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  6. High-resolution computer tomography

High-resolution computer tomography

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nanotom−3D computer tomography

last updated:Apr 01, 2025

日本マテック
日本マテック
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A versatile inspection tool: high-resolution computer tomography.

□■ Global Technology Award Winning Product ■□ High-resolution computer tomography (CT) has become a powerful inspection tool with a wide range of applications in quality control for electronic components and more. Tomography images are created by rotating the object being inspected within an X-ray beam. The data includes positional information of the object and information about the object's absorption density, allowing for the reconstruction of three-dimensional data. 【Features】 ◆ Depending on the dimensions and materials of the inspected object, the resolution can be a few microns or sub-micron. ◆ Any internal changes, density variations, or voids within the material are visualized, and distance measurements and volumes can be assessed. ◆ Once the full data from the 3D CT is collected, various analyses (slice images, arbitrary cross-sections, tone displays, magnified views, 3D measurements, etc.) become possible.

    Radiation detectorTesting Equipment and DevicesImage Processing Equipment
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High-resolution computer tomography

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□■ Global Technology Award Winning Product ■□ High-resolution computer tomography (CT) has become a powerful inspection tool with a wide range of applications in quality control for electronic components and more. Tomography images are created by rotating the object being inspected within an X-ray beam. The data includes positional information of the inspected object and information on the object's absorption density, allowing for the reconstruction of three-dimensional data. 【Features】 ◆ Depending on the dimensions and materials of the inspected object, the resolution can be a few microns or sub-micron. ◆ Any internal changes, density variations, or voids within the material are visualized, and distance measurements and volumes can be assessed. ◆ Once the full data of the 3D CT is collected, various analyses (slice images, arbitrary cross-sections, tone displays, magnified views, 3D measurements, etc.) become possible.

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日本マテック

日本マテック

Testing, Analysis and Measurement

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We prepare a wide range of inspection methods and devices, providing suitable inspection methods. To achieve inspection objectives, the selection of optimal means is the first necessity. Our company offers various inspection methods such as UT, ET, MT, PT, RFT, RT, AT, LUT, etc., allowing us to respond broadly to various demands. Furthermore, to meet diverse requirements, we constantly seek the latest technology and make efforts in information gathering and product development to equip ourselves with the most advanced devices from around the world. We assist with all aspects of inspection implementation. Another significant feature of our company is that we do not limit ourselves to merely selling hardware; we independently develop applications, starting with the selection of suitable main devices/probes for the purpose, providing advice on inspection processes, and offering software that includes the development and guidance of inspection methods. Through package sales, we strive to enhance our user support system and technical capabilities to achieve objectives quickly and efficiently.

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