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エフケー光学研究所

addressSaitama/Niiza-shi/1-13-4 Nakano
phone048-482-6910
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last updated:Jun 10, 2019
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Foreign Object Inspection Device for Separator Sheet Inspection of Secondary Batteries, etc.

A wavelength-selective inspection device that switches to light (wavelength) suitable for inspection! It is compatible with the inspection of separator films for secondary batteries and more!

The FK Optical Research Institute's foreign matter inspection device is a wavelength-selective inspection device that switches to the optimal light (wavelength) for inspection based on the sample being inspected. It can uniformly illuminate at any wavelength. The optical design sufficiently suppresses stray light noise components for the inspection imaging sensor. Additionally, we offer a rich lineup that can be optimized for your production line configuration. 1. It performs inspections on film-like sheets and substrates transported by roll-to-roll or conveyor systems. 2. It inspects for fine pinhole defects and foreign matter adhered to the surface. 3. Depending on the material after film coating, it can also detect defects such as streaks in the coating application. *For more details, please refer to the PDF materials or feel free to contact us.

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Wavelength-selective foreign matter inspection device

This is a wavelength-selective inspection device that switches to the optimal light (wavelength) for the inspection according to the sample being tested. A rich lineup tailored to the line configuration!

The FK Optical Research Institute's foreign matter inspection device is a wavelength-selective inspection device that switches to the optimal light (wavelength) for inspection based on the sample being inspected. It can uniformly illuminate at any wavelength. The optical design sufficiently suppresses stray light noise components for the inspection imaging sensor. Additionally, we offer a rich lineup that can be optimized for your production line configuration. 1. Area type that inspects glass substrates placed on the inspection stage using multiple area sensors. 2. Scan type that inspects glass substrates placed on the inspection stage by moving the foreign matter inspection machine to scan. 3. Conveyor type that inspects foreign matter on the surface of glass substrates being transported on a conveyor. 4. Backside foreign matter inspection type that inspects foreign matter on the underside of glass substrates being transported on a conveyor. *For more details, please refer to the PDF materials or feel free to contact us.

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Lens assembly adjustment and inspection device 'MPro/DSC-E1UW series'

Mass production of 4K/8K compatible lenses! Assembly adjustment and pass/fail judgment based on MTF measurement values, as well as focal length inspection, etc.

Our company, which specializes in the manufacturing of lens design and laser interferometers, handles inspection equipment for lens production sites. The assembly adjustment and inspection MTF device 'MPro-RA' allows for real-time verification of finite distance measurement, inverse projection, and left-right balance, enabling assembly adjustments and pass/fail judgments based on MTF measurement values. With the spread of 4K/8K lenses, we contribute to improving efficiency and yield in increasingly advanced lens production environments. ★ We also offer a lineup for zoom lenses, small lenses, and more. You can view the catalog of our products by downloading the PDF. 【Products Offered】 ■ Assembly adjustment and inspection MTF device 'MPro-RA' ■ MTF inspection device for zoom lenses 'MPro-ZM' ■ Flange back focal length inspection device 'MPro-FBFL' ■ MTF inspection device for small lenses 'DSC-E1UW' *For more details, please refer to the PDF materials or feel free to contact us.

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Foreign Object Inspection Device

Reduce the inspection dead zone area to the limit! It captures even small foreign objects with low brightness.

We offer several types of "foreign object inspection devices" so that you can choose according to your production line configuration. Our product has significantly less inspection dead zone compared to other companies' foreign object inspection machines, and it has a wide detection range. Additionally, it features unique camera placement and inspection light sources, allowing it to detect even small foreign objects with low brightness. 【Features】 ■ Significantly less inspection dead zone compared to other companies' foreign object inspection machines, with a wide detection range ■ Capable of detecting even small foreign objects with low brightness ■ Light source wavelength can be switched for various types of substrates ■ Inspection dead zone can be minimized to the extreme *For more details, please refer to the PDF materials or feel free to contact us.

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  • Inspection robot

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Camera Module Assembly Device 'MD-60AA Series'

Automating functions from high-precision multi-axis focusing, tilting, alignment, to bonding!

The "MD-60AA Series" is an assembly device that automates high-precision multi-axis focusing, tilting, alignment, and adhesion, enabling camera module correction. It is suitable for mass production of camera modules for a wide variety of applications, covering a maximum FOV (Field of View) of 180°. By performing high-precision multi-axis adjustments based on MTF calculation results, it achieves high image quality and supports the assembly of image modules for diverse applications. 【Features】 ■ FOV 165° (MAX 180°) - Optimal image quality is achieved through alignment across the full FOV (entire field of view). ■ Adjustment of image area - Easy modification of the test area with an adjustable collimator. ■ Adaptation to different object distances - Adjusted for infinity focus. - BFLOffset is adjusted according to the object distance. ■ Accuracy and efficiency - Alignment is performed by measuring image quality across the entire FOV to obtain the optimal image plane. *For more details, please refer to the PDF document or feel free to contact us.

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Optical microscope transmission phase-shift laser interference microscope

Optical microscope transmission phase-shifting laser interference microscope

This is a new type of microscope positioned above conventional optical microscopes, capable of measuring refractive index distribution and thickness structure quickly and quantitatively, and visualizing it in three dimensions. 【Features】 ○ By applying laser interference methods, it can non-contact measure the refractive index and height of samples. ○ High speed… measurement time is a few seconds ○ High precision… phase measurement accuracy ±(1/150) λ, refractive index difference measurement accuracy ±0.0001, height measurement accuracy ±0.2μm ○ Spatial resolution… equivalent to optical microscopes ● For more details, please contact us or download the catalog.

  • Optical microscope

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LCD substrate inspection device G10 inspection device

LCD substrate inspection device G10 inspection device

This is a device for detecting fine foreign substances adhered to a liquid crystal substrate that is adsorbed on a high-precision XY stage. [Features] We devised unique lighting to eliminate dead zones and minimize noise. ● For more details, please contact us or download the catalog.

  • Circuit Board Inspection Equipment

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