Electronic Components and Semiconductors

Added to bookmarks
Bookmarks list

Bookmark has been removed
Bookmarks list

You can't add any more bookmarks

By registering as a member, you can increase the number of bookmarks you can save and organize them with labels.
Free membership registration

アイテス

EstablishmentJanuary 1, 1993

capital10000Ten thousand

number of employees92

addressShiga/Otsu-shi/1-60 Kuribayashi Town

phone077-599-5015

last updated：Jul 02, 2025

Contact this company
Contact Us Online

アイテス List of Catalogs

136～180 item / All 349 items

Displayed results

Measurement of solder crack rate by cross-sectional observation.

Product catalog

Contact this catalog

Oblique CT observation of the laminated substrate

Product catalog

Contact this catalog

FT-IR analysis of polyethylene

Product catalog

Contact this catalog

Evaluation of distortion and birefringence of products/materials by WPA.

Product catalog

Contact this catalog

Observation of diamond clarity

Other documents

Contact this catalog

X-ray observation of electrolytic capacitors

Other documents

Contact this catalog

[Example of TOF-SIMS] Analysis of Li

Technical data・examples

Contact this catalog

Identification of failure points in electronic components through thermal analysis.

Product catalog

Contact this catalog

Structural analysis of nylon 6.10

Product catalog

Contact this catalog

Pigment and polymer analysis using MALDI-TOFMS.

Product catalog

Contact this catalog

[Information] We will solve the cause of the issue from a chemical perspective.

Other documents

Contact this catalog

[Data] IR Analysis of Vinyl Polymers (Resin Materials)

Product catalog

Contact this catalog

Simple measurement of band gap using XPS.

Product catalog

Contact this catalog

Authenticity investigation (comparative observation)

Product catalog

Contact this catalog

[Data] Degradation Analysis of Polarizing Film and Light Diffusing Film

Other documents

Contact this catalog

[Data] FT-IR Analysis of Transparent Resin

Other documents

Contact this catalog

Analysis of polymerization initiators in light-curing resins.

Product catalog

Contact this catalog

[Data] Structural Analysis of MEMS Components

Other documents

Contact this catalog

[Data] EPMA Analysis Example 2

Other documents

Contact this catalog

Surface Analysis Guide

Product catalog

Contact this catalog

Surface analysis of discolored and altered materials using XPS (ESCA).

Other documents

Contact this catalog

[Example of analysis using EBSD] Silicon wafer

Technical data・examples

Contact this catalog

FE-SEM observation (Crystal grain observation of Al wire bonding section)

Product catalog

Contact this catalog

Evaluation of BGA/CSP solder

Other documents

Contact this catalog

We handle everything from reliability testing of materials to chemical analysis.

Technical data・examples

Contact this catalog

Melt Flow Rate (MFR) Measurement Evaluation Service

Technical data・examples

Contact this catalog

Regarding the curing temperature of epoxy resin during sample encapsulation.

Technical data・examples

Contact this catalog

Cross-sectional observation by SEM: Connector plating

Technical data・examples

Contact this catalog

[Data] Analysis of SEG-LCD Panel Display Malfunction

Other documents

Contact this catalog

[Data] ICP Emission Spectroscopy (ICP-AES)

Other documents

Contact this catalog

[Data] Colorimetric evaluation of resin's color system and transmittance using a color difference meter.

Other documents

Contact this catalog

[Information] Whisker Observation - Tips for Observing Flat Whiskers

Other documents

Contact this catalog

[Data] Example of EPMA Analysis

Other documents

Contact this catalog

The Flow of Chemical Analysis

Specification document

Contact this catalog

SoraMente・eSoraMente Calibration and Inspection Service Catalog

Product catalog

Contact this catalog

eSoraMente eZ-10, Current Sensor eA-10 Product Catalog

Product catalog

Contact this catalog

String Checker Solamente-Z SZ-1000 Product Catalog

Product catalog

Contact this catalog

[Data] Reliability testing, haze measurement, and IR analysis set menu service

Other documents

Contact this catalog

[Data] Analysis of Polymer Structural Changes

Other documents

Contact this catalog

[Data] Analysis of PTP packaging sheets by EGA-MS analysis and thermal desorption/pyrolysis GC-MS analysis.

Other documents

Contact this catalog

[Data] Transmittance measurement service using a self-recording spectrophotometer

Other documents

Contact this catalog

Basic Analysis Methods for Things that are Similar yet Different

Other documents

Contact this catalog

Changes due to differences in acceleration voltage during EDX analysis.

Other documents

Contact this catalog

Reliability testing of materials and chemical analysis evaluation after testing.

Technical data・examples

Contact this catalog

Seven spectral crystals in EPMA analysis

Technical data・examples

Contact this catalog

Prev 1 2 3 4 5...8 Next