Ellipsometer - 企業ランキング(全4社)
更新日： 集計期間:Jul 23, 2025〜Aug 19, 2025
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|---|---|---|---|
| 製品画像・製品名・価格帯 | 概要 | 用途/実績例 | |
| *Technical materials introducing measurement principles, measurement examples, and analysis processes are currently available. You can view them via "PDF Download." *Demonstrations can also be conducted. **About Spectroscopic Ellipsometry** In spectroscopic ellipsometry, appropriate optical models are applied to the measurement data (Δ, ψ) across the entire wavelength range for analysis. As a result of the analysis, the film thickness, refractive index, and extinction coefficient of each layer can be obtained. Film thickness can be measured from sub-nanometers and exhibits excellent reproducibility. It is widely used for inspecting the optical properties of multilayer thin films and materials. *For more details, please feel free to contact us. | 【Application Examples】 There are a very large number of achievements in areas such as semiconductors, displays, solar cells, bio-related fields, and nanotechnology. *We have a free catalog available. Please feel free to download it or contact us.* | ||
| 【Other Published Content】 ■ About Optical Interference ■ Analytical Approach ■ Analytical Process ■ Measurement Result Images ■ Contact Information *For more details, please refer to the PDF document or feel free to contact us. | For more details, please refer to the PDF document or feel free to contact us. | ||
| 【Rich Product Variations】 ○ Research and development applications ○ Automatic measurement of large panels ○ Roll-to-roll measurement ○ FTIR option ○ Optical porosity ○ Pore distribution measurement, and various other products are available. 【Spectroscopic Ellipsometer for Thin Film Solar Cells】 ○ Amorphous silicon ○ Microcrystalline silicon ○ CIGS ○ CdTe ○ DSSC ○ Measurement of optical properties of organic materials, etc. ○ ITO films 【Measurable Physical Properties】 ○ Film thickness and optical refractive index (n, k) ○ Refractive index gradient and material composition 【Applications】 ○ Semiconductors ○ Silicon, organic, compound semiconductors ○ Solar cells ○ Organic EL ○ LEDs ○ Polymers ○ Flat panel displays (FPD) ○ Medical, bio ○ PET films ○ Fuel cells ○ Graphene 【Specifications】 ○ Wavelength range: 190nm-2400nm ○ Measurement speed: Full wavelength range 1 second～ 【Options】 ○ FTIR ○ Porosimeter ○ Microspot ○ Compensator ○ Automatic mapping stage ○ Sheet resistance ○ Reflectance meter ○ Raman spectroscopy ○ Transmittance meter Please feel free to contact us for specifications and pricing. | We have a very strong track record in semiconductors, solar cells, and flat panel displays. *We have a free catalog available. Please feel free to download it or contact us. | ||
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日本セミラボ 新横浜本社
![[Technical Information] Measurement Principle of Spectroscopic Ellipsometry - What is Polarization? *Materials Available](https://image.mono.ipros.com/public/product/image/198/2000535112/IPROS52522148809647465380.png?w=280&h=280)
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- 代表製品
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Rotational Compensation Type Spectroscopic Ellipsometer 'SE-2000' *Seminar Held
- 概要
- *Technical materials introducing measurement principles, measurement examples, and analysis processes are currently available. You can view them via "PDF Download." *Demonstrations can also be conducted. **About Spectroscopic Ellipsometry** In spectroscopic ellipsometry, appropriate optical models are applied to the measurement data (Δ, ψ) across the entire wavelength range for analysis. As a result of the analysis, the film thickness, refractive index, and extinction coefficient of each layer can be obtained. Film thickness can be measured from sub-nanometers and exhibits excellent reproducibility. It is widely used for inspecting the optical properties of multilayer thin films and materials. *For more details, please feel free to contact us.
- 用途/実績例
- 【Application Examples】 There are a very large number of achievements in areas such as semiconductors, displays, solar cells, bio-related fields, and nanotechnology. *We have a free catalog available. Please feel free to download it or contact us.*
![[Technical Information] Measurement Principle of Spectroscopic Ellipsometry - What is Polarization? *Materials Available](https://image.mono.ipros.com/public/product/image/198/2000535112/IPROS52522148809647465380.png?w=64&h=64)
[Technical Information] Measurement Principle of Spectroscopic Ellipsometry - What is Polarization? *Materials Available
- 概要
- 【Other Published Content】 ■ About Optical Interference ■ Analytical Approach ■ Analytical Process ■ Measurement Result Images ■ Contact Information *For more details, please refer to the PDF document or feel free to contact us.
- 用途/実績例
- For more details, please refer to the PDF document or feel free to contact us.
Spectroscopic Ellipsometer GES5E
- 概要
- 【Rich Product Variations】 ○ Research and development applications ○ Automatic measurement of large panels ○ Roll-to-roll measurement ○ FTIR option ○ Optical porosity ○ Pore distribution measurement, and various other products are available. 【Spectroscopic Ellipsometer for Thin Film Solar Cells】 ○ Amorphous silicon ○ Microcrystalline silicon ○ CIGS ○ CdTe ○ DSSC ○ Measurement of optical properties of organic materials, etc. ○ ITO films 【Measurable Physical Properties】 ○ Film thickness and optical refractive index (n, k) ○ Refractive index gradient and material composition 【Applications】 ○ Semiconductors ○ Silicon, organic, compound semiconductors ○ Solar cells ○ Organic EL ○ LEDs ○ Polymers ○ Flat panel displays (FPD) ○ Medical, bio ○ PET films ○ Fuel cells ○ Graphene 【Specifications】 ○ Wavelength range: 190nm-2400nm ○ Measurement speed: Full wavelength range 1 second～ 【Options】 ○ FTIR ○ Porosimeter ○ Microspot ○ Compensator ○ Automatic mapping stage ○ Sheet resistance ○ Reflectance meter ○ Raman spectroscopy ○ Transmittance meter Please feel free to contact us for specifications and pricing.
- 用途/実績例
- We have a very strong track record in semiconductors, solar cells, and flat panel displays. *We have a free catalog available. Please feel free to download it or contact us.
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日本セミラボ 新横浜本社
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