Last Updated： Aggregation Period:Sep 02, 2026～Sep 29, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Sep 02, 2026～Sep 29, 2026
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Sep 02, 2026～Sep 29, 2026
This ranking is based on the number of page views on our site.
31～51 item / All 51 items
![[Analysis Case] Evaluation of Voids Inside Pancakes](https://image.mono.ipros.com/public/product/image/22e/2000442993/IPROS2863078852557933809.jpg?w=280&h=280)
Non-destructive observation of the internal structure of food using X-ray CT.
In scientifically evaluating the texture of food, internal voids serve as an indicator for assessing softness. To evaluate the internal voids of pancakes, we prepared pancakes made with a normal amount of eggs [1] and pancakes made with double the amount of eggs [2], and observed the internal voids using X-ray CT.
![[Analysis Case] Evaluation of Internal State of Transistor](https://image.mono.ipros.com/public/product/image/64b/2000443018/IPROS11040675799948172833.jpg?w=280&h=280)
We evaluate abnormalities inside the device non-destructively.
In order to investigate the causes of device failures that cannot be identified through visual inspection, non-destructive evaluation methods such as X-ray CT may be necessary. Using X-ray CT, we measured the faulty transistor and checked its internal condition. As a result, we confirmed a wire breakage, and it was also found that the mold resin surrounding the broken wire had deteriorated due to heat and other effects at the time of the breakage.
![[Analysis Case] Tensile Test of Foam Rubber Using X-ray CT](https://image.mono.ipros.com/public/product/image/cb9/2000459842/IPROS61200522363696430482.jpeg?w=280&h=280)
Measurement and analysis of shape changes inside the sample in situ.
It is possible to conduct internal structure analysis using X-ray CT while applying stress (tensile or compressive) to the sample. In this document, we used foamed rubber as an example to perform in situ X-ray CT measurements in both the normal state and the stretched state, and analyzed the volume changes of the bubbles from the obtained CT images. By combining in situ X-ray CT measurements with image analysis techniques, it is possible to evaluate under actual usage conditions, which was previously difficult, as well as assess the impact of stress on the product.
![[Analysis Case] Non-destructive Analysis of Cosmetics](https://image.mono.ipros.com/public/product/image/3c6/2000464676/IPROS60536218911892449745.jpeg?w=280&h=280)
The internal structure of the product can be evaluated non-destructively using X-ray CT.
X-ray CT is a non-destructive analytical method that can measure the internal structure of samples, making it suitable for investigating abnormalities such as foreign substances, voids, and cracks within cosmetics, as well as for evaluating the dispersion of pearl agents and other components. In this case, foundation and lipstick were measured using X-ray CT to non-destructively assess their internal structures.
![[Analysis Case] Shape Evaluation Based on O-Ring Usage History](https://image.mono.ipros.com/public/product/image/5e8/2000799386/IPROS56274015107526779596.png?w=280&h=280)
Non-destructive observation and thickness distribution analysis of components is possible using X-ray CT.
X-ray CT analysis allows for the non-destructive comparison and investigation of the structure and dimensions of components. This document presents a measurement case of a rubber O-ring used in vacuum equipment. To investigate a long-used item that is leaking gas, X-ray CT analysis and three-dimensional image analysis were conducted, comparing it with data from a new item. As a result, it was found that the long-used item had localized areas where the thickness of the ring was reduced, suggesting that leaks were occurring from those points. Measurement method: X-ray CT Product fields: Manufacturing equipment and parts, polymer materials, daily necessities Analysis purposes: Shape evaluation, film thickness evaluation, structural evaluation, failure analysis, defect analysis, degradation investigation, reliability evaluation, product investigation For more details, please download the document or contact us.
![[Analysis Case] Structural Evaluation of Lithium-Ion Secondary Battery Anode Materials](https://image.mono.ipros.com/public/product/image/387108/IPROS12353776579006139988.png?w=280&h=280)
The structure of the active material and current collector of secondary batteries can be evaluated in three dimensions!
Our organization offers structural evaluation of lithium-ion secondary battery anode materials. The structural state of the anode materials, such as the dispersion of active substances and porosity, affects performance. In this case, we observed the internal structure of the anode material using X-ray CT, which allows for non-destructive and high-resolution measurement of the three-dimensional structure. By analyzing the results obtained from X-ray CT, it is also possible to detect foreign substances within the electrode material and evaluate the porosity of the active substance layer. [Measurement Method / Processing Method] ■ X-ray CT Method *For more details, please download the PDF or feel free to contact us.
![[Analysis Case] Observation of Structural Changes in ABS Resin through Tensile Testing](https://image.mono.ipros.com/public/product/image/387108/IPROS15359473387456945773.png?w=280&h=280)
Monitor three-dimensional structural changes! It is possible to observe the three-dimensional structure under load applied to the sample.
Our organization conducts observations of structural changes in ABS resin through tensile testing using in situ X-ray CT. In in situ X-ray CT measurements, it is possible to perform structural observations while applying a load (tensile or compressive) to the sample. In this case, X-ray CT measurements were conducted on a sample of ABS resin containing glass filler under tensile load, and the tensile stress applied to the sample was calculated. The three-dimensional structural changes of the resin and glass filler under each stress condition were monitored. [Measurement Method / Processing Method] ■ X-ray CT Method *For more details, please download the PDF or feel free to contact us.
![[Analysis Case] Non-destructive Analysis of All-Solid-State Batteries Using X-ray CT](https://image.mono.ipros.com/public/product/image/387108/IPROS13128781545658895979.jpg?w=280&h=280)
X-ray CT allows us to observe structural changes before and after charging and discharging.
In the research and development of all-solid-state batteries, it is important to evaluate the quality of the battery and to understand the degradation phenomena that occur during operation. By using X-ray CT, it is possible to confirm the presence of cracks at the electrode ends and structural changes associated with charging and discharging without destroying the battery. This document presents a case study of observing a single-layer laminated cell of an all-solid-state battery using X-ray CT. First, the entire 20 mm square electrode was observed, and then focused enlarged observations were conducted on areas suspected of defects. Furthermore, the battery was charged, and X-ray CT images before and after charging were compared.
We introduce an X-ray CT rental lab that handles device operation and data analysis on your behalf!
The "X-ray CT Rental Lab" is a service that provides X-ray CT equipment and analysis PCs for use on a daily basis. Dedicated operators will handle the operation of the equipment and data analysis. Inspections can be performed in real-time according to your requests. There is a reassuring one-price system, and there are no quantity limits. 【Features】 ■ Available for use on a daily basis ■ Dedicated operators handle equipment operation and data analysis ■ Inspections can be performed in real-time according to your requests ■ Reassuring one-price system ■ No quantity limits *For more details, please refer to the PDF document or feel free to contact us.
Development and evaluation of food processing, preservation and transportation technologies by using single X-ray image obtained from NanoTerasu
Synchrotron radiation analysis (X-ray CT) using a single X-ray beam is a nondestructive analysis used in many fields such as food, medicine and chemical industry. In the food industry, it is used to improve taste and texture, as well as to develop preservation and transportation methods that maintain quality. This invention is about a method to analyze (evaluate) a sample based on the proof that the contrast of image appearing in X-ray CT image is due to the distribution and migration of medium element such as Na and Cl, which are contained in the sample and can easily affect the food product quality. The right figure shows an example of proving that the contrast on the X-ray CT image of a frozen and thawed pollock surimi gel (kamaboko) is due to the migration of the middle element by analyzing the linear absorption coefficient of each element. This invention and the CT image taken at the next-generation synchrotron radiation facility "NanoTerasu" which is scheduled to be operational in 2024 are expected to accelerate the development of processing, preservation and transportation technologies in the food industry, as well as the material analysis other than food product that contain medium element (mineral).
A system for synthesizing X-ray CT images with "FLEX-M345CT" and converting image data into CAD data.
We would like to introduce a product that applies "Smart X-ray." The "CT Image Quantification System" uses the world's smallest X-ray CT device, the "FLEX-M345CT," to synthesize X-ray CT images from micron-level fine X-ray transmission images, and further convert that image data into CAD data. The goal is to perform 3D image processing of each component part using the 3D image processing system "BS-VE" from the obtained 3D CT data, and to create CAD data based on that processing. *For more details, please refer to the PDF document or feel free to contact us.
X-ray CT enables the separation and extraction of wiring patterns on multilayer circuit boards! *CT imaging case study collection available.
To analyze the wiring and metal patterns of multilayer printed circuit boards, we used to cut the printed circuit boards layer by layer and conduct visual (visible light) inspections. This method destroys the printed circuit boards, making it difficult to analyze valuable boards, and non-destructive inspection is desired. On the other hand, conventional non-destructive X-ray CT imaging faced challenges in layer separation of multilayer printed circuit boards due to limitations in resolution and density resolution. We have now developed a new X-ray CT system that allows for high-resolution CT imaging of multilayer circuit boards, enabling layer separation. Additionally, we have adopted new CAD software to provide wiring patterns visualized in CAD format layer by layer. [Features] ■ Separation and extraction of wiring patterns of multilayer boards using X-ray CT ■ Provision of wiring patterns visualized in CAD format layer by layer ■ Conversion of images of circuit board wiring patterns into CAD data *For more details, please refer to the PDF document or feel free to contact us.
X-ray microscopy allows for non-destructive observation of the internal structure of samples with high spatial resolution on the order of micrometers, and three-dimensional morphology can also be observed through CT measurements.
The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control. **Abstract** X-ray microscopy is a device that allows for non-destructive observation of the internal structure of samples with high spatial resolution on the order of micrometers. By performing CT (computed tomography) measurements, it is also possible to observe three-dimensional morphology. The application of X-ray CT measurements, which can perform transmission imaging, is particularly effective in evaluating conditions such as the contact state between liquids and materials, and the presence of liquids within materials that have voids, which is difficult with electron microscopy. This paper introduces a new approach to applying liquids to material surfaces and interiors, as well as methods for performing X-ray CT measurements without drying, and presents several case studies of three-dimensional observations and contact angle measurements at liquid/solid interfaces. **Table of Contents** 1. Introduction 2. Observing Microscopic Droplets: Features of X-ray CT Equipment 3. Applying Microscopic Droplets 4. Measuring Microscopic Droplets 5. Conclusion
This introduces the evaluation of contact angles in micro-regions and uneven surface shapes using X-ray CT, taking into account the effects of droplet size, sample surface heterogeneity, and the shape of the contact surface.
The technical information magazine The TRC News provides the latest information on analytical techniques that are useful for research and development, solving production troubles, and quality control. **Abstract** In measuring contact angles, the use of X-ray CT (computed tomography) methods, which can non-destructively capture the internal structure of samples in three dimensions, is effective for micro-regions, uneven shapes, and within materials. The contact angle measured in micro-regions using X-ray CT is significantly influenced by droplet size, the heterogeneity of the sample surface condition, and the shape of the contact surface. Therefore, it is important to evaluate these factors rather than simply comparing the magnitude of the contact angle. Here, we present results that verify these influences using three-dimensional observation data from polyethylene films and nylon threads. **Table of Contents** 1. Introduction 2. Influence of Droplet Size on Contact Angle 3. Contact Angle Measurement Using X-ray CT in Fibers 4. Conclusion
X-ray detector with a maximum flat panel sensor size of 159mm x 159mm! High resolution with an optical resolution of at least 6μm.
The "ComscanX Mini" is a full-spec, low-cost X-ray CT device equipped with a high-sensitivity flat panel (X-ray detector). It allows for simple operation from sample setup to displaying three-section CT images. It can be used for material analysis and quality control, enabling non-destructive testing while keeping costs down. Additionally, there is the "ComscanX Mini II" with a maximum flat panel sensor size of 227mm × 159mm. Please feel free to contact us. 【Features】 ■ X-ray Tube - Reflection type, sealed tube - Tube voltage: 90kV ■ X-ray Detector - Maximum flat panel sensor size: 159mm × 159mm *For more details, please download the PDF or feel free to contact us.
Develop, mass-produce, and ensure quality of high-output, high-resolution, wide-field X-ray CT!
We would like to introduce our product, 'ComscanX Performance.' The X-ray tube voltage can reach up to 300kV, covering large and high-density samples. With the new technology "Panorama Scan" imaging function, it enables wide-area imaging and high-resolution inspections. We will propose suitable combinations of X-ray tubes, X-ray detectors, imaging methods, image reconstruction, image measurement, and options according to your needs. 【Features】 ■ X-ray Tube - Reflection type open tube - Tube voltage: 300kV ■ X-ray Detector - Maximum 427mm x 425mm flat panel sensor ■ Imaging field with the new function "Panorama Scan" *For more details, please download the PDF or feel free to contact us.
If there are defects inside the currency, they can be detected using internal 3D images from X-ray CT!
We would like to introduce a case where a 1 yen coin was imaged using our X-ray CT device "ComscanX Mini." If there are defects inside the coin, they can be detected through the internal 3D images provided by X-ray CT. In this case, no defects were observed. Please feel free to contact us for product information, quotes, or any inquiries. 【Overview】 ■ Imaged with our X-ray CT device "ComscanX Mini" ■ Defects inside the coin can be detected through the internal 3D images provided by X-ray CT ■ No defects were observed in this case *For more details, please download the PDF or feel free to contact us.
The cause has become visually clear, contributing to the formulation of a policy for improvement at the customer level!
We will introduce a case that contributed to customer process improvement by capturing the changes in the internal structure of OD tablets before and after a rigorous test. X-ray CT is a non-destructive method that visualizes the spatial distribution of X-ray absorption rates within a sample. When changes occur inside the sample, there may be corresponding changes in the distribution of X-ray absorption rates, and by quantifying these changes, it is possible to infer what kind of changes have taken place inside the sample. The value "skewness," which represents the shape of the histogram of X-ray absorption rates within a region of a certain size, is one of the useful quantities that indicates the state of the sample's interior. 【Flow of Data Acquisition and Analysis】 ■Sample ■X-ray CT Observation ■3D X-ray Absorption Rate Data ■Data Analysis ■3D Distribution of Skewness of Absorption Rate Distribution in Multiple Regions *For more details, please refer to the PDF document or feel free to contact us.
You can check for the presence of internal defects without damaging the sample!
Regarding aluminum die-cast parts, information such as the presence of internal defects can be obtained through non-destructive observation using a 3D X-ray microscope (X-ray CT). Additionally, if defects are confirmed internally, the defects can be exposed and assessed through cross-sectional processing using techniques such as ion milling. When inclusions are present, the cause of occurrence can be estimated by confirming their composition. Please feel free to contact us if you have any inquiries. [Overview] ■ Acquisition of internal information through non-destructive observation (X-ray CT) ■ Cross-sectional structural analysis (cross-sectional processing + elemental analysis) *For more details, please download the PDF or feel free to contact us.
