency, impact resistance, and heat resistance. It has been reported that degradation occurs due to hydrolysis, leading to the generation of the raw material bisphenol A (BPA). Particularly in solar panels, it is important to understand how the surface of the material changes under UV (ultraviolet) irradiation. Below, we present a case study that evaluated the degree of degradation of the PC surface due to UV irradiation using TOF-SIMS.

  • Contract Analysis

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Continuous Flow Analysis System (CFA) "MiSSion"

Continuous Flow Analysis System (CFA) "MiSSion"

Compatible with halogen and LED light sources! Vertical 2-channel system of the auto analyzer series.

We have newly released the continuous flow analysis device "MiSSion." It is a vertical two-channel system from the auto-analyzer series. The measurement principle is based on the flow analysis device using the absorbance method, specifically the bubble segmentation "CFA" method. The auto-analyzer series offers over 1,000 analytical methods for chemical analysis in fields such as environment, agriculture, fisheries, and chemistry, and is widely used in many analytical institutions. 【Features】 ■ Supports ultra-low concentration measurements ■ Can be equipped with halogen and LED light sources ■ Excellent maintenance capabilities ■ Temperature control function for the detector ■ New software *For more details, please refer to the PDF document or feel free to contact us.

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  • Analytical Equipment and Devices
  • Logic Analyzer

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[Analysis Case] Evaluation of Resistance Values and Li Distribution in Secondary Battery Cathodes

[Analysis Case] Evaluation of Resistance Values and Li Distribution in Secondary Battery Cathodes

Distribution of resistance values in the electrode cross-section, visualization of conduction paths, and comparison with ion distribution.

The charge and discharge characteristics of lithium-ion secondary batteries are influenced by electronic conductivity. I will introduce a case where the decreased conductivity of active materials, due to degradation or blockage of conduction paths, was visualized as a resistance value distribution using SSRM. By comparing the results obtained from SSRM with the elemental distribution of Li and other elements measured by TOF-SIMS, it is possible to confirm the correlation between resistance values and elemental distribution. Additionally, it is feasible to classify conductive additives and binders based on resistance values, perform statistical processing, and quantify the mixing degree for each material.

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  • Contract Analysis
  • Contract measurement

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[Analysis Case] Depth Profile Analysis of Impurities in Organic EL Devices Using SIMS

[Analysis Case] Depth Profile Analysis of Impurities in Organic EL Devices Using SIMS

Evaluate organic EL elements with good depth direction resolution.

To extend the lifespan of organic EL devices, it is essential to evaluate the degradation caused by electromigration, making it important to investigate the diffusion state of electrode metal components into the organic layer. However, whether analyzed directly from the cathode side or through the SSDP method from the anode side, the depth resolution decreases, making it difficult to assess the diffusion from the interface into the organic layer. (Note: SSDP method refers to analysis from the backside. For details on the analytical method, see section B0013.) Therefore, by using special processing to expose the cathode/organic layer interface and the organic layer/anode interface, it has become possible to evaluate the organic layer with high depth resolution.

  • Contract Analysis

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[Analysis Case] Measurement of Partial Density of States of GaN

[Analysis Case] Measurement of Partial Density of States of GaN

Information about valence bands and gap states can be obtained by element.

Soft X-ray emission spectroscopy (SXES) using synchrotron radiation is widely used as a method to evaluate the electronic states of materials, as it allows for the direct acquisition of the partial density of states (pDOS) near the Fermi level for each element constituting the material. Furthermore, the characteristics of this method include: 1. Information from the bulk can be obtained. 2. It can be evaluated without being affected by charging effects, even for insulators. 3. The detection limit is low (<1 atomic%). These features make it particularly effective for evaluating materials containing light elements (such as B, C, N, O). In this document, we will introduce the SXES spectrum of a GaN substrate as a measurement example.

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  • Contract Analysis
  • Contract measurement

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Inorganic element analysis

Inorganic element analysis

From major components to trace elements! We specialize in dissolving and analyzing various substances.

We would like to introduce TTC's "Inorganic Element Analysis." Using our extensive know-how, we can analyze various materials and products through ICP-MS and ICP-OES, from major components to trace elements. We will propose suitable analytical methods tailored to your needs. For past analysis cases and applications, please visit our website. 【Features】 ■ Analysis by dissolving various substances ■ Support for major components to trace elements ■ Extensive know-how ■ Capable of analyzing various materials and products using ICP-MS and ICP-OES ■ Proposing suitable analytical methods according to customer requests *For more details, please refer to the PDF materials or feel free to contact us.

  • Analytical Equipment and Devices
  • Other contract services

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Input compensation type double furnace DSC 8000

Input compensation type double furnace DSC 8000

Achieve excellent program temperature tracking! Wavelet Analysis further reduces noise.

The "Input Compensation Type Double Furnace DSC 8000" is a differential scanning calorimeter that achieves excellent program temperature tracking with a low-mass furnace. It features a built-in mass flow controller, allowing for automatic switching between two gas lines. With a stable baseline provided by SmartScan, Wavelet Analysis further reduces noise. 【Features】 ■ Low-mass furnace achieves excellent program temperature tracking ■ Stable baseline with SmartScan ■ Wavelet Analysis further reduces noise ■ Automatic switching between two gas lines (built-in mass flow controller) ■ Auto sampler with automatic diagnostic function (optional) *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • others

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[Analysis Case] Depth Direction Analysis of Thin Carbon Films

[Analysis Case] Depth Direction Analysis of Thin Carbon Films

Depth-direction analysis of diamond-like carbon (DLC) and graphene is possible.

TOF-SIMS allows for the acquisition of mass spectra in the depth direction, enabling the analysis of components in very thin layers through qualitative assessment of each layer. In this case, we analyzed a hard disk in the depth direction. As a result, it was found that the diamond-like carbon (DLC) layer formed on the surface has a two-layer structure, with a nitrogen-containing C layer on the surface side and a layer consisting solely of C on the deeper side. This method can also be applied to the depth analysis of graphene films. Measurement method: TOF-SIMS Product fields: Electronic components, manufacturing equipment, parts Analysis objectives: Composition evaluation, identification, composition distribution evaluation For more details, please download the materials or contact us.

  • Contract Analysis

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Evaluation of organic substances at the metal interface causing delamination.

Evaluation of organic substances at the metal interface causing delamination.

TOF-SIMS can evaluate organic substances at metal interfaces in the depth direction.

Organic substances at metal interfaces can cause poor adhesion and delamination. For analyzing this poor adhesion, physically peeling off the layers and conducting qualitative analysis on the peeled surfaces is effective (refer to analysis case C0198). On the other hand, there are many cases where peeling cannot be performed, and in such cases, using a sputtering ion source for depth analysis is effective. This document presents a case of qualitative analysis of organic substances at metal interfaces, either in thin films or as secondary contamination, in the depth direction. As a conclusion, the presence of organic substances was confirmed by detecting C-series ions. Additionally, it is sometimes possible to identify organic substances by comparing them with known standard samples.

  • Ingredient analysis
  • Other analysis and evaluation services

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[Analysis Case] Mechanical Property Evaluation Simulation Using Molecular Dynamics Calculations

[Analysis Case] Mechanical Property Evaluation Simulation Using Molecular Dynamics Calculations

It is possible to analyze the deformation behavior of nanomaterials in response to environmental changes (pressure and temperature).

Carbon nanotubes (CNTs) are lightweight and possess excellent mechanical properties (high strength and high elasticity), making them suitable for various applications and environments. In particular, the deformation behavior of CNTs is related to flexibility and energy absorption characteristics, which are important in sensor and nano-device design. This document presents a case study that simulates the bending and recovery deformation of single-walled CNTs using molecular dynamics calculations. The simulation allows for the observation of structural changes at the atomic level due to environmental changes (pressure and temperature), enabling the analysis of deformation behavior based on the changes in strain energy associated with these structural changes.

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  • Contract Analysis

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Disassembly investigation of the GoPro HERO4

Disassembly investigation of the GoPro HERO4

Tear down of the GoPro Hero4 used for outdoor activities.

The GoPro, widely used outdoors, introduces a new world with the HERO4, adding next-generation image quality and new features. We provide a product report listing all components and costs, both external and internal, for the HERO4 Black, which is capable of high-resolution 4K level video recording, 2.7K at 50fps, and high frame rate 1080p at 120fps.

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  • Color camera

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Certified single-element and mixed standard solutions for ICP-AES/ICP-MS wet analysis.

Certified single-element and mixed standard solutions for ICP-AES/ICP-MS wet analysis.

Catalog renewal! NIST traceable. Obtained various certifications from the U.S. accreditation body A2LA. International mutual certification available, with issuance of certificates equivalent to JCSS!

■To all analysis laboratories searching for standard materials and standard samples We would like to introduce our proudly developed analytical standard material, "Standard Solutions for ICP-AES/ICP-MS," to those who pursue accuracy and efficiency in analysis. This product, which has been updated in our catalog, has obtained NIST-traceable certification from the U.S. accreditation body A2LA, and is equipped with international certifications ISO 17025 and ISO 17034, allowing for the issuance of certificates equivalent to JCSS. With reliable international mutual recognition (ILAC MRA), we guarantee quality that meets global standards. ■SPEX certified standard solutions covering all 70 elements The SPEX certified standard solutions we handle cover all 70 elements, enabling precise and highly reliable analysis. Additionally, we offer original mixed solutions tailored to domestic demand. ■Maximizing analysis efficiency with standard solutions By using mixed standard solutions, we reduce analysis time and minimize discrepancies among analysts, thereby enhancing operational efficiency and accuracy. We can also produce custom products tailored to user preferences. At Seishin Shoji, we are committed to developing original mixed solutions that meet all needs. Keywords: ICP emission, emission spectroscopy, mass spectrometry, qualitative analysis, wet analysis

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  • others

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Strong support for research and development: "Contract Analysis Services"

Strong support for research and development: "Contract Analysis Services"

We will conduct contract analysis of materials and products entrusted to us by our customers. We will handle everything from pre-treatment to measurement and provide analysis data.

MST offers various materials and research contract analysis, contract evaluation, and contract assessment services. Our knowledgeable sales representatives will propose the optimal analysis plan! With assured quality and reliable support, we leave no questions unanswered for our customers. We broadly accommodate contract analysis and contract evaluation in the electronics field, including semiconductors, metals, and batteries, as well as in the life sciences field, including pharmaceuticals, cosmetics, and food. - We accept inquiries regarding analysis methods. - Please feel free to contact us for a cost estimate for analysis. - Inquiries and applications regarding analysis are accepted via phone or contact form. 【Examples of Contract Analysis Data】 ○ TEM Analysis: Observation at the atomic level ○ SIMS Analysis: Evaluation of impurity concentration ○ XRD Analysis: Identification of crystals using X-rays For more details, please download the catalog or contact us.

  • Contract Analysis
  • Contract measurement
  • Contract Inspection

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