Electronic Components and Semiconductors

アイテス

EstablishmentJanuary 1, 1993
capital3000Ten thousand
number of employees106
addressShiga/Otsu-shi/1-60 Kuribayashi Town
phone077-599-5015
last updated：
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316～357 item / All 357 items

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Wafer processing

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[Data] Examples of Defects and Analysis of Solar Cells

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The nature of analysis techniques, including defect analysis of joints, adhesion, and assembly parts.

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[Data] Ion Migration Evaluation Test

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Component Analysis: GC-MS Gas Chromatography Mass Spectrometer

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[Cheetah EVO Case Study] Observation of IC Type Coils

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[Cheetah EVO Case Study] Observation of Inductor Coils (Orthogonal CT Observation)

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X-ray fluoroscopy and CT scanner 'Cheetah EVO'

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Industrial PC Repair

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[Electronic Equipment Repair] Servo Amplifier and Servo Motor

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Electronic Device Repair: Panel Computer

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Total Support Service for Reliability

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Total support service for chemical analysis

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Total support service for cross-section grinding, processing, observation, and analysis.

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CIS Adapter Solamente-Link SC-200 Product Catalog

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Z/iS Integration Kit Solamente-Link SR-200 Product Catalog

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Solar Panel Checker Solamente-iS SI-200 Product Catalog

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String Checker Solamente SZ-200 Product Catalog

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Wafer processing service

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Solar Cell EL Image Measurement Device "PVX330"

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EL/PL Imaging Device PVX1000+POPLI-Octa

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PL Imaging Unit POPLI-3C

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Aites Industrial Equipment Repair Service

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Computer repair for corporations and businesses.

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Total solution service for power devices

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Total support service for LED.

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Total solution service for FPD

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Aites Device List

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品質技術トータルソリューションサービスの表紙画像です

Total Quality Technology Solutions

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Total solutions for the reliability of semiconductor products.

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Total solution for the reliability of LCD displays.

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Failure analysis of power devices

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Analysis of electronic components and materials using TEM.

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Analysis of the assembly joints of the implemented components

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Cross beam FIB cross-sectional observation

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Introduction to Reliability Assurance Services

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ラッチアップ試験受託サービスの表紙画像です

Latch-up test contract service

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常時測定信頼性評価試験サービスの表紙画像です

In-Situ Continuous Measurement Reliability Evaluation Testing Service

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Overseas parts and products evaluation service

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Analysis of microscopic foreign substances using imaging FT-IR.

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Sampling techniques for micro foreign object analysis

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TOF-SIMS analysis

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