[Free Seminar] Easily Overlooked Connector Issues: Mechanisms and Evaluation of Whiskers and Micro-Movement Wear
In connectors that connect various hardware such as automobiles, industrial equipment, and communication devices, low-cost Sn-plated products are widely used. However, there are also cases where attention is needed regarding the reliability specific to Sn-plated contacts.
In this webinar, based on actual connector failure cases that have occurred in the market, we will explain the process leading to the identification of causes for typical failure modes such as:
- Whiskers (short circuit failures)
- Fretting wear (contact failures)
Furthermore, we will systematically introduce the organization of failures through the FTA (Fault Tree Analysis) of the entire connector, as well as each failure mechanism.
■ Technical content to be explained:
- FTA structure of connector failures
- Mechanism of whisker formation and evaluation methods
- Mechanism of fretting wear and evaluation methods
■ Introduction of future evaluation technologies:
- High-temperature and high-humidity fretting wear testing (scheduled for introduction in December 2026)

| Date and time | Friday, Jul 24, 2026 02:00 PM ~ 03:00 PM |
|---|---|
| Entry fee | Free |
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