Electronic Components and Semiconductors

アイテス

EstablishmentJanuary 1, 1993
capital3000Ten thousand
number of employees106
addressShiga/Otsu-shi/1-60 Kuribayashi Town
phone077-599-5015
last updated：
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Analysis of trace metal elements in liquid crystals

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Analysis of film property changes due to UV irradiation

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Reverse bias test of power devices (up to 2000V)

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Surface observation of IC chips implemented on LCD panels.

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Analysis of impurities in organic solvents

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Analysis of fragrance components by GC-MS

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Cross-sectional hardness of aluminum welds (spot welding)

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Roundness / Circularity Measurement

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Material evaluation using a ultra-micro hardness tester.

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String Checker SZ-200 Product Catalog

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Solar Panel Checker Solamente-iS SI-200 Product Catalog

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Z/iS Integration Kit Solamente-Link SR-200 Product Catalog

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CIS Adapter Solamente-Link SC-200 Product Catalog

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EL/PL Imaging Device PVX1000+POPLI-Octa

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PL Imaging Unit POPLI-3C

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Solar Cell EL Image Measurement Device "PVX330"

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Wafer processing service

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Measurement of inorganic particle size using dynamic light scattering method.

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Analysis of Liquid Crystal Display Materials

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One-shot 3D shape measuring device "VR-6200"

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Raman spectroscopy service for minerals in rocks

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Announcement of the Introduction of FIB-SEM Helios 5 UC

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[Data] Measurement of the birefringence of laminate film

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[Data] GC-MS analysis by solvent extraction

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Introduction to Section Processing and Observation Methods

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[Data] Measurement of resin molecular weight by high-temperature GPC (SEC)

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[Data] Analysis and evaluation of organic materials and polymer materials.

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[Information] GC-MS Analysis Device Guide

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[Example of TOF-SIMS] Wide-area image map

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Replacement service from CRT Monitor to LCD Display

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3D construction through mechanical grinding

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[Analysis case by EDS] Bonding interface of Cu pad

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Energy Dispersive X-ray Spectroscopy (EDS)

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Reuse Checker RUC-100

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Raman analysis of carbon materials

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[Data] Analysis of Additive Defects in Polymers Using Thermal Desorption GC-MS

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[Information] Differentiating Between Optical Microscopes and SEM

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[Data] Degradation Analysis of Polycarbonate by Reaction Thermal Decomposition

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[Case of EBSD] Comparison of two brass materials

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Comparison Analysis of HDPE and LDPE

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Screening analysis of phthalate esters

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Quantitative analysis of low molecular weight siloxanes

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Thermal shock test

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Ultrasonic Microscope 'SAM'

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[Data] Verification of overlap degree and molecular weight differences through IR analysis.

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