TECHNO-FRONTIER 2026 "39th EMC and Noise Control Technology Exhibition"

Flagship model of the EMI test receiver.

R&S ESW offers three models that cover frequency ranges from 2 Hz to 8 GHz / 26.5 GHz / 44 GHz. It also comes standard with high-speed FFT time-domain scanning that fully complies with CISPR16-1-1. By using time-domain scanning, parallel measurements with two types of CISPR detectors are possible. Additionally, various measurement modes such as spectrogram function, real-time spectrum analysis, and IF analysis can be utilized. The spectrogram function continuously displays the analyzed spectrum against time, allowing for the visualization of rapidly changing interference signals. Furthermore, the real-time spectrum analysis has an 80 MHz real-time bandwidth, and by combining it with afterglow display mode and frequency mask trigger functions, it becomes easy to capture noise signals hidden beneath major signals.

• EMC Testing

A must-see for those considering the introduction of 3D printers! If you want to hear about practical examples, please take a look. ------ In recent years, 3D printers have been increasingly utilized in various fields such as prototype development, jig manufacturing, and small-lot production. However, many may have questions such as, "How does the printing process work?", "How can we utilize it in our company?", and "Which model should we choose?" This seminar will clearly introduce the basics of 3D printers as well as actual case studies. It is recommended not only for those who are considering the introduction of 3D printers but also for those who are already using them and want to expand their applications. ----- ◆ Recommended for: - Those considering the introduction of a 3D printer - Those who want to know the basic mechanisms of 3D printers - Those looking to improve efficiency in prototyping or jig manufacturing - Those who want to reference case studies from other companies - Those searching for a suitable 3D printer for their company Even if you cannot watch it in real-time, you can view the recorded session for one week after the event. We sincerely look forward to your participation! *This seminar will be held in an online format using Zoom.

The particle visualization technology developed under our brand "ViEST" has a very high level of detection sensitivity, capable of visualizing the suspended or adhered states of micro and nano-sized particles in real time. We are engaged in the sale of visualization systems and contract services for evaluation (investigating particles and airflow in production processes, inside and outside manufacturing equipment, evaluating the performance of cleaning products, proposing yield improvement measures, etc.) both domestically and internationally. In manufacturing environments, invisible fine foreign substances, dust generation, particle adhesion due to static electricity, and airflow disturbances can cause quality defects and reduced yield. Our company clarifies these contamination factors through visualization technology and provides consistent support from identifying the source of the problem to considering and confirming improvement measures. Do you have any of the following concerns? - Unable to identify the cause of foreign matter contamination - Want to check airflow and cleanliness in clean rooms - Want to understand dust generation from manufacturing equipment and transport systems - Want to reduce particle adhesion to films and substrates - Want to improve contamination that leads to reduced yield

[Lecturers] KPMG Consulting Co., Ltd. Executive Officer, Partner Kazushige Ikeda KPMG Consulting Co., Ltd. Technology Consulting Senior Consultant Kakeru Ota [Key Lecture Content] In recent years, AI has evolved beyond information processing in digital spaces, such as text generation and image recognition, to become Physical AI that perceives, judges, and acts in the real world by connecting with sensors, robots, vehicles, industrial equipment, and more. Physical AI is increasingly important across a wide range of fields, including manufacturing, as it addresses industrial challenges such as labor shortages, skill transfer, replacement of hazardous work, and productivity improvement. Additionally, foundational models, semiconductors, sensors, actuators, and robotics-related technologies that support Physical AI are becoming increasingly significant from the perspective of economic security, particularly in terms of responding to supply chain risks and securing and managing critical technologies. This lecture will organize the basic concepts and key technologies of Physical AI, discuss its potential applications in manufacturing and industrial sectors, outline practical considerations for implementation and operation, and explain the actions that companies should take moving forward.

[Instructor] Nobuyuki Oonaka, CEO of Bridge Inc., Project Designer [Key Lecture Content] "Why do new businesses often come to a halt?" The cause may not be a lack of ideas or talent. Through supporting over 300 new businesses and business developments, I have learned that what separates success from failure is "the structure of the organization"—specifically, how decisions are made, how dialogue occurs, and how assumptions are shared. In this seminar, based on the book "How to Create Self-Driving New Businesses" (Shoei-sha), we will analyze the "communication problems" that cause new businesses to stop as a structure. The goal is to develop a common language within the organization to identify "where we are stuck and what actions we should take." I will share how to use the "self-driving map" in practical terms.

In this seminar, we will focus on the challenges of sensitivity reduction and separation performance in GC/MS analysis, and introduce the latest technologies and practical know-how that can help solve these issues. This time, we will also have a presentation from LECO Japan, who will discuss the benefits and applications of high-resolution and high-separation analysis with real examples. Additionally, Restek will introduce column technologies effective for improving sensitivity in trace analysis. Restek: We will explain the inert performance of the RMX GC column, which is effective for improving sensitivity in trace analysis, and the column technology that suppresses adsorption loss in low concentration areas, along with actual measurement data. LECO: We will present the latest application examples of comprehensive detection of trace components using high-sensitivity GC-TOFMS and RMX columns, including environmental, aroma, and material analysis. This content is recommended for anyone involved in multi-component analysis using GC/MS, whether for target or non-target analysis, as well as those who are just starting out. We will provide clear explanations suitable for beginners in GC/MS, so please join us.