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  6. [Development Case] Memory Evaluation Device Using HSDIO and LabVIEW

[Development Case] Memory Evaluation Device Using HSDIO and LabVIEW

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last updated:Jan 08, 2021

ペリテック 神奈川エンジニアリングセンター、東京営業所、ベトナム事業所
ペリテック 神奈川エンジニアリングセンター、東京営業所、ベトナム事業所
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Development of a memory evaluation device using inexpensive HSDIO and LabVIEW.

Due to the significant reduction in exam time, we were able to test multiple exam patterns in a short period, which resulted in high satisfaction for the end users. In the retention test, we implemented a process that allows recording while saving files, enabling us to conduct tests even with long-duration waveform patterns. With the completion of this system, the testing time that previously took 3 days with other companies' logic analyzers has been reduced to 30 minutes. This development has confirmed that NI products (HSDIO) are very effective for building systems for memory evaluation. Our developed evaluation device is being utilized by end users. By selecting and combining the necessary NI product modules according to the required specifications, we were able to build a high-quality system in a short period, contributing to users in terms of performance, delivery time, and cost reduction. Automation, short delivery times, low costs, and high quality are common demands for IC evaluation devices, and systems utilizing NI products and LabVIEW are expected to be expanded to other product lines in the future.

    MemoryElectronic Load UnitAnalytical Equipment and Devices
LabVIEWを使用したメモリ評価装置.png

[Development Case] Memory Evaluation Device Using HSDIO and LabVIEW

LabVIEWを使用したメモリ評価装置.png
LabVIEWを使用したメモリ評価装置.png
  • Related Link - http://www.peritec.co.jp/work/case15.html

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1. Shortening of test time By adopting the NI system [HSDIO (PXIe-6545)] as the basic hardware and using the Digital Waveform Editor for pattern waveform creation, we resolved the issue of test time. 2. Measurement of retention time By using the [HSDIO (PXIe-6545)] and the NI Script Editor for retention testing, we were able to set multiple arbitrary retention times, making measurement possible. The recorded data from the HSDIO was large in volume, and when held in memory, it caused overflow errors. However, by saving the data as a binary file while recording, we were able to record without errors. After completion of the recording, we evaluated the measurement data against the expected values by reading from the file. 3. Operation sequence This system uses TESTSTAND to improve the efficiency of test sequence creation and simplify parameter settings, allowing multiple personnel to use it.

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Memory evaluation

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ペリテック

ペリテック 神奈川エンジニアリングセンター、東京営業所、ベトナム事業所

Testing, Analysis and Measurement

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Peritech derives its name from "peripheral" and "technology," and we are proposing unique technology research and development in T&M (measurement systems and testing equipment) to everyone. We hope to be of service as your peripheral devices. At Peritech, we utilize 'LabVIEW,' a graphical programming language specialized for measurement and testing, to conduct technology research and development and proposals for T&M (measurement systems and testing machines). Since our founding, we have carried out a diverse range of developments, totaling over 4,000 projects. We provide high-performance, low-cost, and compact T&M systems such as RFID testers, ECU testers, and IC testers. We have been certified as a platinum alliance partner, ranking at the top among partner companies of National Instruments (NI), the sole developer of LabVIEW in Japan, and we maintain a strong trust relationship with NI. This enables us to provide the best development consulting to our customers. Moving forward, Peritech will continue to offer comprehensive and high-quality solutions leveraging the latest LabVIEW technology to support the growth of many customers.

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  • Electronic Components and Modules
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  • Measurement and Analysis
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