This is a method for conducting elemental analysis and compositional analysis by detecting fluorescent X-rays generated by irradiating with X-rays and spectrally analyzing them using energy or a spectroscopic crystal.
X-ray fluorescence analysis (XRF) is a method that detects fluorescent X-rays generated by irradiated X-rays and performs elemental and compositional analysis by spectrally analyzing the energy and using a spectroscopic crystal. - The entire energy measurement range (from Na to U) can be measured simultaneously in a short time. - Suitable for the analysis of unknown samples. - Non-destructive analysis. - No pre-treatment is required except for special samples, allowing for easy analysis in the atmosphere. - Elemental analysis of large samples that cannot be moved is possible with a handheld device.
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basic information
XRF detects fluorescent X-rays generated by X-ray irradiation by spectrally analyzing them using energy or spectroscopic crystals. The energy of the fluorescent X-rays is characteristic of the elements, allowing for the identification of the elements that make up the sample. Additionally, information about the composition can be obtained from the intensity.
Price information
The price varies depending on the measurement target, so please feel free to contact us.
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Applications/Examples of results
- Evaluation of the composition of metallic materials - Visualization of elemental distribution in ceramics - Elemental analysis of foreign substances in resin - Acquisition of transmission X-ray images - Measurement of plating film thickness on components - Evaluation of film thickness distribution of metal films on wafers - Identification of residue components - Elemental analysis of liquids - Investigation of model numbers for SUS materials
Detailed information
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Please consult with us first. ★ We will start with a proposal for an analysis plan ★ We can, of course, meet at your company for discussions. We will carefully explain the analysis results and leave no questions unanswered. Please contact us at 03-3749-2525 or info@mst.or.jp!
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We will hold a visiting seminar. ★ We offer free seminars with engineers tailored to our customers' needs ★ We will introduce analytical techniques and explain analytical data according to your requests. ◆ Example seminar content - A broad explanation of MST analytical methods - A detailed explanation of specific analytical methods from the principles - Explanation of the analytical data requested by the customer Please contact us at 03-3749-2525 or info@mst.or.jp!
Company information
MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!
![[Analysis Case] In-plane film thickness evaluation of Au thin film on wafer using XRF.](https://image.mono.ipros.com/public/product/image/d3e/2000325882/IPROS6547567656230940718.jpg?w=280&h=280)
