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  3. システムブレイン 東京営業所
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システムブレイン 東京営業所

number of employees21
addressChiba/Kashiwa-shi/6-7-27 Nishihara
phone04-7199-2993
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last updated:May 02, 2022
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KEYSIGHT E36100B Series

Black High-Performance 2nd Edition E36100B Series Compact Single Output DC Power Supply Launch

KEYSIGHT's compact single-output DC power supplies offer a wide range of stabilized power sources ideal for research and development, manufacturing, and educational applications. Each power supply can be used on a bench or in a rack, providing clean and stable DC power, which enhances the reliability and efficiency of your work. Choose from a variety of compact and affordable products, including single-output, dual-output, and triple-output DC power supplies.

  • power supply
  • Power Supplies
  • Other power sources

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Simple room temperature prober (with temperature gradient function and micro-infrared camera included)

- Equipped with a temperature gradient generation unit that directly applies heat to the sample - Equipped with a micro-infrared camera unit

A custom system equipped with a unit that can apply heat to part of a sample to generate a temperature gradient, as well as a microscopic infrared camera unit for observation, designed for a simple room temperature prober.

  • Semiconductor inspection/test equipment
  • Other physicochemical equipment
  • probe

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Custom Optical Liquid Nitrogen Cryostat (Rotating Sample Stage)

Optical liquid nitrogen cryostat (rotating sample stage)

This is an optical cryostat that uses liquid nitrogen for cooling. The rotating sample stage allows for angle changes. Our website also features photos and papers showcasing actual usage. If you are interested, please visit the page for our optical liquid nitrogen cryostat (with rotating sample stage) on our website.

  • Other physicochemical equipment
  • Testing Equipment and Devices
  • Other inspection equipment and devices

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Prober Vacuum Prober System for Thermoelectric Characterization Evaluation

- Optimal for measuring the Seebeck coefficient - Enabled measurement of the sample surface temperature based on a vacuum prober system.

- Optimal for measuring the Seebeck coefficient - Enabled measurement of sample surface temperature based on a vacuum prober system. - Surface temperature measurement mechanism: Capable of measuring the sample surface temperature (optional) - Equipped with heating and cooling mechanism: Capable of creating a temperature difference at both ends of the sample - Can be modified for low or high temperature specifications (optional)

  • Semiconductor inspection/test equipment
  • Other physicochemical equipment
  • probe

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Custom top-loading refrigeration system with horizontal magnetic field and rotation mechanism.

Top-loading cryogenic system with transverse magnetic field and rotation mechanism for optical electric measurements.

- Automatic control of magnetic field, temperature, and sample angle - Automatic measurement of I-V and C-V characteristics - Adopts a top-loading cryostat for easy sample exchange, utilizing the thermal conductivity of helium gas for cooling. - Equipped with an electromagnet providing a transverse magnetic field of 0.5T - Automatic control of the sample holder to any angle (horizontal rotation) - For optical measurements, two optical windows facing each other (effective diameter φ15mm)

  • Other physicochemical equipment
  • Testing Equipment and Devices
  • Other inspection equipment and devices

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Magnet-compatible top-loading freezer system

Top-loading type that allows for easy sample exchange, compatible with various magnets.

We support measurements using magnets at extremely low temperatures. It is a top-loading cryostat that allows for easy sample exchange.

  • Other semiconductors
  • Other electric meters

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Multi-cooling system

A system capable of various low-temperature measurements with a single unit.

- A system capable of various low-temperature measurements with a single unit - A top-loading cryostat that allows for easy sample exchange - Ultra-low temperature measurements below 2K - Optical measurements with conductive cooling are possible, and there is space to attach samples at the bottom of the sample chamber.

  • Other physicochemical equipment
  • Testing Equipment and Devices
  • Other inspection equipment and devices

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1.5K Top Load Freezer System

Top-loading cryostat with easy sample exchange

The 1.5K top-loading refrigeration system is an easy-to-handle system that does not require atmospheric release of the vacuum chamber during sample exchange. We also offer an option for maintaining ultra-low temperatures for extended periods.

  • Other physicochemical equipment
  • Testing Equipment and Devices
  • Analytical Equipment and Devices

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0.1W top-load refrigeration system

Adopts AC100V air-cooled compressor.

We have adopted a top-loading cryostat that allows for easy sample exchange and uses a 100V compressor, which is easy to secure power for in laboratories. This enables simple experiments at ultra-low temperatures.

  • Testing Equipment and Devices
  • Other physicochemical equipment
  • Other inspection equipment and devices

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Prober Vacuum <Low Temperature> Prober System

We offer a wide range of options to meet various demands from low temperatures to high temperatures.

The SB-MCPS series vacuum <low temperature> prober system offers a variety of low and high temperature options, making it suitable for various temperature ranges. In addition to standard systems, we also have experience in manufacturing probers for spintronics that combine low temperature, RF, and magnetic fields, as well as space-saving mini probers tailored to measurement spaces, and probers equipped with electromagnets and infrared cameras. We can also customize and propose solutions based on the functions and performance required for your desired measurements.

  • Semiconductor inspection/test equipment
  • probe
  • Other physicochemical equipment

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Magnetic field distribution measurement device

High-speed scanning

High-speed scanning of the magnetic flux trap states between electromagnets and superconductors controlled by a computer.

  • magnet
  • Other physicochemical equipment
  • Other inspection equipment and devices

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