Measurement of wounds and foreign objects is also possible! It is suitable for internal observation of silicon chips!
This is an infrared transmission microscope system that displays clear images of various silicon device interface inspections using a high-resolution infrared CMOS camera and enhancement software!! ~Features~ ● Obtain clear images from unclear images under reflection/transmission lighting using enhancement software. ● Capable of observing and saving defect images of voids, scratches, and foreign objects at the device interface. ● Allows for dimension and area measurements on the screen. *For more details, please download the catalog.
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basic information
In MEMS, there are many cases where clear images cannot be obtained when observing the back surface of a wafer with infrared light, but it is possible to enhance those images using enhancement software. Measurement of dimensions for scratches and foreign objects is also possible.
Price information
Please feel free to contact us.
Delivery Time
※The delivery date may vary depending on the content, so please feel free to contact us.
Applications/Examples of results
～Applications～ ●Observation of contact interfaces in flip chip implementation and visual inspection. ●Observation of interfaces in bonded silicon wafers and defect inspection. ●Internal observation of various devices such as MEMS, WLCSP, SIP, and CON.
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Company information
Disk Tech's image processing is provided by in-house optical engineers, laser engineers, hardware, software, and precision machinery engineers as a total solution. We handle inspection devices utilizing infrared technology, three-dimensional inspection devices, and more. Our proprietary infrared microscope has over 10 years of proven performance.
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