ディスク・テック List of Products and Services

"DTAI150" is a system that automatically captures image files of objects for the development of inspection software using AI, storing these image files. Objects can be placed on a stage and multiple images can be taken while automatically rotating them. This simplifies the complex process of image capture, making it easy to adjust lighting and camera settings. The system comes as a set including a camera, shooting stage, lighting, computer, monitor, and software, allowing for easy image capture and storage. 【Features】 - Capable of taking multiple images while automatically rotating the object - Simplifies the complex process of image capture - Easy adjustment of lighting and camera settings - Accommodates requests for changes in the dimensions of the shooting subject *For more details, please refer to the PDF document or feel free to contact us.

• Image Processing Equipment

This product is software that quickly measures the electrical and optical characteristics of high-output LD modules inline and outputs classification information. It is capable of various measurements, including electrical measurements, energy measurements, spectral measurements, color measurements, and setting classification values. 【Features】 ■ Operates on Windows computers ■ Quickly measures the electrical and optical characteristics of high-output LD modules inline and can output classification information ■ Supports the addition of various software functions *For more details, please refer to the PDF document or feel free to contact us.

• Software (middle, driver, security, etc.)

This product is software that measures electrical and optical characteristics at high speed on the production line of automotive LED modules and outputs classification information. It allows for the setting of conditions for voltage and current applied to the LED assembly module, as well as the configuration of measurement items such as electrical and optical characteristics. 【Features】 ■ Operates on Windows computers ■ Measures electrical and optical characteristics at high speed on the production line of automotive LED modules and outputs classification information *For more details, please refer to the PDF document or feel free to contact us.

• Software (middle, driver, security, etc.)

The "IR1300RL" is an infrared microscope that uses the Olympus BX53 microscope body. With a high-resolution infrared CMOS camera and image enhancement software, it can measure the dimensions of various parts of the interfaces of silicon devices with clear images. Additionally, the unique image enhancement software allows for the measurement of alignment mark shifts in bonded wafers. 【Features】 ■ Measures the dimensions of various parts of the interfaces of silicon devices with clear images ■ Uses the Olympus BX53 microscope body ■ Manual operation type for X, Y, and Z axes ■ Capable of measuring alignment mark shifts *For more details, please refer to the PDF document or feel free to contact us.

• Other microscopes

The "IR1300mea" is an infrared transmission and reflection microscope system that can measure the dimensions of various silicon device interfaces with clear images, thanks to its high-resolution infrared CMOS camera and image enhancement software. The focus axis has a long stroke, allowing for inspection and measurement of wafers while mounted on tall fixtures. 【Features】 - Equipped with linear scales on the X, Y, and Z axes for precise measurements outside the field of view. - Manual operation type for the X, Y, and Z axes. - Electric stage and electric focus can also be installed (optional). - The focus axis can be set to a long stroke, enabling wafer inspection and measurement while mounted on fixtures (long stroke up to 45mm). *For more details, please refer to the PDF document or feel free to contact us.

• Other microscopes
• Electron microscope

The "IR-MEMS100" is a fully automated MEMS defect inspection device that automatically transports bonded wafers using robots, captures images of the internal state of the wafers with a specialized infrared optical system, and detects various defects using a defect detection algorithm. Images are captured with a high-sensitivity infrared camera set in an infrared microscope, and a proprietary defect detection software identifies hard-to-see defect areas. 【Features】 ■ Captures images with a high-sensitivity infrared camera set in an infrared microscope and detects hard-to-see defect areas using proprietary defect detection software. ■ Uses processing (effect processing) to enhance low-contrast images, making it easier to detect hard-to-find defect areas. ■ Compatible wafer sizes are 4 inches, 6 inches, and 8 inches. ■ Defect detection capability is approximately 10μm. ■ Inspection time is 30 minutes per wafer. *For more details, please refer to the PDF document or feel free to contact us.

• Other inspection equipment and devices
• Defect Inspection Equipment

We will precisely measure the oxidation part of the VCSEL. For more details, please contact us.

• Optical microscope
• Defect Inspection Equipment

This is an infrared transmission microscope system that displays the oxidized part of the VCSEL in clear images using a high-resolution infrared CMOS camera and real-time enhancement software!! ~Features~ ● Improves unclear images under reflection/transmission lighting to clear images in real-time with enhancement software. ● Allows for image observation and storage of the oxidized and boundary parts of the VCSEL. ● Enables dimensional and area measurements on the screen. ● Allows for variation of the wavelength of the reflected lighting.

• Semiconductor inspection/test equipment
• Other image-related equipment
• Other optical parts

The WID110 wafer ID camera manufactured by HTT (Germany) can read ID numbers with the highest throughput in any process within a semiconductor factory environment. Its powerful RGB lighting system can handle dirty or difficult-to-read characters. It can be used in wafer sorters, wafer probers, optical inspection equipment, cluster tools, or other processing equipment. For more details, please contact us. (WID120) New model now on sale.

• Other semiconductor manufacturing equipment
• Image Processing Equipment

This is a dark box for optical measurement and experimental purposes. You can choose from three sizes: large, medium, and small, depending on your needs. It comes with an optical bench on the bottom. There are external connection terminals for fiber optic SMA connectors, optical shutters, BNC terminals, and more. Various customizations are also available.

• Other laboratory equipment and containers
• Other measurement, recording and measuring instruments
• cabinet

The "Radiation Measurement Device RT-100" allows for high-sensitivity measurement of radiation using a photomultiplier and can perform high-speed measurements at a maximum of 50 msec (longer times may be required for low radiation intensity). It connects to a laptop via a USB interface and displays radiation intensity in real-time. This is a professional-grade dosimeter that measures gamma rays with high sensitivity. The device dimensions are 200mm x 150mm x 40mm, and it operates on AC 100V power supply. For more details, please contact us.

• Radiation detector

The CT series is a line sensor camera for X-rays using a scintillator method. The camera's pixel count can range from 320 pixels to 3840 pixels, and it can support a maximum line speed of 40 m/min. It connects to a computer via Camera Link. We offer three types with detection widths of 256 mm, 512 mm, and 768 mm. We also sell X-ray lighting, sensor power supplies, control computers, software, and conveyor systems. Please consult us for the overall system design and custom products. For more details, please contact us.

• High Speed Camera
• X-ray inspection equipment

The HTT Corporation's (Germany) WID120 wafer ID camera can read ID numbers with the highest throughput in any process within a semiconductor factory environment. Its powerful RGB lighting system can handle dirty or difficult-to-read characters. It can be used in wafer sorters, wafer probers, optical inspection equipment, cluster tools, or other processing equipment. For more details, please contact us.

• Other semiconductor manufacturing equipment
• Image Processing Equipment

As a MEMS device inspection system, we offer a fine hole depth measurement device and a pattern inspection device. The fine hole depth measurement device utilizes an infrared camera and a special algorithm to enable the measurement of the depth of non-through holes with a diameter of less than 20 μm, which is typically impossible to measure. The pattern inspection device is an automatic infrared image processing inspection system that uses an infrared microscope and an electric stage to automatically detect defects. It can save the position, size, and images of the defective areas, and is used for inspection purposes in MEMS (micro-machines). For more details, please contact us.

• Optical microscope
• Defect Inspection Equipment

DTLED-350 is an appearance inspection system for luminous chips that can detect chip defects and low-brightness chips of multi-die LED modules using a high-speed line sensor camera, which are not visible to the naked eye. It allows for easy and high-precision inspection by simply placing the LED module on the inspection table and pressing the start button. It is also compatible with UV LEDs. For more details, please contact us.

• Optical Measuring Instruments
• Visual Inspection Equipment
• Defect Inspection Equipment

A spectrometer is a device that separates light into a spectrum (light by wavelength) and measures the intensity of light at each wavelength. By shining light on thin films and spectrally analyzing the reflected light, the components of the thin films can be measured. Applications include thickness management of films on various discs, measurement of resist films and SiO on semiconductor wafers, management of coating thickness on optical lenses, thickness measurement of various films, inline measurement of alignment films and ITO films on glass substrates, and color measurement of LEDs. There are also established achievements in constructing multi-channel systems for inline use. For more details, please contact us.

• Spectroscopic Analysis Equipment

We will automatically perform the verification of old and new documents, which has relied on human labor until now, using software. It supports multiple languages, making it very convenient.

• Internal Control and Operational Management
• Other security and surveillance systems
• others

It is an inspection device that rapidly detects and determines different colors or discolored parts mixed among parts of the same color. It supports approximately 30 color variations for inspection.

• Image Processing Equipment
• Visual Inspection Equipment
• Defect Inspection Equipment

This is an automatic inspection device that detects lens defects through image processing. We will accommodate customer needs such as lens size and thickness.

• Image Processing Equipment
• Visual Inspection Equipment
• Defect Inspection Equipment

Hololight generates LED lighting that is ideal for hologram reproduction, featuring low heat generation, a large area, high brightness, and high directional characteristics, all from a compact cube-shaped housing. The adjustment of the lighting area and spread angle is achieved by the forward and backward movement of the rear ball on the back of the Hololight. It can be powered for long periods by dry batteries due to low power consumption, and its lightweight aluminum body allows for use in various spaces.

• Semiconductor inspection/test equipment
• Lighting for image processing
• Other optical parts

This is an infrared transmission microscope system that displays clear images of various silicon device interface inspections using a high-resolution infrared CMOS camera and enhancement software!! ~Features~ ● Obtain clear images from unclear images under reflection/transmission lighting using enhancement software. ● Capable of observing and saving defect images of voids, scratches, and foreign objects at the device interface. ● Allows for dimension and area measurements on the screen. *For more details, please download the catalog.

• Semiconductor inspection/test equipment
• Other image-related equipment
• Other optical parts