Easy operation, high precision measurement! Inexpensive and user-friendly semiconductor parameter measurement software for beginners.
It automatically measures up to 12 types of parameters and outputs the results to an Excel sheet. The measured trace data can be output to Excel, and simultaneously, I-V characteristics can be plotted. Additionally, temperature characteristics of the parameters can also be measured.
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basic information
**Features** - Automatically measures parameters of diodes, transistors, FETs, MOS, organic FT, etc. - By setting measurement conditions for multiple parameters in advance, all parameters can be measured in full auto with one click. - Calculated parameters and I-V data are input into Excel. - Demonstrates power in the inspection of semiconductor devices. - Continuous measurements can be repeated while measuring temperature, allowing for the measurement of temperature characteristics for each parameter. - Diode measurement: Measurement items: VF, IR, VZ - Transistor measurement: - Measurement items: ICEO, VBE(sat), VCE(sat), hFE, IEBO, ICBO, ICEX - FET/MOS measurement: - Measurement items: IDSS, VGS(OFF), Vth, gm, IGSS, RDS, VGSF, IGSO, IGDO, IDSX, VGSC, VOP - For other functions and details, please download the catalog or contact us.
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We are proposing the construction of an automatic measurement system using commercially available measuring instruments and developing software for it.