アズサイエンス List of Products and Services

The JSM-IT210 scanning electron microscope from JEOL Ltd. is the most compact scanning electron microscope among JEOL's benchtop models. The newly developed stage features all five axes driven by motors, allowing for safer and faster operation. ○ Features - "Sample Exchange Navigation" for easy observation after inserting the sample - "Zeromag" for magnifying optical images into SEM images - "Live Analysis" for continuous elemental analysis during observation - "Simple SEM" for a variety of automatic measurements - Functions that strongly support automatic measurements - Faster analysis - Standard equipped with a 60 mm² large-diameter EDS *For more details, please refer to the PDF or feel free to contact us.

JEOL Ltd. JSM-IT710HR Scanning Electron Microscope In addition to its resolution and analytical performance at the nanometer scale, throughput during data acquisition is also important. The newly developed JSM-IT710HR is a fourth-generation model in JEOL's HR series, themed "Anyone can easily capture high-resolution images with SEM." It features enhanced operability with expanded automatic functions and improved observation performance with a new detector system. ○ Features - SEM images are visible in conjunction with optical images - High-resolution electron gun for better visibility - Automatic measurement function: Simple SEM/EDS - Real-time 3D image construction: Live 3D - New low vacuum secondary electron detector LHSED - Stability of the Schottky FE electron gun enhanced to over four times compared to previous models *For more details, please refer to the PDF or feel free to contact us.

Here are three products from JEOL Ltd. that can be used in various fields: 〇 JSM-IT200 InTouchScope Scanning Electron Microscope This product is designed with a focus on cost performance, making it simple and easy to use. It features a user-friendly sample exchange guide that allows beginners to easily set up samples, search for fields of view, and start observing SEM images. 〇 JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope Equipped with a cold cathode field emission gun (Cold-FEG) developed with JEOL's unique technology and a new spherical aberration corrector (ASCOR) capable of correcting higher-order aberrations, this microscope achieves atomic resolution not only at a high acceleration voltage of 200 kV but also at a low acceleration voltage of 30 kV. It also includes a system that automatically performs high-speed and accurate aberration correction. 〇 JEM-F200 Multifunctional Electron Microscope This transmission electron microscope is designed to improve spatial resolution and analytical performance while considering operability for various applications. It features a new operating system that appeals to both beginners and experienced users with its smart appearance. Developed with energy efficiency and CO2 reduction as its concept, it is a field emission type electron microscope.

Nikon Solutions Co., Ltd. ECLIPSE Ji is Nikon's first research-use digital inverted microscope. By eliminating the eyepiece, it achieves a new design that combines ease of learning and usability while maintaining Nikon's proud optical quality and wide field of view (FOV). It enables imaging in an optimal environment for your research purposes. It streamlines the imaging workflow and assists in data acquisition. 〇 Features - Benchtop inverted microscope that does not require a darkroom - Versatile bioassays - AI-supported observation/analysis - Nikon's proud optical quality *For more details, please refer to the catalog or feel free to contact us.

We would like to introduce three products from Japan Electronic Corporation that can be utilized in various fields. If you are interested, please feel free to contact us. 〇 JPS-9030 Photoelectron Spectrometer (XPS) This is a general-purpose XPS that realizes "anyone can use it easily and immediately." It comes standard with a Kaufman-type etching ion source and twin anodes, and despite being a general-purpose XPS, it also has a wide range of expandability, including a high-temperature heating system and gas cluster ion source. 〇 JEM-1400Flash Electron Microscope This transmission electron microscope is equipped with a high-sensitivity sCMOS camera and incorporates powerful new features such as an ultra-wide field montage system and optical microscope image linking functionality. 〇 JCM-7000 NeoScope Desktop Scanning Electron Microscope This desktop scanning electron microscope aims to allow anyone to observe and analyze. It features a low vacuum mode that requires no pre-treatment and a stage navigation system for easy field searching. It includes functions such as Zeromag, which allows direct transition from optical images to SEM images, Live Analysis for elemental analysis while observing, and Live 3D for three-dimensional observation during SEM observation.

Here are three recommended products: ◆ JEOL Ltd. JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope Equipped with a cold field emission gun (Cold-FEG) and a new spherical aberration corrector (ASCOR) capable of correcting higher-order aberrations as standard, it enables atomic resolution observation not only at a high acceleration voltage of 200 kV but also at a low acceleration voltage of 30 kV. This makes it easier to observe materials containing light elements with clear contrast. ◆ Nikon Solutions Co., Ltd. Polarized/Dispersion Microscope ECLIPSE LV100ND POL/DS This microscope can measure the properties of asbestos, such as refractive index, birefringence, retardation, extinction angle, pleochroism, and elongation, aiding in the identification of asbestos. It allows for dispersion staining observation at a magnification of 400 times. ◆ JEOL Ltd. JMS-T100LP AccuTOF LC-Express Atmospheric Pressure Ionization Time-of-Flight Mass Spectrometer This high-throughput mass spectrometer aims for high productivity with features such as multi-ionization, robustness, and easy maintenance. It is capable of analyzing a wide range of samples from low polarity to high polarity.