Automatic measurement program for IV characteristics/IVL characteristics
Various types for each measuring instrument used.
Ideal for measuring the IV characteristics of semiconductors and materials.
This product is software for automatically measuring the "IV characteristics" (current-voltage characteristics) of semiconductors and materials using commercially available measuring instruments.
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basic information
Recently, it has also been used for measuring the "IVL characteristics" (current-voltage illuminance characteristics) of thin film displays, light-emitting devices, organic ELs, etc. The measuring instruments used include Advantest's DC power supply R624X series, Keithley's 2400 series, and Agilent Technologies' 4155/56, among others. The computer and measuring instruments are connected via GPIB, allowing for simultaneous control and measurement of the instruments. The measurement results are immediately imported as numerical data into an Excel sheet, and the I-V curve is drawn. This enables measurements of "IV characteristics" and "IVL characteristics" with a single click, freeing users from the complexities of operating the measuring instruments. The GPIB interface installed on the computer uses GPIB interfaces from Ratoc System, National Instruments, or Contec. For more details, please request the comprehensive catalog. - Operating Environment Windows 98SE/Me/Xp, MS-Excel 2000/02/03
Price information
50,000 yen to 320,000 yen
Delivery Time
P1
Applications/Examples of results
■Measurement of IV characteristics of semiconductors and materials. ■IVL measurement of flat panels and light-emitting devices. ■Automatic measurement of semiconductor parameters.
Company information
We are proposing the construction of an automatic measurement system using commercially available measuring instruments and developing software for it.
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