We will exhibit at the Techno Frontier EMC and Noise Control Technology Exhibition.

A true EMC noise scanner. It provides solutions for both EMI (emission) and EMS (immunity).

The innovative "Image Measurement Mode" eliminates the need for the traditional "contact and study" operation, allowing for quick execution from DUT setup to measurement completion with the scanner. The "Local Immunity Test" and "3D Measurement Function" provide new approaches to solving EMC issues. Additionally, the analysis software (viewer) is available for free download from the web. The overlay function for DUT images, CAD drawings, and noise maps is a standard feature. - "Image Measurement Mode": Capture board photos ⇒ Set measurement area on the image ⇒ Height measurement using laser ⇒ Set measurement steps ⇒ Execute measurement. - "Local Immunity Test": Visualizes the intrusion of electromagnetic fields from space using the electric/magnetic field irradiation probe of the MT-676E/H! Contributes to solving problems in challenging immunity scenarios. - "3D Measurement Function": Measures electric/magnetic fields in three dimensions while varying the height of the probe. This can be applied not only to emission countermeasures but also to visualizing antenna radiation. - Overlay function for DUT images, CAD drawings, and noise maps (patented technology) is standard in the analysis software. The software can be downloaded for free from the web, and there are no costs associated with subscriptions, making data and information sharing with partner companies and customers smooth.

• EMC/Static electricity measuring equipment

Analyze intermittent noise, noise caused by frequency fluctuations such as SSC, and transient noise in both the frequency domain and the time domain.

While scanning with the EMC scanner, - Capture the "spectrogram data" obtained from the real-time spectrum analyzer at each measurement point. - The analysis software (viewer) demonstrates its power in analysis with animation display through the Play function. - Newly introduced as an option for the WM7000. - Analyze intermittent noise phenomena, frequency fluctuations, and transient noise in both frequency and time domains. - Available as an option for new purchases or as an addition to existing equipment. - The real-time spectrum analyzer is exclusively for Tektronix RSA600/500/300 series.

• Switching Power Supply

If you fail the EMS immunity test, it is possible to evaluate where the electromagnetic waves have entered (you can gain hints for resolving the issue!).

MT-676 Series Local Electromagnetic Wave Irradiation Probe - Adopted by automotive electronics development companies and EMC consulting firms - Possible to obtain hints for solutions if immunity tests fail - Identification (estimation) of vulnerable components and circuits that lead to malfunctions - Using a spectrum analyzer with a tracking generator as a signal source - Capable of acquiring the frequency profile of electromagnetic wave intrusion from external sources all at once - Causes of malfunctions can be separated into electric fields/magnetic fields This product was originally developed for research purposes related to "cryptographic security side-channel attacks, fault attacks" and "anti-tamper technology against implementation attacks." It is widely adopted by universities and research institutions both domestically and internationally. (It is used to evaluate the "vulnerability" where cryptographic keys can be deciphered due to malfunctions caused by "electromagnetic wave irradiation," one type of fault attack.) ElectroMagnetic Analysis and Fault Injection (EM Injection) onto Secure Circuits

• EMC Testing

Three-dimensional measurement of "radio waves, EMC noise, ultrasound, static magnetic fields," etc., using handheld sensors and probes.

Visualize various invisible physical quantities in 3D! Measure the XYZ coordinates of the sensors and probes using motion capture cameras (stereo cameras). We link the coordinates to the physical quantities for visualization. Patent obtained (No. 6223660) Available sensors and probes: - Radio waves: 10Hz to over 60GHz (depending on the sensor or probe) - EMI noise: magnetic field, electric field, 3-axis composite, 3-axis (XYZ) division - Ultrasound: 10Hz to 100kHz (200kHz) ⇒ Ideal for visualizing sonar ultrasound - Static magnetic field

• 3D measuring device

Visualizing 5G millimeter wave radiation! Introducing a 3D electromagnetic field visualization system!

The "WM9500" is a three-dimensional electromagnetic field visualization system compatible with the fifth-generation mobile communication system. It can visualize 5G millimeter-wave radio wave radiation. Utilizing antenna couplers (compact antennas for transmission and reception at close range) as visualization sensors. It also supports 5G (sub-6), 28GHz band, and 39GHz band. 【Features】 ■ Compatible with the fifth-generation mobile communication system ■ Visualizes 5G millimeter-wave radio wave radiation ■ Utilizes antenna couplers as visualization sensors ■ Supports 5G (sub-6), 28GHz band, and 39GHz band *For more details, please refer to the PDF document or feel free to contact us.

• 3D measuring device

Measuring the effects of electromagnetic waves on the human body! Visualizing the electromagnetic waves of the subject on a computer! Quick measurements!

The "WM9500 narda" is a system that measures and visualizes electromagnetic waves emitted from objects in three dimensions. By detecting the spatial coordinates of the tester using motion capture cameras, it can display the magnetic field strength in three dimensions, color-coded, on a computer. Additionally, since it allows for relative evaluation against ICNIRP guidelines, it is effective for noise measurements aimed at human protection. 【Features】 ■ Short data measurement time for spatial coordinates ■ Capability to measure relative values and magnetic flux density against ICNIRP human protection lines ■ Adoption of motion capture cameras that achieve high measurement reproducibility ■ Not affected by the illumination of the measurement site or the color of the object *For more details, please download the catalog or contact us.

• 3D measuring device

Our company will be exhibiting at the "12th Annual Meeting of the Japanese Society for Extracellular Vesicles" to be held at the Senri Life Science Center. We will be showcasing various products during the event. We invite all relevant parties to come and visit us. 【Suppliers】 - Partical Metrix - Dynamic Biosensors

Theme: "Bringing Japan's Fermentation Technology to the World - Exploring the Essence of Koji Mold and Solid-State Cultivation, and Considering the Future Opened by Fermentation" [Content] Afternoon (13:00–17:00): Lectures and General Discussion ◆ Keynote Lecture 1: "Expansion of Koji Fermentation Applications Overseas" Takashi Sato, President, SAN-J International, Inc. ◆ Keynote Lecture 2: "Exploring the Diverse Functions Hidden in Koji Mold from a Genomic Perspective - Towards Understanding and Utilizing Solid-State Cultivation" Junichi Maruyama, Professor, Graduate School of Agricultural and Life Sciences, The University of Tokyo ◆ Lecture 1: "Initiatives of the Microbial Industry Course at Okayama University" Takashi Hara, Specially Appointed Assistant Professor, Microbial Industry Course, Okayama University ◆ General Discussion Panelists: Takashi Sato, President, SAN-J International, Inc. Junichi Maruyama, Professor, Graduate School of Agricultural and Life Sciences, The University of Tokyo Sanzaemon Murai, President, Bioc Co., Ltd. Masahiro Kariyama, Executive Director, Fujiwara Technoart Co., Ltd. Katsuya Gomi, Specially Appointed Professor, Graduate School of Agricultural Science, Tohoku University Coordinator: Hiroshi Kanzaki, Professor, Microbial Industry Course, Okayama University

[Lecture Items] 1. Initiatives on AI Law and Policy Cabinet Office, Office for Science and Technology Innovation, Artificial Intelligence Policy Promotion Office Deputy Director, Shiho Maeda 2. Initiatives by the Ministry of Internal Affairs and Communications for the Development and Utilization of Trustworthy Domestic AI Ministry of Internal Affairs and Communications, International Strategy Bureau, Technology Policy Division, Research Promotion Office, Deputy Director, Wataru Kumahara 3. Initiatives by the Ministry of Education, Culture, Sports, Science and Technology regarding AI for Science Ministry of Education, Culture, Sports, Science and Technology, Research Promotion Bureau, Advisor (Information), Deputy Director, Seiichiro Todoroki 4. Guidelines for AI Businesses Ministry of Economy, Trade and Industry, Commerce and Information Policy Bureau, Information Economy Division, International Coordination Officer for Governance Strategy, Sho Utagawa

[Lecture Topics] 1. Strengthening Japan's Cyber Response Capabilities Shingo Umi, Deputy Director, National Cyber Coordination Office, Cabinet Secretariat 2. The Situation of Threats in Cyberspace and Police Initiatives Fumika Iwasaki, Cyber Planning Division, Cyber Police Bureau, National Police Agency 3. Enhancing Cybersecurity in the Financial Sector Mitsuhiko Komura, Deputy Director, IT Cyber and Economic Security Management Office, Risk Analysis Division, Financial Services Agency 4. Cybersecurity Policy in the Information and Communications Sector Kiyohiro Samejima, Senior Deputy Director, Cybersecurity Coordination Office, Ministry of Internal Affairs and Communications 5. Cybersecurity Policy in the Industrial Sector Tomohiro Koyama, Section Chief, Cybersecurity Division, Commerce and Information Policy Bureau, Ministry of Economy, Trade and Industry

We will be holding a seminar on the utilization of electrical design data on Friday, November 7th. In addition to presentations from users who are actively utilizing ACAD-DENKI, we will introduce customization examples and announce new solutions from Zuken Alpha Tech. We hope this will help you solve challenges related to the utilization of data in electrical control design. ▶ Event details and registration https://www.alfatech.jp/seminar/acad-denki.html ーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーー Case presentations from users who are successfully utilizing data Tips for using ACAD-DENKI and announcement of new solutions ■ Date and Time 　Friday, November 7, 2025, 13:30 - 18:30 ■ Venue 　Tokyo Conference Center Shinagawa ■ Participation Fee 　Free (Pre-registration required) *Please register individually for each participant ■ Presenting Company 　Aitec Co., Ltd. ーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーーー