analysis(si) - List of Manufacturers, Suppliers, Companies and Products

[Analysis Case] Evaluation of Gate Oxide Film on SiC Substrate

Evaluate film thickness, density, and bonding state.

SiC power devices are expected to reduce power loss and handle large power in a compact form as power conversion elements. We will introduce a case where the thickness and density of the gate oxide film, necessary for improving the characteristics of the device, were evaluated using XRR (X-ray reflectivity) and the bonding state was assessed using XPS (X-ray photoelectron spectroscopy).

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

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[Analysis Case] Evaluation of the Diffusion Layer of SiCMOSFET Using SCM and SMM

You can evaluate the p/n polarity and carrier concentration distribution of the SiC device's diffusion layer.

A cross-section of the SiC Planer Power MOSFET was fabricated, and the p/n polarity distribution of the diffusion layer was evaluated using SCM (Scanning Capacitance Microscopy), while the carrier concentration distribution was qualitatively assessed using SMM (Scanning Microwave Microscopy). From both sets of data, it was found that a p-type Body layer is formed in a two-layer structure around the n+ type Source layer, and that a Channel Epitaxial layer exists directly beneath the gate. At the edge of the Channel Epitaxial layer, a partial decrease in concentration was observed in the Source layer.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

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[Analysis Case] Breakdown Observation of 600V Rated SiC Diode

Consistent analysis from preprocessing to luminescence location identification.

By using a high-voltage power supply (capable of applying up to 2000V), it is possible to induce breakdown in diodes with high breakdown voltage. In this case, a SiC Schottky diode with a breakdown voltage of 600V was operated, and by applying high voltage in the reverse direction, breakdown was induced. After removing the cathode electrode through polishing, emission microscopy observations were conducted to identify the location of the breakdown current generation. Commercially available products were used for the measurements.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis

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[FIB] Focused Ion Beam Processing

FIB refers to a focused ion beam with a diameter ranging from a few nanometers to several hundred nanometers, which can be used to scan the sample surface to etch or deposit material in specific areas.

FIB refers to a focused ion beam with diameters ranging from several nanometers to several hundred nanometers, which can be used to etch specific areas (sputtering) or deposit materials such as carbon (C), tungsten (W), and platinum (Pt) onto specific regions by scanning the sample surface. Additionally, the shape of the processed sample can be recognized through SIM images, which detect secondary electrons generated by irradiating the sample with the ion beam. - Arbitrary shape processing through etching in micro-regions (several nanometers to several tens of micrometers) is possible (typical processing size: around 20 μm) - Sample preparation for SEM, SEM-STEM, and TEM imaging (cross-sections of specific areas can be produced) - Fine pattern deposition and thin film formation (C, W, Pt deposition) are possible in the range of several micrometers to several tens of micrometers - High-resolution SIM (Scanning Ion Microscope) imaging is possible (acceleration voltage 30 kV: 4 nm) - Observation of metal crystal grains (Al, Cu, etc.) is possible with SIM images.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

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Contract measurement
Contract Inspection

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[Analysis Case] Measurement of Impurity Concentration on the Surface and Inside of SiC Substrates

Analysis of the substrate surface and interior is separated using ICP-MS and GDMS.

Impurities contained in semiconductor materials can affect product quality, leading to issues such as leakage current and early device failure. Therefore, understanding the amount of impurities in the materials is crucial for improving product quality. This document presents a case study on SiC substrates, which are gaining attention as power device materials, analyzing impurities adhered to the substrate surface using ICP-MS and impurities within the substrate using GDMS. Measurement methods: ICP-MS, GDMS Product fields: Power devices, manufacturing equipment, components Analysis purpose: Trace concentration evaluation For more details, please download the document or contact us.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
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[Analysis Case] Depth Profile Concentration Analysis of Mg in Deep Ultraviolet LEDs

Quantification of impurities in AlGaN with various Al compositions is possible.

To determine impurity concentrations using SIMS analysis, it is necessary to use a standard sample with the same composition as the analysis sample. By preparing various Al compositions of AlGaN standard samples for AlGaN used in ultraviolet LEDs and power devices, MST can achieve more accurate quantification of impurities. We will introduce a case where, after disassembling a commercially available deep ultraviolet LED, SIMS analysis was conducted to determine the concentration of the dopant Mg and the distribution of the main component Al composition. Measurement method: SIMS Product fields: Lighting, power devices, optical devices Analysis purposes: Trace concentration evaluation, impurity evaluation, distribution evaluation, product investigation For more details, please download the materials or contact us.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis
Contract measurement

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[Analysis Case] Qualitative Analysis of Organometallic Complexes under Atmosphere Control

Mass spectrometry using TOF-SIMS is possible under conditions that are not affected by oxidation.

Titanium tetraalkoxide is an essential reagent for the Katsuki-Sharpless asymmetric epoxidation and is affected by oxidation in the atmosphere. In this case, we present an investigation using TOF-SIMS on how titanium tetraalkoxide (titanium tetra-isopropoxide) changes under controlled atmosphere and after exposure to air. In MST, the evaluation of the complex can be performed without the influence of atmospheric oxidation due to atmosphere control. Measurement method: TOF-SIMS Product fields: Biotechnology, Pharmaceuticals, Cosmetics, Daily necessities Analysis purpose: Deterioration investigation, Reliability assessment For more details, please download the materials or contact us.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

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Sling Media M1 Disassembly Investigation

A device that allows you to view footage from home while you are out.

If there were features on BD or DVD that allowed you to watch them while out and about, you could do so, but many people must have experienced the feeling that it would be a waste to replace what they already have at home. The Sling Media M1 makes that possible. I disassembled and investigated that set to see what kind of semiconductors and molded products it contains. You can grasp everything without having to go to an electronics store to buy the product and disassemble it; this one book makes it all possible.

Company：テックインサイツジャパン株式会社（TechInsights）
Price：100,000 yen-500,000 yen

Other electronic parts

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DSC 3500 Sirius / Differential Scanning Calorimeter

Diversification of cooling options (electric, liquid nitrogen, gas flow) to accommodate various measurements.

Differential Scanning Calorimetry (DSC) is a mainstream device for analyzing the thermal properties of solids and liquids, capable of very robust and stable measurements. It employs an indirect cooling method, allowing for low-noise measurements even in low-temperature regions. The optimization of the furnace structure provides excellent baseline reproducibility (±10μW). The exchange between liquid nitrogen and the electronic cooling system is easy. The sealed structure reduces the influence of moisture in the atmosphere during low-temperature measurements.

Company：ネッチ・ジャパン
Price：Other

Analytical Equipment and Devices

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[Analysis Case] Evaluation of Cleansing Oil's Cleaning Effectiveness

Measurement examples of cleaning residues using TOF-SIMS.

The way makeup is removed varies depending on the type of cleansing oil, even with the same washing method. To investigate the cleansing effect, we evaluated the remaining components after washing lipstick with oil using TOF-SIMS. This report introduces a case where the differences in cleansing effects due to the type of cleansing oil were assessed by conducting relative comparisons of the components of the lipstick (such as pigments and oils) between samples.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

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[Analysis Case] Evaluation of Composition Distribution of Capsule-type Drugs

Imaging evaluation is possible from the overall view to local distribution.

TOF-SIMS allows mass imaging analysis of samples ranging from micrometers to centimeters in size. We conducted mass imaging analysis using TOF-SIMS on the cross-section of a capsule-type drug. We performed cross-section processing and present imaging examples focusing on the entire drug (approximately 7mm x 20mm) and a single granule inside it (approximately 500μm in diameter).

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

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[Analysis Case] Evaluation of Surface Deterioration of Polycarbonate

Structural analysis of resin surface degradation using TOF-SIMS.

Polycarbonate (PC) is a type of thermoplastic that has excellent transparency, impact resistance, and heat resistance. It has been reported that degradation occurs due to hydrolysis, leading to the generation of the raw material bisphenol A (BPA). Particularly in solar panels, it is important to understand how the surface of the material changes under UV (ultraviolet) irradiation. Below, we present a case study that evaluated the degree of degradation of the PC surface due to UV irradiation using TOF-SIMS.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

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Kenic system's LCD controller

"Easy and Useful" is our policy.

【Features】・Externally, it seems like a dedicated IC. ・therefore, it can quickly support the discontinuance of the LCD or specificaitons change. ・The image frame buffer appears to be SRAM from Host-CPU, therefore software disign is easy. ・「Direct connection to the Host-CPU with 8bit」and there is a complete, one-to-one correlation between the mapping coordinates of the pixels and addresses as seen from the Customer’s CPU. ・Power supply is a 3.3V single power supply.

Company：ケニックシステム東京オフィス
Price：Less than 10,000 yen

controller

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Continuous Flow Analysis System (CFA) "MiSSion"

Compatible with halogen and LED light sources! Vertical 2-channel system of the auto analyzer series.

We have newly released the continuous flow analysis device "MiSSion." It is a vertical two-channel system from the auto-analyzer series. The measurement principle is based on the flow analysis device using the absorbance method, specifically the bubble segmentation "CFA" method. The auto-analyzer series offers over 1,000 analytical methods for chemical analysis in fields such as environment, agriculture, fisheries, and chemistry, and is widely used in many analytical institutions. 【Features】 ■ Supports ultra-low concentration measurements ■ Can be equipped with halogen and LED light sources ■ Excellent maintenance capabilities ■ Temperature control function for the detector ■ New software *For more details, please refer to the PDF document or feel free to contact us.

Company：ビーエルテック
Price：Other

Analytical Equipment and Devices
Logic Analyzer

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[Analysis Case] Depth Profile Analysis of Impurities in Organic EL Devices Using SIMS

Evaluate organic EL elements with good depth direction resolution.

To extend the lifespan of organic EL devices, it is essential to evaluate the degradation caused by electromigration, making it important to investigate the diffusion state of electrode metal components into the organic layer. However, whether analyzed directly from the cathode side or through the SSDP method from the anode side, the depth resolution decreases, making it difficult to assess the diffusion from the interface into the organic layer. (Note: SSDP method refers to analysis from the backside. For details on the analytical method, see section B0013.) Therefore, by using special processing to expose the cathode/organic layer interface and the organic layer/anode interface, it has become possible to evaluate the organic layer with high depth resolution.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis

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analysis(si) - List of Manufacturers, Suppliers, Companies and Products

analysis Product List