Verification methods and latest trends in electromigration.

As the miniaturization of electronic devices progresses, electromigration has become a significant issue of concern. This phenomenon occurs when high current density is applied to metal wiring, causing atoms to move and leading to a decline in device performance or failure. Since this phenomenon directly affects the lifespan and reliability of electronic devices, it is not an exaggeration to say that verification methods are a crucial technology. I will explain the overview of verification methods and the latest technological trends as of February 2025.
1. Verification Methods
(1) Experimental Techniques
(2) Simulation Technologies
2. Latest Trends
(1) Development of New Materials
(2) Utilization of Sputtering Thin Film Technology
(3) Innovations in Miniaturization Processes
(4) Application of AI and Machine Learning
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