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  6. Wire Bonding Appearance Measurement Inspection Device HC-AZ

Wire Bonding Appearance Measurement Inspection Device HC-AZ

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last updated:Jan 08, 2021

ペリテック 神奈川エンジニアリングセンター、東京営業所、ベトナム事業所
ペリテック 神奈川エンジニアリングセンター、東京営業所、ベトナム事業所
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Appearance measurement inspection device for quality checks with XYZ axis.

The HC-AZ is an appearance measurement inspection device for quality checks that has an XYZ axis. It is capable of automatic measurement of wedge-ball bond crush width and semi-automatic measurement of loop height. It also features statistical and image recording functions, freeing users from the time-consuming process of measurement (measuring → recording results → inputting into PC) that operators previously performed. By using the HC-AZ, it is possible to significantly reduce the enormous amount of time spent on quality checks. Additionally, it simultaneously addresses the issue of variability in measurement results due to differences among measurers. The HC-AZ resolves the conflicting issues of time reduction and stabilization of measurement results at a high level.

    Testing Equipment and DevicesVisual Inspection EquipmentImage Processing Equipment
HC-AZ.png

Wire Bonding Appearance Measurement Inspection Device HC-AZ

HC-AZ.png
HC-AZ.png

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[ Functions ] - Automatic measurement function for collapse width - Semi-automatic measurement function for loop height - Statistical and image recording function - Measurement result output function - Map function - Measurement condition copy function - Park position function - Project loading function - Automatic scale calibration function - Equipped with auto-zoom lens

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Applications/Examples of results

- Damage inspection - Chip installation position measurement and inspection - Foreign object inspection

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Wire Bonding Appearance Measurement Inspection Device HC-AZ

Wire Bonding Appearance Measurement Inspection Device HC-AZ

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ペリテック

ペリテック 神奈川エンジニアリングセンター、東京営業所、ベトナム事業所

Testing, Analysis and Measurement

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Peritech derives its name from "peripheral" and "technology," and we are proposing unique technology research and development in T&M (measurement systems and testing equipment) to everyone. We hope to be of service as your peripheral devices. At Peritech, we utilize 'LabVIEW,' a graphical programming language specialized for measurement and testing, to conduct technology research and development and proposals for T&M (measurement systems and testing machines). Since our founding, we have carried out a diverse range of developments, totaling over 4,000 projects. We provide high-performance, low-cost, and compact T&M systems such as RFID testers, ECU testers, and IC testers. We have been certified as a platinum alliance partner, ranking at the top among partner companies of National Instruments (NI), the sole developer of LabVIEW in Japan, and we maintain a strong trust relationship with NI. This enables us to provide the best development consulting to our customers. Moving forward, Peritech will continue to offer comprehensive and high-quality solutions leveraging the latest LabVIEW technology to support the growth of many customers.

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