フォトニックインストゥルメンツ Product Lineup

The VISTEK vibration isolation platform VIP series uses a unique patented technology developed by True Gravity for seismic isolation of structures, incorporating small vibration isolation bearings designed to fit precision instruments such as microscopes and analytical equipment. Despite being passive, thin, and lightweight, it offers vibration isolation performance superior to that of large air spring vibration isolation tables. Its compact design minimizes installation constraints, and it does not require air or power supply, nor does it need regular maintenance or adjustments. - Low profile: Approximately 35mm ultra-thin from the surface of the vibration isolation table to the installation desk. - Lightweight and compact: Weighs about 5kg, designed to match the bottom shape of microscopes, making it ideal for constrained installation spaces. - No power or air supply needed: No need for outlets or compressors. - Maintenance-free: Can be used simply by mounting the microscope, with no daily maintenance required.

• Optical microscope
• Other inspection equipment and devices
• Other laboratory equipment and containers

The automatic XY stage for microscopes from Germany's Merzhauser company was developed for applications that require automation of devices and high-precision positioning. It can be mounted on upright/inverted microscopes from most manufacturers. The minimum movement range is available from 75mm x 50mm, and the maximum movement range can be up to 600mm x 600mm. When combined with an electric Z focus drive, three-axis control is possible. By using the API & DLL for software creation, it can be easily integrated into original devices.

• Other physicochemical equipment
• Optical microscope
• Defect Inspection Equipment

- Can be attached to existing microscopes. - Marking on various materials with minimal wavelength dependence. - Minimum laser spot size of approximately 0.3 µm. - Marking is also possible on materials beneath transparent bodies or within transparent bodies. - Target marking as a preprocessing step for SEM, AFM, and FIB. By combining with an automatic stage and dedicated software, it is also possible to mark rectangles and characters. Additionally, marking can be done while reviewing defect maps from defect inspection devices such as KLA.

• Optical microscope