GL tester that generates a high electric field under high temperature to evaluate the malfunction of devices, compliant with AEC-Q100-006 REV-C.
When a high electric field is applied to an IC at high temperatures, there may be instances of non-compliance with the IC's catalog specifications (for example, Icc, input leakage, AC parameters, functional characteristics). This phenomenon is referred to as electric-thermal-induced parasitic gate leakage (GL). Devices that exhibit GL are considered "defective," but GL defects typically recover after baking at 125°C for 4 hours (or 150°C for 2 hours). This device generates an electric field at high temperatures and conducts GL tests in accordance with AEC-Q100-006 REV-C. There are manual test model 6900M and automatic test model 6900A available. *Please note that product specifications are subject to change without notice. Thank you for your understanding.*
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basic information
- High Voltage Power Supply: Maximum 20KV - Digital Voltmeter: High Voltage Probe - Needle Tip: Tungsten Machined - Thermal Chamber: 125℃ or 150℃ - Temperature Control: Remote Control *Product specifications are subject to change without notice. Thank you for your understanding.
Price range
P5
Delivery Time
※It varies depending on the options.
Applications/Examples of results
Requirements testing for AEC-Q100-006 REV-C
Company information
Since its establishment in 1977, our company has contributed to the development of semiconductors and electronic components for many leading companies. Based on our know-how related to electrostatics, including high-speed and high-voltage technology, we manufacture and sell various products and systems for accurately measuring and analyzing analog signals.
