Analysis Seminar: "Electrical Property Evaluation of Semiconductor Materials"
To create high-performance semiconductor devices, it is necessary to understand and control the electrical properties and physical characteristics of each material used in device fabrication. This course is structured in two parts: the first half introduces examples of applying mercury probe techniques to evaluate the basic electrical characteristics of semiconductor devices, such as capacitance-voltage (C-V) characteristics and current-voltage (I-V) characteristics, and demonstrates the relationship between the electrical properties of semiconductor devices and film quality in combination with various physical analyses. The second half presents Deep Level Transient Spectroscopy (DLTS), a method for electrically detecting defects that affect the characteristics of semiconductor devices, highlighting its usefulness based on examples of evaluating defects at semiconductor and insulating film/semiconductor interfaces.

| Date and time | Wednesday, Oct 07, 2026 01:30 PM ~ 04:30 PM |
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| Entry fee | Charge 44,000 yen (including tax and text costs) |
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