SEMICON Japan 2026
At SEMICON Japan 2026, we will introduce measurement and inspection equipment that supports semiconductor research, development, and manufacturing.
■ Dates: December 9 (Wednesday) - 11 (Friday), 2026
■ Venue: Tokyo Big Sight
■ Booth Number: E2708
■ Admission: Pre-registration required
■ Planned Exhibits
- Wire Grid Polarizers / Metalenses (Moxtek)
- Non-contact 3D Surface Roughness Measurement Device Smart (SENSOFAR)
- Laser Defect Scanner PrimaScan (Onto Innovation)
- 300mm Compatible AFM-IR Vista300 (Molecular Vista)
- AFM Nanoview 1000 (FSM Precision)
- Conductive AFM Nano-Observer (CSInstruments)
- 3D Printer for Optical Assembly Quantum X align (Nanoscribe)
- Nano Positioning Stage / Displacement Sensor (attocube)
- Super-resolution Optical Microscope NANORO M (LIG Nanowise)
- Wafer Distortion Measurement Sensor *Under Development (Fringe Metrology)
We look forward to your visit.

| Date and time | Wednesday, Dec 09, 2026 ~ Friday, Dec 11, 2026 |
|---|---|
| Capital | Tokyo Big Sight |
| Entry fee | Free |
Inquiry about this news
Contact Us OnlineMore Details & Registration
Details & Registration




