Analysis Seminar: "Fundamentals and Applications of Scanning Probe Microscopy (SPM)"
In recent years, with the increasing demand for material evaluation at the nanoscale, the importance of scanning probe microscopy (SPM), which can directly visualize the fine structures and physical properties of surfaces and interfaces, has grown. SPM is a microscopy technique represented by atomic force microscopy (AFM), which measures height and physical properties by utilizing the interaction between a probe and the sample surface. This course will systematically organize the basic structure and measurement principles of SPM based on commercially available AFM equipment, as well as explain the key technologies of the device, cantilever selection, sample preparation, and considerations for measurement parameters. Furthermore, application examples such as mechanical properties, electromagnetic properties, and chemical property evaluations will be introduced, aiming for a practical understanding of SPM utilization that goes beyond mere shape observation.

| Date and time | Tuesday, Oct 06, 2026 01:30 PM ~ 04:30 PM |
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| Entry fee | Charge 44,000 yen (including tax and text costs) |
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