アズサイエンス Product Lineup

Japan Electronics Co., Ltd. JPS-9030 Photoelectron Spectroscopy System (XPS) adopts a newly designed user interface that can be operated in a Japanese environment, achieving "anyone can easily and immediately use it." In addition, it comes standard with a Kaufman-type etching ion source and twin anodes, and while being a general-purpose XPS, it also has a wide range of expandability, including a high-temperature heating system and gas cluster ion source. 〇 Features - Depth profiling (depth direction analysis) that accommodates a wide range of purposes from nm to μm - Newly developed software focused on ease of use - Ultra-high sensitivity comparable to high-end models - Abundant options *For more details, please download the PDF or feel free to contact us.

Nihon Denshi Co., Ltd.'s Electron Probe Microanalyzer is an evolved integration EPMA that allows for more efficient operations from observation to analysis. * EPMA stands for Electron Probe Microanalyzer. 〇 Features - Auto-loading ensures the holder is securely loaded! Quickly discover the area you want to observe! - High-grade SEM images accessible to anyone thanks to comprehensive auto functions - Hassle-free settings with easy EPMA for immediate elemental analysis - Efficient calibration with 18 types of built-in calibration samples * For more details, please download the PDF or feel free to contact us.

Japan Electronics Corporation JAMP-9510F Field Emission Auger Microprobe is a high-spec Auger electron spectroscopy device equipped with a stable high-current field emission electron gun, which is also used in EPMA, and enables high-throughput analysis of chemical bonding states in the nano to micro range. It achieves versatility that does not depend on the sample, providing compositional information from metallic samples to insulating samples, as well as chemical information. 〇 Features - High sensitivity and high resolution analyzer - Schottky field emission electron gun - User-centric sample stage - High durability - Waveform separation software *For more details, please download the PDF or feel free to contact us.

Japan Electronics Co., Ltd. JXA-iSP100 Electron Probe Micro Analyzer (EPMA) enables observation of surface structure and morphology as well as localized trace element analysis. It is an integrated EPMA that has evolved further to perform operations from observation to analysis more efficiently. We are the world's only manufacturer capable of offering soft X-ray spectrometers. 〇Features - Auto-loading ensures secure loading of the holder! Quickly discover the area you want to observe! - Leave all the troublesome settings to the easy EPMA for immediate element analysis. - Efficient calibration with 18 types of built-in calibration samples. *For more details, please download the PDF or feel free to contact us.