Reliability assessment and lightning surge failure countermeasures in the latest electronic products and devices.
S10714
In Part 1, we explain passive components, covering basic knowledge of reliability and methods for predicting the failure life of products and devices.
Lecturers Part 1: Akira Motoyama, Chief of the Circuit Board Analysis Division, Panasonic Electric Works Analysis Center, Inc. Part 2: Junichi Matsuda, Chief of the EMC and Safety Division, Panasonic Electric Works Analysis Center, Inc., Professional Engineer (Electrical and Electronic Division) Target Audience: Researchers and personnel interested in reliability evaluation and lightning surge in electronic products and devices Venue: Moriguchi City International Exchange Center, 3rd Floor, Conference Room 1 [Osaka, Moriguchi City] 5-minute walk from Keihan Electric Railway "Moriguchi City" Station, 4-minute walk from Tanimachi Line "Moriguchi" Station, right at Exit 4 Date and Time: July 20, 2011 (Tuesday) 10:00 AM - 4:15 PM
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**Abstract of the Lecture** With the miniaturization and lightweighting of electronic devices, the electronic components used in them are also becoming smaller and thinner. On the other hand, the use of overseas components aimed at cost reduction has led to an increasing trend in market troubles. In such a situation, it is becoming crucial to assess the reliability of electronic components used in electronic devices. In this lecture, we will provide sufficient information for conducting lifespan predictions, focusing on passive components, by explaining from the basics of reliability to methods for predicting the failure lifespan of electronic components using actual examples.
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【Early Bird Discount Price】52,500 yen (tax included, including text costs) for up to 2 people from one company. *This is limited to Tech-Zone members who apply by July 6. Membership registration is free. *After July 6, the 【Regular Price】 will be 55,650 yen (tax included, including text costs) for up to 2 people from one company.
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P2
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P2
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【Overall Schedule】 10:00-12:00 Part 1: Lecture ↓ 12:00-12:45 Lunch ↓ 12:45-14:15 Part 2: Lecture ↓ 14:15-15:15 After the seminar, move to Panasonic Electric Works Analysis Center ↓ 15:15-16:15 Facility tour of Panasonic Electric Works Analysis Center ↓ 16:15 End of the entire schedule. General dismissal. (Please note that the timing may vary slightly. Thank you for your understanding.) Part 1: Concepts of reliability evaluation and lifespan prediction technology useful for selecting and procuring electronic devices Part 2: Mechanisms of malfunctions caused by lightning surges and their countermeasures
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