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  1. Home
  2. Testing, Analysis and Measurement
  3. 日本カンタム・デザイン
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Testing, Analysis and Measurement
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日本カンタム・デザイン

EstablishmentOctober 13, 2010 *Founded July 1, 1997
capital6000Ten thousand
number of employees30
addressTokyo/Toshima-ku/2nd Floor, Fujita Building, 1-11-16 Nishii Ikebukuro, Takamatsu
phone03-5964-6620
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last updated:Nov 07, 2023
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日本カンタム・デザイン Product Lineup

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Nanotechnology Nanotechnology
Commissioned measurement Commissioned measurement
Life Science Life Science
Quality Management - Process Monitor Quality Management - Process Monitor
Semiconductors and Electronics Semiconductors and Electronics
Materials Science Business Materials Science Business
Magnetic properties and physical property measurement Magnetic properties and physical property measurement
Semiconductors

Semiconductors and Electronics

It is a product related to semiconductor manufacturing and development.

Compact LED Direct Drawing Device "Micro Writer ML Family"

Compact tabletop! A maskless LED direct drawing device that enables high-speed pattern prototyping.

The "Micro Writer ML Family" from Japan Quantum Design is a compact, desktop LED direct drawing device that enables high-speed pattern prototyping without the need for masks. It allows for quick prototyping of small patterns without the hassle of creating masks each time a pattern is made. It is capable of directly drawing on photoresist using LEDs. 【Features】 ■ Compact desktop size (base area 70cm x 60cm) ■ Enables high-speed pattern prototyping ■ Eliminates the need for mask creation each time ■ Capable of direct LED drawing on photoresist *For more details, please refer to the PDF materials or feel free to contact us.

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Atomic Force Microscope (AFM)

Introduction of atomic force microscopes (AFM) capable of proposing customized solutions for various systems, from research use to production sites.

Our company offers a user-friendly atomic force microscope (AFM) that allows for easy and quick measurement of surface shapes. We have a lineup of models including the "CoreAFM," which features an active vibration isolation mechanism and supports a variety of measurement modes, and the compactly designed "NaioAFM," which allows for smooth cantilever replacement using dedicated tools. Customization options are available, ranging from small models for research environments to large stage models for production sites, as well as automated systems for quality control. 【Lineup (excerpt)】 ◎ Desktop Atomic Force Microscope "CoreAFM"  ■ Equipped with active vibration isolation and wind protection  ■ Capable of supporting 32 types of measurement options ◎ Compact Atomic Force Microscope "NaioAFM"  ■ Integrates controller, XY stage, wind protection, and vibration isolation  ■ Equipped with a high-resolution top-view optical camera *We are currently distributing a catalog summarizing the scanning probe microscopes we handle. Detailed information can be viewed via "PDF Download."

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High-resolution Fourier-transform infrared spectrometer nano-FTIR

Infrared imaging and spectroscopic measurements are possible, achieving a spatial resolution of 10 nm.

The nano-FTIR【neaSCOPE】 manufactured by attocube systems is a Fourier-transform infrared spectrometer that performs spectral imaging and spectral measurements with a maximum resolution of 10nm. Using patented technology, it extracts only the infrared spectrum from scattered light, achieving a spatial resolution of 10nm. The excitation wavelengths range from visible to terahertz, supporting further exploration in material science. It is ideal for various fields that require higher spatial resolution, including scientific disciplines, semiconductor technology, polymer chemistry, and life sciences. 【Features】 ■ Patented background noise removal technology by attocube systems ■ Achieves imaging and spectral measurements with high spatial resolution of 10nm ■ Developed a dedicated AFM that enables high reproducibility and high-sensitivity detection ■ Allows measurement of bulk cross-sections with sample preparation suitable for AFM measurements ■ No need for sample thinning! For more details, please contact us.

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[Proposal for the Semiconductor Field] Surface Inspection Equipment and Resist

We will propose solutions in the semiconductor field, which we specialize in, tailored to our customers' needs!

In addition to our expertise in nano-order surface analysis equipment, we also propose resist solutions and maskless exposure devices for semiconductor processes.

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