Testing, Analysis and Measurement

一般財団法人材料科学技術振興財団　MST

EstablishmentAugust 1, 1984
addressTokyo/Setagaya-ku/Kitaomi 1-18-6
phone03-3749-2525
last updated：
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316～360 item / All 671 items

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[Analysis Case] Element Analysis of Wire Bonding Interface_C0486

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[Analysis Case] Evaluation of Si-based IGBT Chip Cross-section by Low-Temperature Micro Photoluminescence Analysis_C0485

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[Analysis Case] Evaluation of Interstitial Carbon in Si Substrate by Low-Temperature PL and SIMS Analysis_C0481

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[Analysis Case] De-gassing Analysis of Hydrogen Terminal Wafers_C0483

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[Analysis Case] Quantitative Analysis of the Sugar Composition of Fucoidan_C0471

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[Analysis Case] Evaluation of Nitrogen Substitution Positions in Nitrogen-Doped Carbon Materials for Fuel Cells, etc. C0484

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[Analysis Case] In-plane film thickness evaluation of Au thin film on wafer using XRF_C0480

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[Analysis Case] Evaluation of Gold Thin Film Adhesion on Wafer by XRF_C0479

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[Analysis Case] Local Structure Analysis of Aluminum Oxide Thin Film_C0478

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[Analysis Case] Atomic Resolution Analysis of Lithium-Ion Secondary Battery Cathode Materials_C0475

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[Analysis Case] Observation of Hair Surface Microstructure by AFM_C0474

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[Analysis Case] Evaluation of Pharmaceutical Crystal Polymorphism_C0473

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[Analysis Case] Evaluation of Ion Implantation Damage in GaN by XAFS_C0472

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[Analysis Case] Analysis of Nonylphenol Ethoxylates in Fibers_C0470

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[Analysis Case] Analysis of Organic Fluorine Compounds (PFOS, PFOA, etc.) _C0469

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[Analysis Case] Evaluation of Coating Film on Injection Needle Surface_C0468

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Protein Shotgun Analysis_B0235

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[Analysis Case] Evaluation of Transdermal Absorption of Indomethacin in Three-Dimensional Cultured Human Skin_C0467

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[Analysis Case] Metal Contamination Analysis in SiN Film_C0465

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Metal Contamination Analysis of Si Wafer Surface_B0233

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[Analysis Case] Peptide Sequence Analysis by LC/MS/MS_C0466

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[Analysis Case] Degassing Evaluation of Plating Sample_C0464

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Typical materials and purpose-specific TDS analysis example_B0232

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[Analysis Case] Band Gap Evaluation of Oxidized and Nitrided Thin Films_C0462

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[Analysis Case] Evaluation of Organic Contamination of Wafers in Wafer Cases_C0461

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Analysis of Trace Metal Elements in the Environment_B0231

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[Analysis Case] Evaluation of "Water" in Quartz and Glass by SIMS_C0460

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[Analysis Case] Metal (Sn) Thermal Desorption Gas Analysis_C0458

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[Analysis Case] Structural Analysis of Tape Adhesive by GC-MS_C0459

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[Analysis Case] Qualitative Analysis of Organometallic Complexes under Atmosphere Control_C0457

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[Analysis Case] Evaluation of the Chemical State of RuO2 Catalyst by in-situ XAFS_C0456

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[Analysis Case] Evaluation of Metal Valence under Atmosphere and Temperature Control for PtRu Catalyst Used in Fuel Cells (in-situ XAFS) _C0455

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[Analysis Case] Micro Beer Image Analysis_C0454

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[Analysis Case] Evaluation of Carrier Density Distribution of Si-IGBT Chip_C0443

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[Analysis Case] Evaluation of Cu Surface Discoloration Using AES and SEM-EDX_C0451

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Gas Emission Analysis by EGA-MS Method_B0229

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Evaluation of Organic Contamination Using a Wafer Analyzer with GC-MS_B0230

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[Analysis Case] Thermal Desorption Gas Analysis of Organic Film (TDS) _C0452

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[Analysis Case] Estimation of Detachment Components by TDS_C0453

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[Analysis Case] TDS Analysis of Glass Sample_C0378

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[Analysis Case] Qualitative and Imaging Analysis of Micro Areas by TOF-SIMS_C0449

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[Analysis Case] TOF-SIMS Analysis of Solder Peel-off Section_C0450

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[Analysis Case] Structural Analysis of Epoxy Resin_C0448

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[Analysis Case] Identification of Crystal Structure and Calculation of Composition Ratio of HfZrOx Film_C0447

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[Analysis Case] Composition Evaluation of Nozzle Surface and Inner Wall_C0446

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