大倉インダストリー List of Products and Services

The "RPI-P" is a roll pattern measurement device that allows for easy high-resolution and high-definition measurements by being installed on a roll. By adopting a DMD (Digital Micromirror Device) for laser scanning, it enables high-speed and wide-angle scanning measurements. Additionally, with a confocal optical system, it can acquire three-dimensional shapes and images that are in focus at all points without contact. 【Features】 ■ Easy high-resolution and high-definition measurements ■ Adoption of DMD (Digital Micromirror Device) for laser scanning ■ Enables high-speed and wide-angle scanning measurements ■ Can acquire three-dimensional shapes and images in focus at all points without contact ■ Simultaneous observation of measurement images and color CCD images without switching the light source *For more details, please refer to the PDF document or feel free to contact us.

• Other measurement, recording and measuring instruments

Analysis of severe torque fluctuations, suitable for continuous testing! === Features === Compatible with a wide range of containers with lengths from 50mm to 160mm and diameters from φ13 to φ40. The detected torque is displayed as a waveform on a computer, allowing for the management of product identification that was traditionally sorted by sensory means, such as the feel during cap opening and closing, as quantitative values. Additionally, by performing repeated operations, it is possible to analyze fluctuations in torque values due to wear and familiarity with the opening and closing torque of the cap. The claws that clamp during the vertical movement associated with cap opening and closing synchronize smoothly up and down, enabling the measurement of reproducible torque values. === Applications === This device measures the torque generated during the opening and closing of containers, such as those for cosmetics. By controlling the opening and closing with a motor, it achieves high repeatability and is suitable for the analysis of severe torque fluctuations and continuous testing.

• Other measurement, recording and measuring instruments

The tension sensor 3FB-2000N is a pickup that measures the tension of tape and film during operation. It is a product that applies strain gauges and has a structure similar to load cells, providing very stable measurement values. It is used in conjunction with a separately sold tension analyzer. It can accurately capture tension fluctuations of tape and film in operation, and when combined with a digital tension analyzer, it allows for NO/GO judgment, data recording, and graph analysis. In addition to the 3FB-2000N (tape width 40-60mm, tension 0-20N, response frequency 100Hz), there are more than 20 models available, allowing for the selection of pickups according to various tape widths and tensions. Custom-built types that can be built into various running devices such as printers are also available.

• Strength Testing Equipment
• Other inspection equipment and devices
• Testing Equipment and Devices

The wafer edge profile measurement device EPM-300 is equipped with a uniquely developed laser microscope that measures edge shapes with sub-micron accuracy. When combined with processes like CMP, it allows for the overlay and verification of edge shapes before and after polishing. It features a high-speed measurement function that captures profiles at approximately ten times the speed of conventional methods, enabling edge shape acquisition in just a few seconds. Additionally, it includes functions for roundness measurement, notch alignment, notch shape measurement, and image acquisition, with an option for measuring the cross-sectional shape of notches. Furthermore, in addition to 200mm and 300mm wafers, edge shape measurement for 450mm wafers is also available as an option, allowing for rapid verification of upcoming sample products.

• Semiconductor inspection/test equipment
• Wafer processing/polishing equipment
• Image analysis software

【Overview】 By using a laser as the light source for the microscope, stable measurements with a single wavelength are possible. The adoption of DMD (Digital Micromirror Device) for laser scanning enables high-speed and wide-angle deflection, allowing for high-speed image acquisition with a wider field of view than conventional laser microscopes. 【Features】 ● Full-focus images through confocal technology The confocal method is suitable for inspections that require measurements of both plane and height. ● Adoption of short-wavelength laser A 408 nm violet laser, approaching the limit of visible light, is used as the laser wavelength. ● Simultaneous observation function Real-time simultaneous observation of the real image from the laser light source and a 2D color CMOS camera is possible. ● High-speed measurement function With high-speed rendering at 30 frames per second, it is possible to output images and measurement data of the inspection area in almost real-time, making it suitable for implementation in automated inspections. ★ For more details, please request materials or download the catalog ★

• Microscope
• Laser microscope