豊中研究所 Product Lineup

Simultaneous three-dimensional measurement can be performed from two viewpoints, or two-dimensional measurement from four viewpoints. Furthermore, by using two of these devices, measurements can be taken simultaneously from double the viewpoints, and feedback control can be implemented as needed.

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You can connect a keyboard and mouse as needed, but normal measurements can be sufficiently performed using the dedicated switch on the panel, so it can also accommodate measurements taken on-site.

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The controller is equipped with an LCD display, in addition to computer functions and external interfaces, allowing it to import data from other measuring instruments and consolidate them into a measurement system.

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With five calibration poles, three-dimensional space can be easily acquired, and data can be collected while viewing the operation screen in real time.

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Install the target LED at the position you want to measure, and you can display the operation in real-time on a stick diagram and a timeline graph. It allows for management in measurement units and enables the display of the previous operation and the current target value.

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Measurements can be made using battery power. The measurement data stored in memory can be read out via a memory link.

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You can obtain analog and digital outputs in real time. Additionally, you can store them in memory and read them out later via a memory link after measurement.

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It is possible to target work with LED or infrared light emission. In the case of LED, the ambient light just before measurement can be processed as background light.

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The output is only analog X and Y outputs, but it can be performed with a measurement time of 20 μSec. By adding units, it is possible to have up to four channels.

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You can either connect it to a recording device as analog data, use it connected to another A/D converter, or connect it to a line for use in feedback control.

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PSD sensors operate on a very simple principle, which allows for very fast responsiveness and highly reliable position detection.

• Semiconductor inspection/test equipment