Electronic Components and Semiconductors

アイテス

EstablishmentJanuary 1, 1993
capital10000Ten thousand
number of employees92
addressShiga/Otsu-shi/1-60 Kuribayashi Town
phone077-599-5015
last updated：
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アイテス List of Catalogs

46～90 item / All 349 items

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Evaluation of pore distribution in non-woven fabric sheets

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Dynamic SIMS

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Tensile test

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Derivatization for GC/MS analysis

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Case study of failure analysis of oxide-based all-solid-state batteries.

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Analysis of mica sheet adhesive components using GC/MS.

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Comparison of Infrared Spectroscopy and Raman Spectroscopy

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Composition analysis of raw materials for all-solid-state batteries.

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Analysis of good quality overseas manufactured LCD displays

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Foreign substance analysis and component analysis: Comparison of micro-Raman and FTIR.

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Dynamic viscoelasticity measurement of polyurethane rubber

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Contribution to the SDGs: Comparative Analysis of Materials/Recycled Raw Materials

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Continuous current test of multilayer ceramic capacitors

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Pressure Repeated Test

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The relationship between materials and heat - Introduction to thermal analysis

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Evaluation of brightness and color uniformity of LCD displays

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Accelerated Weathering Test <Xenon Weather Meter>

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Examples of observing intermetallic compounds through etching treatment.

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Identification of natural components by GCMS

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Measurement of the transformation temperature of shape memory alloys

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Condensation cycle test

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Spectral Radiance and Chromaticity Evaluation of Liquid Crystal Displays

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Solder Heat Resistance Test (SMD)

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Analysis of defects in overseas manufactured displays

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Analysis of trace metal elements in liquid crystals

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Analysis of film property changes due to UV irradiation

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Reverse bias test of power devices (up to 2000V)

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Surface observation of IC chips implemented on LCD panels.

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Analysis of impurities in organic solvents

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Analysis of fragrance components by GC-MS

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Cross-sectional hardness of aluminum welds (spot welding)

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Roundness / Circularity Measurement

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Material evaluation using a ultra-micro hardness tester.

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String Checker SZ-200 Product Catalog

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Solar Panel Checker Solamente-iS SI-200 Product Catalog

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Z/iS Integration Kit Solamente-Link SR-200 Product Catalog

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CIS Adapter Solamente-Link SC-200 Product Catalog

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EL/PL Imaging Device PVX1000+POPLI-Octa

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PL Imaging Unit POPLI-3C

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Solar Cell EL Image Measurement Device "PVX330"

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Wafer processing service

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Measurement of inorganic particle size using dynamic light scattering method.

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Analysis of Liquid Crystal Display Materials

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Measurement examples of DSC (Differential Scanning Calorimetry)

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One-shot 3D shape measuring device "VR-6200"

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