システムロード List of Products and Services

FF8" measures the reflectance of samples (interference waveforms) and enables non-contact multi-point thickness measurement through the analysis of thickness values using methods such as FFT (Fast Fourier Transform thickness gauge) and curve fitting thickness gauges. In addition to thickness measurement, it can also measure the thickness and refractive index of films and glass, and with optional features, it can perform multilayer film analysis, curve fitting methods, microscopy, mapping measurements, color measurements, and component concentration analysis. Options also include microscopic film measurement and thickness measurement of non-transparent samples. In microscopic film measurement, it uses a microscope to reduce the measurement spot size, allowing for thickness measurement in fine areas, such as RGB patterns of color filters or wiring patterns on substrates, which are difficult to measure macroscopically. For non-transparent sample measurement, it calculates the thickness of non-transparent samples by measuring the thickness of the air layer. Typically, measurement methods using light interference cannot measure the thickness of non-transparent samples, but this measurement method makes it possible. *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments

The "FF8" allows for non-contact multi-point thickness measurement by measuring the sample's reflectance (interference waveform) and analyzing the thickness values using methods such as FFT (Fast Fourier Transform thickness gauge) and curve fitting thickness gauges. In addition to thickness measurement, it can also measure the thickness and refractive index of films and glass, and with optional features, it can perform measurements and analyses for multilayer films, curve fitting methods, microscopy, mapping measurements, color measurements, and component concentration analysis. To efficiently measure and analyze differences in film thickness and variations, automatic mapping measurements can be performed using an automatic XY stage. (Mapping film measurement) 【Features】 ■ Measures the sample's reflectance and analyzes thickness values using FFT and other methods ■ Capable of measuring the thickness and refractive index of films and glass in addition to thickness measurement ■ Measurement data can be saved as files and reanalyzed later ■ Can also be used for inline thickness measurement ■ Custom specifications can be accommodated *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments

The "FF8" is a non-contact underwater thickness gauge that measures the reflectance of samples (interference waveforms) and analyzes thickness values using methods such as FFT (Fast Fourier Transform thickness gauge) and curve fitting thickness gauges. In addition to thickness measurement, it can also measure the thickness and refractive index of films and glass, and with optional features, it can perform multilayer film analysis, curve fitting methods, microscopy, mapping measurements, color measurements, and component concentration analysis. It can measure SiO2 films (silicon oxide films) on Si substrates in both air and water, and with the thin film analysis option, measurements using the curve fitting method are possible. 【Features】 ■ Measures the reflectance of samples and analyzes thickness values using FFT, etc. ■ Can measure the thickness and refractive index of films and glass in addition to thickness measurement ■ Measurement data can be saved as files, allowing for re-analysis later ■ Can also be used for inline thickness measurements ■ Custom specifications can also be accommodated *For more details, please refer to the PDF materials or feel free to contact us.

• Optical Measuring Instruments

The "SR10-FF" is a two-dimensional film thickness measurement software that reads measurement data from the "SR-5000" and performs calculations and analyses of film thickness. Due to its two-dimensional measurement capability, the "SR10-FF" can measure the thickness of RGB films, which typically require multiple measurements, in just one measurement. Under standard specifications, it can measure a range of 0.5μm to 15μm (0.001μm), and with standard plus thin film analysis, it can measure from 0.01μm to 15μm (0.001μm, 0.1nm). 【Measurement Range】 ■ Standard Specifications: 0.5μm to 15μm (0.001μm) ■ Standard + Thin Film Analysis: 0.01μm to 15μm (0.001μm, 0.1nm) *For more details, please refer to the PDF document or feel free to contact us.

• Software (middle, driver, security, etc.)

The "FF8" is a non-contact film thickness measurement system that measures the reflectance of samples (interference waveforms) and analyzes film thickness values using methods such as FFT (Fast Fourier Transform film thickness gauge) and curve fitting film thickness gauges. In addition to film thickness measurement, it can also measure the thickness and refractive index of films and glass, and with optional features, it can perform multilayer film analysis, curve fitting methods, microscopy, mapping measurements, color measurements, and component concentration analysis. 【Standard Measurement】 Measurement Range (Resolution) Corresponding Specifications 0.0010 to 100μm Thin film + thin film analysis specifications 0.0100 to 100μm Standard + thin film analysis specifications 0.5000 to 500μm Standard specifications 1.000 to 500μm Pressure film 1 specifications 4.000 to 2000μm Pressure film 2 specifications *Other measurement ranges can be accommodated with options. *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments

The "DD8-N" is a high-precision absorbance meter and OD meter capable of measuring from 8 to 12. The chopper method allows for measurements that continuously cancel out external light by taking the difference from the ON/OFF of the light source. Due to its noise resistance from high-frequency chopping, real-time measurements are possible. It employs a high-resolution A-D converter, enabling more precise measurements than typical spectrometer A-D converters. Amplification through the amplifier allows for high precision across multiple stages of CH. 【Features】 ■ Measurement of ultra-weak light from 8OD to 12OD without the need for a darkroom ■ Ability to cancel external light and noise ■ Calculation of optical density from the transmittance of the sample relative to the reference ■ Continuous measurement at arbitrary intervals ■ Support for various options and custom specifications *For more details, please refer to the PDF document or feel free to contact us.

• Analytical Equipment and Devices

The "DD8-N" is a measurement device suitable for inline measurement with a spectrophotometer and OD meter, supporting CH1 to CH12 and multi-channel configurations. It can also accommodate custom specifications such as simultaneous 3-channel measurements for inline applications. It is capable of operating in the ultraviolet and near-infrared regions, allowing compatibility with various standards through support for different wavelengths. Additionally, it is available in custom specifications. 【Features】 ■ Measures ultra-weak light from 8OD to 12OD without the need for a darkroom ■ Can cancel external light and noise ■ Calculates optical density from the transmittance of the sample relative to the reference ■ Continuous measurement is possible at arbitrary intervals ■ Supports various options and custom specifications *For more details, please refer to the PDF materials or feel free to contact us.

• Analytical Equipment and Devices

The 'DD8-N', which can display in real-time, is a measuring instrument capable of simultaneous measurement of transmittance and reflectance for absorbance meters and OD meters. It is suitable for inline measurement, making it ideal for production lines in factories. Customization to fit specific line requirements is available according to customer needs. 【Features】 ■ Measurement of ultra-weak light from 8OD to 12OD without the need for a darkroom ■ Ability to cancel external light and noise ■ Calculation of optical density from the transmittance of the sample relative to the reference ■ Continuous measurement at arbitrary intervals ■ Support for various options and custom specifications *For more details, please refer to the PDF document or feel free to contact us.

• Analytical Equipment and Devices

The "DD8-N" is a spectrophotometry measurement system (OD meter) that can evaluate absorbance (OD) and transmittance without the need for a darkroom, and it also allows for real-time display. It provides stable measurements by canceling external light and noise using a chopper method, enabling highly accurate measurements of extremely small transmittance. It supports various options and custom specifications, including multi-point measurements, polarimetry measurements with polarizing prisms, and reflectance measurements. 【Features】 ■ Measures ultra-weak light from 8OD to 12OD without a darkroom ■ Can cancel external light and noise ■ Calculates optical density from the transmittance of the sample relative to a reference ■ Continuous measurements can be taken at arbitrary intervals ■ Supports various options and custom specifications *For more details, please refer to the PDF document or feel free to contact us.

• Analytical Equipment and Devices

The "FF8" is a non-contact film thickness measurement system that measures the reflectance of samples (interference waveform) and analyzes film thickness values using FFT (Fast Fourier Transform) and other methods. In addition to film thickness measurement, it can also measure the thickness and refractive index of films and glass. With optional features, it is capable of multilayer film analysis, curve fitting methods, microscopy, mapping measurements, color measurement, and component concentration analysis. It is also possible to create continuous measurement functions, traverse mechanisms, and data communication functions, allowing it to be used for inline film thickness measurement. 【Features】 ■ Measures the reflectance of samples and analyzes film thickness values using FFT and other methods ■ Can measure the thickness and refractive index of films and glass in addition to film thickness ■ Measurement data can be saved as files, allowing for re-analysis later ■ Can be used for inline film thickness measurement ■ Custom specifications can also be accommodated *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments

The "FF8" is a non-contact film thickness measurement system that measures the reflectance of samples (interference waveforms) and analyzes film thickness values using FFT (Fast Fourier Transform) and other methods. In addition to film thickness measurement, it can also measure the thickness and refractive index of films and glass. With optional features, it is capable of multi-layer film analysis, curve fitting, microscopy, mapping measurements, color measurement, and component concentration analysis. It is also possible to manufacture continuous measurement functions, traverse mechanisms, and data communication functions, allowing it to be used for inline film thickness measurement. 【Features】 ■ Measures the reflectance of samples and analyzes film thickness values using FFT and other methods ■ Can measure the thickness and refractive index of films and glass in addition to film thickness ■ Measurement data can be saved as files, allowing for re-analysis later ■ Can be used for inline film thickness measurement ■ Custom specifications can also be accommodated *For more details, please refer to the PDF document or feel free to contact us.

• Optical Measuring Instruments

The "OD4-8" is a measurement system capable of obtaining fundamental data necessary for analysis methods under uneven reactions and the development of algorithms to eliminate the effects of entrained bubbles and debris. The software can determine the time-dependent changes in absorbance at each wavelength from five-wavelength image information. Additionally, since all data is saved as images, you can change the measurement range after the measurement and analyze freely. 【Features】 ■ For evaluating dry inspection chips ■ Capable of measuring the reaction distribution within the cell ■ Can cancel external light and noise due to the chopper method ■ Can calculate optical density from the transmittance of the sample relative to the reference ■ Continuous measurement can be performed at arbitrary intervals *For more details, please refer to the PDF document or feel free to contact us.

• Other measurement, recording and measuring instruments

The "LL8-HC" is a temperature characteristic measurement system that can measure optical, temperature, and electrical characteristics with a single unit by automatically controlling the spectrometer, power supply, and constant temperature bath. It can automatically change current, voltage, and temperature while measuring optical and electrical characteristics in real-time under those conditions. Additionally, it is capable of performing time variation measurements at fixed intervals and repeated measurements for a specified number of times. 【Features】 ■ Current and voltage can be driven in DC and pulse modes ■ Reverse bias measurements are also possible ■ Measurement results can be saved, and various analyses can be performed using the analysis processing function ■ Analyzed results can be printed, saved as CSV, or copied to the clipboard ■ The software features a user-friendly display entirely in Japanese *For more details, please refer to the PDF document or feel free to contact us.

• Other measurement, recording and measuring instruments

This product is a broadband LED light source that achieves a stable and wide spectrum. It supports light that covers the broadband range of 380-800 nm, which conventional white LEDs lack. Additionally, it provides a light output in the UV range that is comparable to the visible range, which is typically lower with halogen. The correlated color temperature is approximately 5500K, and the average color rendering index is Ra98, providing natural light. 【Features】 ■ Ultra-compact and lightweight ■ Compact design ■ Flexible placement options ■ Achieves a stable and wide spectrum ■ Correlated color temperature of approximately 5500K and average color rendering index Ra98 for natural light *For more details, please refer to the PDF document or feel free to contact us.

• Other lighting equipment

The "LL8-UV-VIS-NIR" is an integrating sphere quantum efficiency measurement system that uses an excitation light source to measure external quantum efficiency, internal quantum efficiency, excitation wavelength dependence, excitation spectrum, and emission spectrum. To efficiently conduct LED development and evaluation, it automatically controls the integrating sphere, spectrometer, power supply, and other components. It measures the optical, electrical, and thermal characteristics of LEDs. Furthermore, the standard calibration light source complies with US NIST standards, and the calculations adhere to JIS standards. 【Features】 ■ Achieves high-precision optical measurements for quantum efficiency measurement and LED optical characteristic evaluation. ■ Automatically controls the integrating sphere, spectrometer, power supply, and other components for efficient LED development and evaluation. ■ Measures the optical, electrical, and thermal characteristics of LEDs. ■ Calibration is also possible with the customer's standard light source. ■ Supports the development and evaluation of LED devices with comprehensive software. *For more details, please refer to the PDF document or feel free to contact us.

• Other measurement, recording and measuring instruments

The "SR10-FF" is software that reads measurement data from the "SR-5000" and performs calculations and analyses of film thickness. Under standard specifications, it can measure a range of 0.5μm to 15μm (0.001μm), and with standard plus thin film analysis, it can measure from 0.01μm to 15μm (0.001μm, 0.1nm). For more details about other products, please feel free to contact us. 【Measurement Range】 ■Standard Specifications: 0.5μm to 15μm (0.001μm) ■Standard + Thin Film Analysis: 0.01μm to 15μm (0.001μm, 0.1nm) *For more details, please refer to the PDF document or feel free to contact us.

• Software (middle, driver, security, etc.)

The "LL8-UV-VIS-NIR" is a system that automatically controls an integrating sphere, spectrometer, power supply, etc., to efficiently develop and evaluate LEDs, measuring their optical, electrical, and thermal characteristics. The standard calibration light source complies with the U.S. NIST, and the calculations adhere to JIS standards. Calibration with the customer's standard light source is also possible. Additionally, the system supports the development and evaluation of LED devices with comprehensive software that includes features such as graph overlay and statistical processing. 【Features】 ■ Achieves high-precision optical measurement for LED optical characteristic evaluation ■ Automatically controls integrating sphere, spectrometer, power supply, etc., for efficient LED development and evaluation ■ Capable of measuring the optical, electrical, and thermal characteristics of LEDs ■ Supports the development and evaluation of LED devices with comprehensive software ■ Accommodates various options and custom specifications *For more details, please refer to the PDF materials or feel free to contact us.

• Other measurement, recording and measuring instruments

The "DD8-N" is an absorbance measurement system that can evaluate absorbance (OD) and transmittance without the need for a darkroom, and it also allows for real-time display. It calculates optical density from the transmittance of the sample relative to a reference. It supports various options and custom specifications, including multi-point measurements, polarization degree measurements with a polarizing prism, and reflectance measurements. 【Features】 ■ Measures ultra-weak light from 8OD to 12OD without a darkroom ■ Can cancel external light and noise ■ Calculates optical density from the transmittance of the sample relative to a reference ■ Continuous measurement at arbitrary intervals is possible ■ Supports various options and custom specifications *For more details, please refer to the PDF document or feel free to contact us.

• Analytical Equipment and Devices

The "RR8-LED-2000/12000" can automatically evaluate the light distribution characteristics, total luminous flux, chromaticity characteristics, and electrical characteristics of LED lighting, various light sources, planar light emission, and spotlights. The Topcon spectroradiometer is JCSS calibrated, and the calculations comply with JIS standards. Additionally, by removing the illuminance adapter, it is possible to measure brightness over a wide dynamic range (0.0005 to 5,000,000 cd/m²). 【Features】 ■ Real-time display capability ■ Calibration using the customer's standard light source is also possible ■ Complies with JIS C8105-5 light distribution measurement methods ■ Capable of outputting IES light distribution data compatible with lighting design software ■ Supports various options and custom specifications *For more details, please refer to the PDF document or feel free to contact us.

• Analytical Equipment and Devices

The "SR10-LT" is an LED lighting and quantity measurement system that can evaluate the number of LEDs and their brightness on a circuit board, with real-time display capabilities. In addition to measuring the number of LEDs on the circuit board without lighting them, it also allows for automatic measurement inline. It supports various options and custom specifications, including LED position detection and shape detection through image recognition, as well as determining the presence of parts such as connectors. 【Features】 ■ Real-time display capability ■ Ability to measure the number of LEDs on the circuit board without lighting them ■ Automatic measurement inline ■ Ability to register shapes of various types through teaching ■ Supports various options and custom specifications *For more details, please refer to the PDF document or feel free to contact us.

• Analytical Equipment and Devices

The "PP8" is a polarization characteristic measurement system that can automatically evaluate polarization degree, polarization spectrum, transmittance, color characteristics, and more, with real-time display capabilities. It supports various options and custom specifications, including fixtures tailored to samples and UV measurements for UV-A and UV-B. With comprehensive software, it supports the development and evaluation of LED modules, devices, and more. 【Features】 ■ Automatically evaluates polarization spectrum and color characteristics ■ Real-time display capability ■ Supports various options and custom specifications ■ Assists in the development and evaluation of LED modules, devices, etc. *For more details, please refer to the PDF materials or feel free to contact us.

• Analytical Equipment and Devices

The "LL8-LED(-500)" allows for highly correlated measurements with an integrating sphere by installing multiple optical fibers on a hemisphere. Due to the distance between the LED light-emitting surface and the measurement unit, high workability is achieved, and installation to an automatic transport system is also easy. It features OK and NG judgment functions, making it suitable for use in processes. It also has measurement data storage and reading functions, supporting the development and evaluation of LEDs with comprehensive software. 【Features】 ■ Enables highly correlated measurements with an integrating sphere ■ Easy installation to an automatic transport system ■ Supports LED development and evaluation with comprehensive software ■ Hemisphere sizes can accommodate small to large, from 0.1m to several meters ■ Capable of evaluating all-lit images and more *For more details, please refer to the PDF document or feel free to contact us.

• Analytical Equipment and Devices

The "LL8" is an LED integrating sphere measurement system that can automatically evaluate optical, temperature, and electrical characteristics, with real-time display capabilities. It uses a standard calibration light source compliant with U.S. NIST, and the calculations adhere to JIS standards. With comprehensive software that includes features like graph overlay and statistical processing, it supports the development and evaluation of LED devices. 【Features】 ■ Automatic evaluation of optical, temperature, and electrical characteristics ■ Real-time display capability ■ Uses a standard calibration light source compliant with U.S. NIST ■ Calculations adhere to JIS standards ■ Supports various options and custom specifications *For more details, please refer to the PDF document or feel free to contact us.

• Analytical Equipment and Devices