High-precision measurements are possible!
A series of measurements are programmed on National Instruments' LabVIEW, and the calculation of measurement values is performed almost instantaneously. The no-load Q value, which is the measurement result, is displayed on the control computer in almost real-time, and the data is saved as a text file. The limiting factor for the measurements is the measurement time of the network analyzer, and particularly in this software, reflection measurements are performed in addition to the usual transmission measurements, so the measurements take several seconds. Therefore, please pay attention to temperature changes in the resonator during the measurements.
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【Features】 〇 The Circle fit method allows for accurate measurement of the original Q value along with multi-point measurements. 〇 By simultaneously conducting reflection measurements, the coupling coefficient of the resonator can be determined, and the unloaded Q value can be calculated. This enables highly reproducible measurements. 〇 Accompanying analysis software uses the two-resonator method to calculate the surface resistance of superconducting thin films from measurements of the temperature dependence of the Q value. ● For more details, please contact us.
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【Purpose】 〇For details, please contact us.
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In recent years, collaboration among industry, academia, and government has been emphasized, and since April 2000, with the privatization of national research institutions into independent administrative agencies, there has been a societal demand for the establishment of a system that enables more efficient and speedy research and development at these institutions. One method for improving the efficiency of research and development projects is the technology transfer of intellectual property. By aiming to commercialize this technology transfer of intellectual property in a concrete form, we view industry-academia collaboration as a business opportunity and strive to build new ventures.
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