高度技術研究所 Product Lineup

The "COF/TAB Automatic Inspection Device" enables online inspection through high-speed processing of optical speed image differential methods. It allows for simplification of the substrate tape feeding mechanism and does not require strict precision for substrate positioning in principle. Additionally, it can automatically punch and engrave good and defective products, as well as display enlarged monitoring of defects and save logs. 【Features】 ■ High-speed, high-resolution detection processing using optical speed image Fourier transform differential method ■ Inspection tailored to the manufacturing line ■ Master creation time for reference images: 10 minutes ■ Simplification of the substrate tape feeding mechanism is possible ■ Does not require strict precision for substrate positioning in principle *For more details, please refer to the PDF document or feel free to contact us.

• Other inspection equipment and devices

The newly developed laser phase contrast microscope, unlike the conventional Zernike-type phase contrast microscope, not only enables "imaging of refractive index changes in phase objects such as cells" but also achieves "imaging through interference" using coherent parallel laser light illumination. 【Features】 ■ Non-invasive, wide-field, and deep depth of field observation method for phase objects using parallel laser light illumination ■ Accurate observation of transparent object shapes and sizes without halos using parallel laser light illumination ■ Clear imaging technology through the capture of higher-order diffracted light from refraction and scattering at the nucleus and periphery of transparent biological cells *For more details, please contact us or download the PDF for more information.

• Inspection robot